K6T0808C1D-DB70 vs K6T0808C1D-DB55 对比

详细并排对比 K6T0808C1D-DB70 出自 Samsung Electronics 和 K6T0808C1D-DB55 出自 Samsung Electronics。对比关键规格、电气参数、封装、生命周期状态、价格和供货情况,以确定最适合您设计需求的元器件。

Samsung Electronics
K6T0808C1D-DB70 K6T0808C1D-DB70 - 256Kbit (32Kx8) CMOS SRAM 70ns DIP-28 | Samsung

K6T0808C1D-DB70 - 256Kbit (32Kx8) CMOS SRAM 70ns DIP-28 | Samsung

K6T0808C1D-DB70 ⚠ 最后一次采购
Samsung Electronics
K6T0808C1D-DB55 K6T0808C1D-DB55 - 32Kx8 Low Power CMOS SRAM | Samsung

K6T0808C1D-DB55 - 32Kx8 Low Power CMOS SRAM | Samsung

K6T0808C1D-DB55 Obsolete

规格对比

参数 K6T0808C1D-DB70 K6T0808C1D-DB55
品牌 Samsung Electronics Samsung Electronics
分类 Memory ICs Memory ICs
生命周期状态 最后采购期 Obsolete
库存状态 有库存 有库存
单价(USD) $2.40 $3.05
存储器类型 Volatile SRAM (Static RAM) Asynchronous Static RAM (SRAM)
Memory Organization 32K x 8 = 256 Kbit —
Density 256 Kbit (32,768 bytes) 256 Kbit (32K x 8)
Access Time (tAA) 70 ns 70 ns (max)
Supply Voltage (VCC) 4.5 V to 5.5 V 5 V (typical; 4.5 V min per SRAM class)
Operating Current (ICC) 60 mA (typical) —
Standby Current (ISB1) 15 uA (typical) —
工作温度 0C to +70C (commercial) -40 C to +85 C (industrial)
接口 Parallel, asynchronous, TTL-compatible —
Output Enable (OE) Yes (active-low) —
Write Enable (WE) Yes (active-low) —
Chip Enable CE1 (active-low), CE2 (active-high) —
数据总线宽度 8 bits —
封装 DIP-28 (600 mil, 'DB' code) 28-pin TSOP1F (Type I, forward)
安装类型 Through-Hole Surface Mount
Process Technology CMOS (6T cell) Samsung advanced CMOS
RoHS 状态 [DATA_NEEDED: RoHS compliance status] [DATA_NEEDED: verify on Samsung product page]
MSL 等级 [DATA_NEEDED: MSL rating] [DATA_NEEDED: MSL classification]
存储组织 — 32,768 words x 8 bits
Standby Current — [DATA_NEEDED: typical ISB1 in uA]
Operating Current — [DATA_NEEDED: typical ICC in mA]
输出类型 — Three-state, bidirectional DQs
I/O Logic Level — TTL-compatible
Data Retention Voltage — [DATA_NEEDED: VDR minimum in V]
Lead-Free — [DATA_NEEDED: confirm]

数据手册与资源

浏览全部产品 创建 BOM 获取报价