RTAX4000SL-1CQ352E vs RTAX1000SL-CQ352V השוואה
השוואה מפורטת זה לצד זה של RTAX4000SL-1CQ352E מאת Microchip Technology ו RTAX1000SL-CQ352V מאת Microchip Technology. השווה מפרטים עיקריים, פרמטרים חשמליים, אריזה, סטטוס מחזור חיים, תמחור וזמינות כדי לקבוע את הרכיב הטוב ביותר לדרישות העיצוב שלך.
Microchip Technology
RTAX4000SL-1CQ352E - 4M-Gate Rad-Tolerant FPGA CQFP-352 | Microchip
RTAX4000SL-1CQ352E ✓ פעילMicrochip Technology
RTAX1000SL-CQ352V - 1M-Gate Rad-Tolerant FPGA | Microchip
RTAX1000SL-CQ352V ✓ פעילהשוואת מפרטים
| פרמטר | RTAX4000SL-1CQ352E | RTAX1000SL-CQ352V |
|---|---|---|
| מותג | Microchip Technology | Microchip Technology |
| קטגוריה | FPGA & CPLD | FPGA & CPLD |
| סטטוס מחזור חיים | פעיל | פעיל |
| Family | RTAX-SL Radiation-Tolerant FPGA | RTAX-SL (RTAX-S/SL Radiation-Tolerant FPGAs) |
| Equivalent Gates | 4,000,000 | — |
| Logic Cells | 60,480 | 18,144 |
| CLBs | 40,320 | — |
| Process Technology | 0.15 um CMOS | 0.15 um CMOS |
| Core Supply Voltage | 1.5 V | — |
| מארז | 352-pin CQFP, 0.500 mm terminal pitch | 352-pin Ceramic CQFP (CQ352V) |
| סוג הרכבה | Surface Mount | Surface Mount |
| טמפרטורת פעולה | -55C to +125C (extended) | [DATA_NEEDED: operating temperature range] |
| Programmability | Antifuse, one-time programmable, live at power-up | — |
| Radiation Tolerance | Radiation-tolerant (space flight qualified family) | Radiation-tolerant, space-flight qualified family |
| Packaging | Box | — |
| קטגוריה | Programmable Logic Devices - FPGA | — |
| I/O Standard Support | [DATA_NEEDED: I/O standard list] | — |
| Embedded Memory | [DATA_NEEDED: embedded SRAM block capacity] | Embedded SRAM with built-in FIFO control logic |
| סטטוס RoHS | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS compliance status] |
| רמת MSL | [DATA_NEEDED: MSL level] | [DATA_NEEDED: moisture sensitivity level] |
| Equivalent System Gates | — | 1,000,000 |
| CLBs (Logic Modules) | — | 12,096 |
| Maximum Toggle Frequency | — | 581 MHz |
| Core Voltage | — | 1.5 V |
| Programming Technology | — | Antifuse (one-time programmable) |
| Power-Up Behavior | — | Live at power-up (non-volatile) |
| Configuration Upset Immunity | — | No SEU in configuration memory (antifuse) |
| I/O Voltage | — | [DATA_NEEDED: I/O bank voltage range] |
| Total Ionizing Dose (TID) | — | [DATA_NEEDED: TID rating in krad (Si)] |
| Estimated Equivalent Gates per CLB | — | [DATA_NEEDED: gates-per-CLB ratio] |