EPM7096LI68-15 vs EPM7096LC84-15 Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EPM7096LI68-15 sa pamamagitan ng Intel at EPM7096LC84-15 sa pamamagitan ng Altera. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EPM7096LI68-15 | EPM7096LC84-15 |
|---|---|---|
| Brand | Intel | Altera |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Huling Pagbili | Obsolete |
| Family | MAX 7000 (second-generation MAX architecture) | MAX 7000 |
| Macrocells | 96 | — |
| Logic Array Blocks (LABs) | 4 | 4 |
| User I/O Pins | 52 | 68 (36 per LAB, [DATA_NEEDED: exact LAB-level split]) |
| Propagation Delay (tPD) | 15 ns | — |
| Supply Voltage (VCCINT) | 5.0 V | — |
| Programmable Logic Type | EEPROM-based, in-system programmable (ISP) | — |
| Programming Interface | IEEE Std. 1149.1 JTAG | IEEE Std. 1149.1 JTAG |
| Boundary-Scan Test (BST) | Built-in JTAG BST circuitry | — |
| Output Option | Open-drain output option available | — |
| Operating Temperature Grade | Industrial (-40C to +85C) | — |
| Packhaging | 68-pin PLCC (J-lead, QCCJ) | — |
| Uri ng Pagpapasok | Surface Mount (J-lead) | Surface Mount |
| Speed Grade | -15 (15 ns tPD) | — |
| Tindminan RoHS | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS compliance status] |
| Process Technology | CMOS EEPROM | — |
| Series | — | MAX 7000 (second-generation MAX architecture) |
| Macro Cells | — | 96 |
| Usable Gates | — | 1,800 |
| Pin-to-Pin Propagation Delay (tPD) | — | 15 ns |
| Maximum Operating Frequency | — | 76.9 MHz |
| Supply Voltage (VCC) | — | 4.75 V to 5.25 V |
| Programmable Type | — | EE PLD (in-system programmable via JTAG) |
| Temperature na Operasyon | — | 0C to +70C (commercial) |
| Packhaging / Kaso | — | 84-PLCC (J-Lead) |
| Supplier Device Package | — | 84-PLCC (29.31 x 29.31 mm) |
| Data Retention | — | [DATA_NEEDED: data retention years] |
| Erase/Program Endurance | — | [DATA_NEEDED: erase/program cycle count] |