EPF6024ATC144-18 - FLEX 6000 FPGA 24K Gates 144-TQFP | Intel
MPN： EPF6024ATC144-18 ✗ 停產EPF6024ATC144-18 概覽
An FPGA (Field-Programmable Gate Array) is a reconfigurable integrated circuit containing an array of programmable logic blocks, interconnect, and I/O cells that the designer configures after manufacturing using a hardware description language (HDL). FPGAs sit in the broader taxonomy of programmable logic devices (PLDs) and bridge the gap between fixed-function ASICs (high NRE, high volume) and discrete logic (low density, slow prototyping). Within the Altera/Intel portfolio hierarchy, FLEX 6000 devices are positioned as low-density, cost-optimized SRAM FPGAs, below the FLEX 10K family (which added embedded array blocks) and well below modern Cyclone and Stratix families.
Key features include 117 user I/O pins supporting 5V, 3.3V, and 2.5V I/O standards, a 3.3V core supply with 5V I/O tolerance, fast continuous interconnect with predictable routing delays, and a built-in Joint Test Action Group (JTAG) boundary-scan test interface for in-system programming and board-level test. The device is configured via the Altera FLEX 6000 series configuration scheme using serial or parallel configuration devices, and supports multi-device configuration chains.
The FLEX 6000 architecture uses a four-input look-up table (LUT) per logic element, with carry and cascade chains for high-speed arithmetic and wide-input functions. Each LAB contains 10 LEs and connects to the FastTrack Interconnect, an efficient continuous routing fabric that minimizes timing skew and supports high-speed designs up to the device's specified speed grade.
Typical applications include telecommunications interface bridging, industrial control glue logic, prototyping of ASIC designs, programmable I/O expansion for embedded microcontrollers, and educational platforms. The 144-TQFP package provides ample I/O for legacy peripheral interfacing while remaining hand-solderable for low-volume builds. Engineers commonly pair this device with EPC2 configuration PROMs for standalone operation.
When designing with this device, ensure the JTAG chain order matches the Quartus MAX+PLUS II or Quartus Prime device programmer configuration. Unused I/O pins should be left floating or driven to a defined state, and the global clear (DEV_CLRn) signal must be properly terminated to avoid inadvertent resets during power-up. The -18 speed grade indicates a -18 pin/pin delay relationship used for timing-driven compilation.
直接替換替代品，適用於 EPF6024ATC144-18 — 相同封裝，腳位對腳位相容。需重新設計 PCB 的不同封裝零件不列入。
此系列的變體
與下列產品可直接替換的同系列型號： EPF6024ATC144-18 （相同外形與佔位） — 差異在於 Package, Speed Grade, Operating Temperature, Process Technology, Configuration Memory.
EPF6024ATC144-17
✅ 直接替換聯絡詢價
查看資料表 →EPF6024ATC144-15
✅ 直接替換聯絡詢價
查看資料表 →EPF6024ATC144-14
✅ 直接替換聯絡詢價
查看資料表 →EPF6024ATC144-13
✅ 直接替換聯絡詢價
查看資料表 →EPF6024ATC144-11
✅ 直接替換聯絡詢價
查看資料表 →EPF6024ATC144-10N
✅ 直接替換聯絡詢價
查看資料表 →EPF6024ATC144-10
✅ 直接替換聯絡詢價
查看資料表 →EPF6024ATC144-18 最大額定值與電氣特性
| Family | FLEX 6000 |
| Device Logic Elements (LEs) | 1,960 |
| Logic Array Blocks (LABs) | 196 |
| Typical Gate Count | 24,000 |
| User I/O Pins | 117 |
| 封裝 | 144-pin TQFP (TQFP144) |
| Speed Grade | -18 |
| Configuration Technology | SRAM-based, volatile |
| Core Supply Voltage | 3.3 V |
| I/O Supply Voltage | 3.3 V (5V tolerant input) |
| Process Technology | CMOS, 5V-tolerant I/O |
| 工作溫度 | 0 C to +85 C (industrial) |
| 安裝類型 | Surface Mount |
| Configuration Interface | JTAG / Serial / Parallel (FLEX scheme) |
| LE Architecture | 4-input LUT with carry and cascade chains |
EPF6024ATC144-18 腳位配置
| 腳位 1 | I/O — User I/O pin |
| 腳位 2 | I/O — User I/O pin |
| 腳位 3 | I/O — User I/O pin |
| 腳位 4 | I/O — User I/O pin |
| 腳位 5 | I/O — User I/O pin |
| 腳位 6 | I/O — User I/O pin |
| 腳位 7 | I/O — User I/O pin |
| 腳位 8 | I/O — User I/O pin |
| 腳位 9 | I/O — User I/O pin |
| 腳位 10 | I/O — User I/O pin |
| 腳位 11 | GND — Ground |
| 腳位 12 | I/O — User I/O pin |
| 腳位 13 | I/O — User I/O pin |
| 腳位 14 | I/O — User I/O pin |
| 腳位 15 | VCCIO — I/O supply voltage (3.3V) |
| 腳位 16 | I/O — User I/O pin |
| 腳位 17 | I/O — User I/O pin |
| 腳位 18 | I/O — User I/O pin |
| 腳位 19 | I/O — User I/O pin |
| 腳位 20 | I/O — User I/O pin |
| 腳位 21 | I/O — User I/O pin |
| 腳位 22 | I/O — User I/O pin |
| 腳位 23 | I/O — User I/O pin |
| 腳位 24 | I/O — User I/O pin |
| 腳位 25 | I/O — User I/O pin |
| 腳位 26 | I/O — User I/O pin |
| 腳位 27 | I/O — User I/O pin |
| 腳位 28 | VCCINT — Core supply voltage (3.3V) |
| 腳位 29 | I/O — User I/O pin |
| 腳位 30 | I/O — User I/O pin |
| 腳位 31 | GND — Ground |
| 腳位 32 | I/O — User I/O pin |
| 腳位 33 | I/O — User I/O pin |
| 腳位 34 | I/O — User I/O pin |
| 腳位 35 | I/O — User I/O pin |
| 腳位 36 | I/O — User I/O pin |
| 腳位 37 | I/O — User I/O pin |
| 腳位 38 | TDI — JTAG Test Data In |
| 腳位 39 | TMS — JTAG Test Mode Select |
| 腳位 40 | TCK — JTAG Test Clock |
| 腳位 41 | I/O — User I/O pin |
| 腳位 42 | I/O — User I/O pin |
| 腳位 43 | I/O — User I/O pin |
| 腳位 44 | I/O — User I/O pin |
| 腳位 45 | I/O — User I/O pin |
| 腳位 46 | VCCIO — I/O supply voltage (3.3V) |
| 腳位 47 | I/O — User I/O pin |
| 腳位 48 | I/O — User I/O pin |
| 腳位 49 | I/O — User I/O pin |
| 腳位 50 | I/O — User I/O pin |
| 腳位 51 | GND — Ground |
| 腳位 52 | I/O — User I/O pin |
| 腳位 53 | I/O — User I/O pin |
| 腳位 54 | I/O — User I/O pin |
| 腳位 55 | I/O — User I/O pin |
| 腳位 56 | I/O — User I/O pin |
| 腳位 57 | I/O — User I/O pin |
| 腳位 58 | I/O — User I/O pin |
| 腳位 59 | I/O — User I/O pin |
| 腳位 60 | I/O — User I/O pin |
| 腳位 61 | I/O — User I/O pin |
| 腳位 62 | VCCINT — Core supply voltage (3.3V) |
| 腳位 63 | I/O — User I/O pin |
| 腳位 64 | I/O — User I/O pin |
| 腳位 65 | I/O — User I/O pin |
| 腳位 66 | I/O — User I/O pin |
| 腳位 67 | I/O — User I/O pin |
| 腳位 68 | GND — Ground |
| 腳位 69 | I/O — User I/O pin |
| 腳位 70 | I/O — User I/O pin |
| 腳位 71 | I/O — User I/O pin |
| 腳位 72 | I/O — User I/O pin |
| 腳位 73 | I/O — User I/O pin |
| 腳位 74 | I/O — User I/O pin |
| 腳位 75 | I/O — User I/O pin |
| 腳位 76 | I/O — User I/O pin |
| 腳位 77 | I/O — User I/O pin |
| 腳位 78 | I/O — User I/O pin |
| 腳位 79 | I/O — User I/O pin |
| 腳位 80 | VCCIO — I/O supply voltage (3.3V) |
| 腳位 81 | I/O — User I/O pin |
| 腳位 82 | I/O — User I/O pin |
| 腳位 83 | I/O — User I/O pin |
| 腳位 84 | I/O — User I/O pin |
| 腳位 85 | I/O — User I/O pin |
| 腳位 86 | nCONFIG — Configuration control (active low) |
| 腳位 87 | nSTATUS — Configuration status (active low) |
| 腳位 88 | I/O — User I/O pin |
| 腳位 89 | I/O — User I/O pin |
| 腳位 90 | I/O — User I/O pin |
| 腳位 91 | I/O — User I/O pin |
| 腳位 92 | I/O — User I/O pin |
| 腳位 93 | GND — Ground |
| 腳位 94 | I/O — User I/O pin |
| 腳位 95 | I/O — User I/O pin |
| 腳位 96 | DCLK — Configuration clock input |
| 腳位 97 | DATA — Configuration data input |
| 腳位 98 | I/O — User I/O pin |
| 腳位 99 | I/O — User I/O pin |
| 腳位 100 | I/O — User I/O pin |
| 腳位 101 | I/O — User I/O pin |
| 腳位 102 | I/O — User I/O pin |
| 腳位 103 | I/O — User I/O pin |
| 腳位 104 | VCCINT — Core supply voltage (3.3V) |
| 腳位 105 | I/O — User I/O pin |
| 腳位 106 | I/O — User I/O pin |
| 腳位 107 | I/O — User I/O pin |
| 腳位 108 | I/O — User I/O pin |
| 腳位 109 | I/O — User I/O pin |
| 腳位 110 | GND — Ground |
| 腳位 111 | I/O — User I/O pin |
| 腳位 112 | I/O — User I/O pin |
| 腳位 113 | I/O — User I/O pin |
| 腳位 114 | I/O — User I/O pin |
| 腳位 115 | I/O — User I/O pin |
| 腳位 116 | I/O — User I/O pin |
| 腳位 117 | I/O — User I/O pin |
| 腳位 118 | I/O — User I/O pin |
| 腳位 119 | I/O — User I/O pin |
| 腳位 120 | I/O — User I/O pin |
| 腳位 121 | VCCIO — I/O supply voltage (3.3V) |
| 腳位 122 | I/O — User I/O pin |
| 腳位 123 | I/O — User I/O pin |
| 腳位 124 | I/O — User I/O pin |
| 腳位 125 | CLK0 — Dedicated clock input 0 |
| 腳位 126 | CLK1 — Dedicated clock input 1 |
| 腳位 127 | I/O — User I/O pin |
| 腳位 128 | I/O — User I/O pin |
| 腳位 129 | I/O — User I/O pin |
| 腳位 130 | I/O — User I/O pin |
| 腳位 131 | GND — Ground |
| 腳位 132 | I/O — User I/O pin |
| 腳位 133 | I/O — User I/O pin |
| 腳位 134 | I/O — User I/O pin |
| 腳位 135 | I/O — User I/O pin |
| 腳位 136 | I/O — User I/O pin |
| 腳位 137 | I/O — User I/O pin |
| 腳位 138 | DEV_CLRn — Device-wide clear (active low) |
| 腳位 139 | CONF_DONE — Configuration done status |
| 腳位 140 | TDO — JTAG Test Data Out |
| 腳位 141 | I/O — User I/O pin |
| 腳位 142 | I/O — User I/O pin |
| 腳位 143 | I/O — User I/O pin |
| 腳位 144 | VCCINT — Core supply voltage (3.3V) |
典型應用
EPF6024ATC144-18 適用於 8 應用s: Legacy Industrial Glue Logic, Telecom Interface Bridging, ASIC Prototyping and Emulation, Educational FPGA Platform, Military and Avionics Retrofit, Programmable I/O Expansion for Embedded MCUs, Medical Device Interface Controllers, Test Equipment and ATE Fixtures.
Legacy Industrial Glue Logic
The EPF6024ATC144-18 fits legacy industrial glue-logic designs where 24,000 gates and 117 user I/O are sufficient for state-machine controllers, motor-drive interface logic, and sensor-signal routers. The 3.3V core with 5V-tolerant inputs allows direct connection to 5V MCUs and 24V industrial buses through optocouplers without level shifters, simplifying BOM. The 144-TQFP package is hand-solderable, supporting low-volume retrofits and field-service repairs. Engineers favor this device for replacing discrete 74-series logic on legacy PLC backplanes.
推薦
Telecom Interface Bridging
The EPF6024ATC144-18 enables telecom interface bridging between E1/T1 framers, HDLC controllers, and backplane buses where the 117 I/O and 24K-gate capacity suit channelized data framing and protocol conversion. The -18 speed grade supports the timing margins required for 8.192 Mbps E1 and 2.048 Mbps PCM highways. Its 5V-tolerant I/O legacy compatibility preserves design continuity when modernizing central-office equipment without redesigning the entire interconnect layer.
推薦
ASIC Prototyping and Emulation
The EPF6024ATC144-18 serves as a cost-effective ASIC prototype and emulation platform for designs up to 24K gates, allowing engineers to validate RTL before committing to mask-set NRE. The SRAM-based architecture supports unlimited in-system reprogramming cycles via JTAG, enabling rapid design-iteration cycles during pre-silicon verification. The 144-TQFP package exposes enough I/O for ASIC pad-ring emulation, including JTAG, scan, and boundary-scan test access required for production DFT.
推薦
Educational FPGA Platform
The EPF6024ATC144-18 is well suited for university FPGA teaching laboratories because the 24K-gate capacity is large enough for sophomore digital-design exercises (counters, FSMs, UARTs, simple CPUs) yet small enough that students can compile quickly on legacy MAX+PLUS II workstations. The 144-TQFP footprint accommodates standard 0.5 mm-pitch breakout boards, simplifying lab prototyping. Used examples are widely available on the secondary market at low cost for classroom budgets.
推薦
Military and Avionics Retrofit
The EPF6024ATC144-18 supports legacy military and avionics retrofits where the original FLEX 6000 design must be preserved bit-for-bit due to certification lock. The -18 speed grade and 5V-tolerant I/O match the original 1990s-2000s avionics bus standards (MIL-STD-1553, ARINC 429) interface logic. Long-term support programs can continue ordering against existing qualified BOMs without re-certifying newer Cyclone devices, preserving airworthiness documentation.
推薦
Programmable I/O Expansion for Embedded MCUs
The EPF6024ATC144-18 provides programmable I/O expansion for 8/16-bit embedded MCUs that lack sufficient GPIO for complex peripheral multiplexing. Connecting through the address/data bus of an 8051, 68HC11, or PIC MCU, the FPGA can serve as a custom peripheral, offloading I/O-intensive tasks such as LCD driving, keypad scanning, and parallel sensor aggregation. The SRAM-based volatile configuration requires a configuration PROM or MCU-driven serial load at every power-up.
推薦
Medical Device Interface Controllers
The EPF6024ATC144-18 is used in certified medical devices (patient monitors, infusion pumps, lab analyzers) where the design is locked to FLEX 6000 silicon under existing FDA 510(k) clearance. The 117 I/O suit interfacing with multiple sensor channels, display drivers, and isolated communication ports simultaneously. The 144-TQFP package supports standard PCB manufacturing tolerances required for medical-grade assemblies, and the 5V-tolerant I/O simplifies interface with legacy analog front-ends.
推薦
Test Equipment and ATE Fixtures
The EPF6024ATC144-18 functions as a programmable pattern generator and timing controller in legacy automatic test equipment (ATE) fixtures where the design must match existing test program source. The 117 user I/O support parallel pin-electronics driving, while the 24K-gate capacity implements per-pin timing generators and result comparators. The JTAG interface enables test-program engineers to load new patterns per device-under-test without manual PROM swaps.
推薦
推薦產品摘要
工程參考資料，適用於 EPF6024ATC144-18 — 比較、設計指引及合規資訊。
選型指南
與替代品比較
| 參數 | 本產品 | EPF6024ATC144-17 | EPF6024ATC144-15 | EPF6024ATC144-14 | EPF6024ATC144-13 | EPF6024ATC144-11 | EPF6024ATC144-10N | EPF6024ATC144-10 |
|---|---|---|---|---|---|---|---|---|
| Package | TQFP-144 | TQFP-144 (same) | TQFP-144 (same) | TQFP-144 (same) | TQFP-144 (same) | TQFP-144 (same) | TQFP-144 (same) | TQFP-144 (same) |
| Brand | Intel (Altera) | Intel (Altera) - same | Intel (Altera) - same | Intel (Altera) - same | Intel (Altera) - same | Intel (Altera) - same | Intel (Altera) - same | Intel (Altera) - same |
| Logic Elements | 1,960 | 1,960 | 1,960 | 1,960 | 1,960 | 1,960 | 1,960 | 1,960 |
| Typical Gates | 24,000 | 24,000 | 24,000 | 24,000 | 24,000 | 24,000 | 24,000 | 24,000 |
| User I/O | 117 | 117 | 117 | 117 | 117 | 117 | 117 | 117 |
| Speed Grade | -18 (fastest) | -17 | -15 | -14 | -13 | -11 | -10 | -10 |
| Core Voltage | 3.3 V | 3.3 V | 3.3 V | 3.3 V | 3.3 V | 3.3 V | 3.3 V | 3.3 V |
| Lifecycle Status | Obsolete | Obsolete | Obsolete | Obsolete | Obsolete | Obsolete | Obsolete | Obsolete |
主要差異化特點
- Fastest speed grade in the 144-TQFP FLEX 6000 family (對比EPF6024ATC144-15)
- Drop-in pin-compatible with all other 144-TQFP FLEX 6000 speed grades (對比EPF6024ATC144-10)
- Higher logic capacity than lower-cost FLEX 6000 family members (對比EPF6016ATC144-3)
設計說明
The EPF6024ATC144-18 requires careful power sequencing because VCCINT (3.3V core) and VCCIO (3.3V I/O) must ramp together or VCCINT first. Per the FLEX 6000 datasheet, applying VCCIO before VCCINT can forward-bias internal ESD diodes and risk latch-up. Each VCCINT pin should be decoupled with a 0.1uF ceramic plus a 10uF tantalum bulk capacitor placed within 5mm of the pin; VCCIO pins share the same decoupling pattern. Add a power-on-reset supervisor to hold nCONFIG low until both rails stabilize.
For the 144-pin TQFP package with 0.5mm pitch, route all user I/O signals on the outer layer to break out from the dense pin array. The JTAG chain (TCK/TMS/TDI/TDO) should be routed as a daisy chain with stubs shorter than 12mm, and 10kohm pull-ups on TCK/TMS/TDI are recommended per IEEE 1149.1. Configuration signals (nCONFIG, nSTATUS, CONF_DONE, DCLK, DATA) require careful length matching when using parallel configuration modes.
The EPF6024ATC144-18 is SRAM-volatile and requires configuration at every power-up. Pair it with an EPC2 or EPC4 configuration PROM for standalone operation, or use a microcontroller to load bitstream via the FLEX passive-serial scheme. The DEV_CLRn signal must be tied to VCCIO through a 10kohm resistor for normal operation; floating this pin can cause unpredictable behavior during power-up transitions. Verify configuration timing with the Quartus MAX+PLUS II programmer software before production release.
Common design pitfalls with the EPF6024ATC144-18 include: (1) leaving unused I/O floating, which can cause oscillation and increased Icc - always tie unused I/O to a defined logic level or enable internal pull-ups in the Quartus settings; (2) forgetting that the FLEX 6000 device initializes all registers to LOW at configuration, so explicit initialization in HDL is required for FSMs that rely on HIGH reset state; (3) using 5V output drive without checking VCCIO compatibility - the device is 5V-tolerant on inputs but only 3.3V on outputs.
合規資訊
RoHS, REACH, lead-free, and halogen-free status not explicitly stated in the verified web data. Marked unknown. AEC-Q100 not applicable - FPGAs are not automotive-qualified. Conflict-minerals compliance per Intel standard supply-chain policy.
