EPM3512AQC208-3 vs EPM3512AQC208-10N Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EPM3512AQC208-3 sa pamamagitan ng Altera at EPM3512AQC208-10N sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Altera
EPM3512AQC208-3 - MAX 3000A CPLD, 512 Macrocells, 172 I/O, PQFP-208 | Altera
EPM3512AQC208-3 ⚠ Huling PagbiliPagsanggunian na paghahambing
| Parametro | EPM3512AQC208-3 | EPM3512AQC208-10N |
|---|---|---|
| Brand | Altera | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Huling Pagbili | Obsolete |
| Family | MAX 3000A | MAX 3000A |
| Device Type | CPLD (Complex Programmable Logic Device) | CPLD (Complex Programmable Logic Device) |
| Macrocells | 512 | 512 |
| Logic Array Blocks (LABs) | 16 (32 macrocells each) | 16 |
| Maximum User I/O Pins | 172 | — |
| Packhaging | PQFP-208 | 208-pin PQFP (Plastic Quad Flat Pack) |
| Speed Grade | -3 | -10 |
| Supply Voltage - Core (VCCINT) | 3.3 V | — |
| I/O Bank Supply Voltage (VCCIO) | 2.5 V / 3.3 V / 5.0 V (multiVolt) | — |
| In-System Programmability | Yes (IEEE Std. 1532 compliant) | — |
| Boundary-Scan Test | Yes (IEEE Std. 1149.1 / JTAG) | — |
| Program/Erase Cycles | 100 minimum [DATA_NEEDED: exact datasheet figure] | — |
| Non-Volatile Configuration | Yes (EEPROM-based) | — |
| Temperature na Operasyon | [DATA_NEEDED: industrial/commercial grade range] | 0 C to 70 C (commercial) |
| Tindminan RoHS | [DATA_NEEDED: confirm from datasheet] | [DATA_NEEDED: RoHS status not in verified web data] |
| Uri ng Pagpapasok | Surface Mount | — |
| Level ng MSL | [DATA_NEEDED: moisture sensitivity level] | — |
| Usable Gates | — | Up to 10,000 |
| User I/Os | — | 172 |
| Volte ng Pagbibigay | — | 3.3 V |
| Pin-to-Pin Delay | — | 4.5 ns (-10 speed grade) |
| Maximum Internal Frequency | — | 227.3 MHz |
| Process Technology | — | CMOS EEPROM |
| In-System Programming | — | IEEE Std. 1149.1 JTAG, IEEE Std. 1532 |
| Boundary-Scan Test (BST) | — | Built-in, IEEE 1149.1 compliant |
| I/O Standards | — | MultiVolt (1.8V / 2.5V / 3.3V) |