RTAX250S-1LG624V vs RTAX250S-CG624E مقارنة
مقارنة تفصيلية جنبًا إلى جنب لـ RTAX250S-1LG624V بواسطة Microchip Technology و RTAX250S-CG624E بواسطة Microchip Technology. قارن المواصفات الرئيسية والمعلمات الكهربائية والتغليف وحالة دورة الحياة والأسعار والتوافر لتحديد أفضل مكوّن لمتطلبات تصميمك.
Microchip Technology
RTAX250S-1LG624V - 250K-Gate Rad-Tolerant FPGA 1.5V | Microchip
RTAX250S-1LG624V ✓ نشطMicrochip Technology
RTAX250S-CG624E - 250K-Gate Rad-Tolerant FPGA | Microchip
RTAX250S-CG624E ✓ نشطمقارنة المواصفات
| المعامل | RTAX250S-1LG624V | RTAX250S-CG624E |
|---|---|---|
| العلامة التجارية | Microchip Technology | Microchip Technology |
| الفئة | FPGA & CPLD | FPGA & CPLD |
| حالة دورة الحياة | نشط | نشط |
| Family | RTAX-S Radiation-Tolerant FPGA | RTAX-S radiation-tolerant FPGA |
| Equivalent Gate Count | 250000 gates | — |
| Configurable Logic Blocks (CLBs) | 2816 | — |
| Logic Cells | 4224 | — |
| I/Os | 248 | — |
| Core Supply Voltage | 1.5 V nominal | 1.5 V |
| Speed Grade | -1 | — |
| العلبة | CGA624 (LG624), 624-column ceramic column grid array | — |
| Package Suffix | V (leaded column finish) | — |
| درجة حرارة التشغيل | -55C to +125C | -55C to +125C |
| Technology | CMOS, antifuse programmable | — |
| Radiation Tolerance | Radiation-tolerant (RTAX-S family, SEU-tolerant) [DATA_NEEDED: TID and SEU LET figures] | — |
| Configuration | Live at power-up, single chip, no boot PROM | — |
| نوع التركيب | Surface Mount | Surface Mount |
| مستوى MSL | [DATA_NEEDED: MSL level] | — |
| حالة RoHS | [DATA_NEEDED: RoHS status - ceramic space-grade package typically exempt] | — |
| حالة دورة الحياة | Active | — |
| System Gates | — | 250000 gates |
| Logic Cells (CLBs) | — | 2816 |
| Maximum Toggle Frequency | — | 649 MHz |
| Process Technology | — | 0.15 um CMOS |
| Logic Family | — | CMOS |
| CLB Combinatorial Delay (max) | — | 0.930 ns |
| Package Type | — | CCGA-624 (ceramic column grid array, 624 pins) |
| Programming Technology | — | Antifuse (one-time programmable) |
| SEU Hardening | — | SEU-hardened registers, no external TMR required |
| SEU Immunity | — | Immune to single-event upsets to specified LET threshold; SEU rate < 10-10 errors/bit-day |
| Power-Up Behavior | — | Live at power-up (true single-chip) |
| Target Application | — | Space-flight systems |