RTAX4000SL-1CQ352E vs RTAX1000SL-CQ352V موازنہ
تفصیلی ساتھ ساتھ موازنہ از RTAX4000SL-1CQ352E بذریعہ Microchip Technology اور RTAX1000SL-CQ352V بذریعہ Microchip Technology. اہم خصوصیات، برقی پیرامیٹرز، پیکیجنگ، لائف سائیکل اسٹیٹس، قیمتوں اور دستیابی کا موازنہ کریں تاکہ آپ کی ڈیزائن ضروریات کے لیے بہترین کمپوننٹ کا تعین ہو سکے۔
Microchip Technology
RTAX4000SL-1CQ352E - 4M-Gate Rad-Tolerant FPGA CQFP-352 | Microchip
RTAX4000SL-1CQ352E ✓ فعالMicrochip Technology
RTAX1000SL-CQ352V - 1M-Gate Rad-Tolerant FPGA | Microchip
RTAX1000SL-CQ352V ✓ فعالخصوصیات کا موازنہ
| پیرامیٹر | RTAX4000SL-1CQ352E | RTAX1000SL-CQ352V |
|---|---|---|
| برانڈ | Microchip Technology | Microchip Technology |
| زمرہ | FPGA & CPLD | FPGA & CPLD |
| لائف سائیکل کی حالت | فعال | فعال |
| Family | RTAX-SL Radiation-Tolerant FPGA | RTAX-SL (RTAX-S/SL Radiation-Tolerant FPGAs) |
| Equivalent Gates | 4,000,000 | — |
| Logic Cells | 60,480 | 18,144 |
| CLBs | 40,320 | — |
| Process Technology | 0.15 um CMOS | 0.15 um CMOS |
| Core Supply Voltage | 1.5 V | — |
| پیکیج | 352-pin CQFP, 0.500 mm terminal pitch | 352-pin Ceramic CQFP (CQ352V) |
| ماؤنٹنگ ٹائپ | Surface Mount | Surface Mount |
| آپریٹنگ درجہ حرارت | -55C to +125C (extended) | [DATA_NEEDED: operating temperature range] |
| Programmability | Antifuse, one-time programmable, live at power-up | — |
| Radiation Tolerance | Radiation-tolerant (space flight qualified family) | Radiation-tolerant, space-flight qualified family |
| Packaging | Box | — |
| زمرہ | Programmable Logic Devices - FPGA | — |
| I/O Standard Support | [DATA_NEEDED: I/O standard list] | — |
| Embedded Memory | [DATA_NEEDED: embedded SRAM block capacity] | Embedded SRAM with built-in FIFO control logic |
| RoHS اسٹیٹس | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS compliance status] |
| MSL لیول | [DATA_NEEDED: MSL level] | [DATA_NEEDED: moisture sensitivity level] |
| Equivalent System Gates | — | 1,000,000 |
| CLBs (Logic Modules) | — | 12,096 |
| Maximum Toggle Frequency | — | 581 MHz |
| Core Voltage | — | 1.5 V |
| Programming Technology | — | Antifuse (one-time programmable) |
| Power-Up Behavior | — | Live at power-up (non-volatile) |
| Configuration Upset Immunity | — | No SEU in configuration memory (antifuse) |
| I/O Voltage | — | [DATA_NEEDED: I/O bank voltage range] |
| Total Ionizing Dose (TID) | — | [DATA_NEEDED: TID rating in krad (Si)] |
| Estimated Equivalent Gates per CLB | — | [DATA_NEEDED: gates-per-CLB ratio] |