RTAX250S-1LG624V vs RTAX250S-CG624E तुलना
विस्तृत दोनों ओर की तुलना RTAX250S-1LG624V द्वारा Microchip Technology और RTAX250S-CG624E द्वारा Microchip Technology. मुख्य विशेषताओं, इलेक्ट्रिकल पैरामीटर, पैकेजिंग, चक्र स्थिति, मूल्यांकन और उपलब्धता को तुलना करके अपनी डिजाइन की आवश्यकताओं के लिए सबसे अच्छा घटक निर्धारित करें。
Microchip Technology
RTAX250S-1LG624V - 250K-Gate Rad-Tolerant FPGA 1.5V | Microchip
RTAX250S-1LG624V ✓ सक्रियMicrochip Technology
RTAX250S-CG624E - 250K-Gate Rad-Tolerant FPGA | Microchip
RTAX250S-CG624E ✓ सक्रियविशेषता तुलना
| पैरामीटर | RTAX250S-1LG624V | RTAX250S-CG624E |
|---|---|---|
| ब्रांड | Microchip Technology | Microchip Technology |
| श्रेणी | FPGA & CPLD | FPGA & CPLD |
| लाइफसाइकिल स्थिति | सक्रिय | सक्रिय |
| Family | RTAX-S Radiation-Tolerant FPGA | RTAX-S radiation-tolerant FPGA |
| Equivalent Gate Count | 250000 gates | — |
| Configurable Logic Blocks (CLBs) | 2816 | — |
| Logic Cells | 4224 | — |
| I/Os | 248 | — |
| Core Supply Voltage | 1.5 V nominal | 1.5 V |
| Speed Grade | -1 | — |
| पैकेज | CGA624 (LG624), 624-column ceramic column grid array | — |
| Package Suffix | V (leaded column finish) | — |
| ऑपरेटिंग तापमान | -55C to +125C | -55C to +125C |
| Technology | CMOS, antifuse programmable | — |
| Radiation Tolerance | Radiation-tolerant (RTAX-S family, SEU-tolerant) [DATA_NEEDED: TID and SEU LET figures] | — |
| Configuration | Live at power-up, single chip, no boot PROM | — |
| माउंटिंग प्रकार | Surface Mount | Surface Mount |
| MSL स्तर | [DATA_NEEDED: MSL level] | — |
| RoHS स्थिति | [DATA_NEEDED: RoHS status - ceramic space-grade package typically exempt] | — |
| लाइफसाइकिल स्थिति | Active | — |
| System Gates | — | 250000 gates |
| Logic Cells (CLBs) | — | 2816 |
| Maximum Toggle Frequency | — | 649 MHz |
| Process Technology | — | 0.15 um CMOS |
| Logic Family | — | CMOS |
| CLB Combinatorial Delay (max) | — | 0.930 ns |
| Package Type | — | CCGA-624 (ceramic column grid array, 624 pins) |
| Programming Technology | — | Antifuse (one-time programmable) |
| SEU Hardening | — | SEU-hardened registers, no external TMR required |
| SEU Immunity | — | Immune to single-event upsets to specified LET threshold; SEU rate < 10-10 errors/bit-day |
| Power-Up Behavior | — | Live at power-up (true single-chip) |
| Target Application | — | Space-flight systems |