EPM3256AFC256-7 vs EPM3128AFI256-10N Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EPM3256AFC256-7 sa pamamagitan ng Altera at EPM3128AFI256-10N sa pamamagitan ng Altera. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Altera
EPM3128AFI256-10N - MAX 3000A CPLD, 128 Macros, 256-FBGA | Altera
EPM3128AFI256-10N ✓ NakahandaPagsanggunian na paghahambing
| Parametro | EPM3256AFC256-7 | EPM3128AFI256-10N |
|---|---|---|
| Brand | Altera | Altera |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | Aktibo |
| Family | MAX 3000A | MAX 3000A |
| Device Type | CPLD (Complex Programmable Logic Device) | — |
| Macro Cells | 256 | 128 |
| Logic Array Blocks (LABs) | 16 | — |
| Usable Gates | 10,000 | — |
| User I/Os | 161 | 98 |
| Pin-to-Pin Logic Delay | 4.5 ns (max) | — |
| Counter Frequency | 227.3 MHz (max) | — |
| Propagation Delay (tpd) | 10 ns | — |
| Core Voltage | 3.3 V | — |
| I/O Compatibility | 5.0 V / 3.3 V / 2.5 V (MultiVolt I/O) | 5.0 V, 3.3 V, 2.5 V (MultiVolt) |
| Process Technology | CMOS EEPROM, 0.30 µm | — |
| In-System Programmability | IEEE Std. 1532-compliant 3.3-V ISP | Yes (JTAG / IEEE 1149.1) |
| Boundary-Scan Test | JTAG (IEEE 1149.1) | — |
| Packhaging | FBGA-256 (FineLine BGA), 256 balls | 256-ball FineLine BGA (FBGA-256) |
| Temperature na Operasyon | 0 °C to 70 °C (Commercial) | -40C to +85C (industrial, per 'I' suffix) |
| Speed Grade | -7 | -10 (10 ns pin-to-pin) |
| Tindminan RoHS | [DATA_NEEDED: RoHS compliance status] | Compliant |
| Logic Density | — | 2.5K gates |
| Propagation Delay (tPD) | — | 10 ns |
| Counter Frequency (max) | — | 227.3 MHz |
| Logic Family | — | CMOS, EEPROM-based |
| Supply Voltage (Core) | — | 3.3 V |
| Bilang ng Pin | — | 256 |
| Configuration Memory | — | EEPROM (non-volatile) |
| PCI Compliance | — | PCI Local Bus Spec Rev 2.2 |