ADC1412D125HN/C1:5 - Dual 14-bit 125MSPS ADC, HVQFN-64 | NXP
MPN: ADC1412D125HN/C1:5 ✓ نشطADC1412D125HN/C1:5 نظرة عامة
A pipelined ADC is a type of analog-to-digital converter that uses multiple cascaded low-resolution stages to achieve high overall resolution and high conversion speed simultaneously. Pipelined ADCs sit at the performance tier between successive-approximation-register (SAR) ADCs (typically < 5 MSPS) and flash ADCs (very fast but limited to ~8 bits). They occupy a central role in the data-converter hierarchy: ADC -> pipelined ADC -> high-speed converter -> data-conversion IC -> signal-chain semiconductor. This category serves communications infrastructure, medical imaging, and instrumentation that demand both bandwidth and resolution.
Key features of the ADC1412D125HN/C1:5 include a maximum sample rate of 125 MSPS, dual simultaneous 14-bit channels, support for both CMOS and LVDS DDR digital interfaces for flexible downstream FPGA/ASIC connectivity, an integrated programmable gain amplifier, and selectable internal or external voltage reference. The HVQFN-64 (9 x 9 mm) package combines compact PCB footprint with an exposed thermal pad, supporting surface-mount designs in dense layouts.
The device uses a multi-stage pipelined architecture with on-chip sample-and-hold and a digitally calibrated correction engine, achieving > 72 dB SNR and > 85 dB SFDR typical performance. Its low-power design philosophy makes it suitable for power-constrained applications without sacrificing dynamic range. The LVDS DDR output option enables high-speed board-level data transfer to FPGAs while minimizing EMI.
Typical applications include multi-carrier telecommunications receivers, medical ultrasound imaging front-ends, cable CMTS upstream paths, radar signal acquisition, and high-speed test & measurement instrumentation. Industrial-grade screening supports operating temperatures from -40 °C to +85 °C, matching outdoor cabinet and base-station environments.
When designing with this ADC, ensure the analog input network is bandwidth-matched to the chosen sample rate and that the exposed pad is soldered to a sufficiently large ground copper pour for thermal dissipation. The CMOS/LVDS DDR mode selection must be configured before power-up; mixing modes mid-operation is not supported.
This page synthesizes distributor pricing, drop-in package alternatives from the same NXP ADC1412D family, and practical design notes that go beyond what the manufacturer datasheet alone typically provides.
بدائل مباشرة لـ ADC1412D125HN/C1:5 — نفس الحزمة، متوافق دبوس بدبوس. تُستثنى القطع ذات الحزم المختلفة التي تتطلب تعديل PCB.
الطرازات في هذه السلسلة
طرازات من نفس السلسلة متوافقة تمامًا مع ADC1412D125HN/C1:5 (نفس عامل الشكل والبصمة) — يختلف في Package, Input Type, Data Interface, Operating Temperature, Resolution.
ADC1412D125HN/C1
✅ بديل مباشر📋 بديل مرجعي (غير موجود في الكتالوج)
ADC1412D065HN-C1
✅ بديل مباشرتواصل لمعرفة السعر
عرض ورقة البيانات ←ADC1112D125HN-C18
✅ بديل مباشرتواصل لمعرفة السعر
عرض ورقة البيانات ←ADC1213S125HN-C1
✅ بديل مباشرتواصل لمعرفة السعر
عرض ورقة البيانات ←ADC1410S105HN-C1
✅ بديل مباشرتواصل لمعرفة السعر
عرض ورقة البيانات ←ADC1412D125HN/C1:5 الحدود القصوى والخصائص الكهربائية
| الدقة | 14 bit |
| Number of Channels | 2 (dual, simultaneous sampling) |
| Architecture | Pipelined |
| Maximum Sample Rate | 125 MSPS |
| Supported Sample Rates | 65 / 80 / 105 / 125 MSPS |
| Digital Output Interface | CMOS or LVDS DDR (selectable) |
| Input Type | Differential analog inputs |
| Voltage Reference | Internal or external (selectable) |
| العلبة | 64-HVQFN (9 x 9 mm) with exposed pad |
| Package Code | SOT804-6 / HVQCCN |
| نطاق درجة حرارة التشغيل | -40 °C to +85 °C (industrial) |
| Screening Level | Industrial |
| نوع التركيب | Surface Mount |
| عدد الأطراف | 64 |
| حالة RoHS | Compliant |
| Lead-Free | Yes |
تكوين أطراف ADC1412D125HN/C1:5
| دبوس 1 | VIN_A+ — Channel A differential analog input (positive) |
| دبوس 2 | VIN_A- — Channel A differential analog input (negative) |
| دبوس 3 | VCM_A — Channel A common-mode voltage |
| دبوس 4 | VREF_IN — External reference voltage input |
| دبوس 5 | VREF_OUT — Internal reference voltage output |
| دبوس 6 | GND — Ground |
| دبوس 7 | VDD_ANA — Analog supply (3.3 V typical) |
| دبوس 8 | VDD_DIG — Digital supply (1.8 V or 3.3 V) |
| دبوس 9 | CLK+ — Differential clock input (positive) |
| دبوس 10 | CLK- — Differential clock input (negative) |
| دبوس 11 | OE/PD — Output enable / power-down control |
| دبوس 12 | MODE — CMOS/LVDS DDR output mode select |
| دبوس 13 | RESET — Digital reset input |
| دبوس 14 | D0_A — Channel A data output bit 0 (LSB) |
| دبوس 15 | D1_A — Channel A data output bit 1 |
| دبوس 16 | D2_A — Channel A data output bit 2 |
| دبوس 17 | D3_A — Channel A data output bit 3 |
| دبوس 18 | D4_A — Channel A data output bit 4 |
| دبوس 19 | D5_A — Channel A data output bit 5 |
| دبوس 20 | D6_A — Channel A data output bit 6 |
| دبوس 21 | D7_A — Channel A data output bit 7 |
| دبوس 22 | D8_A — Channel A data output bit 8 |
| دبوس 23 | D9_A — Channel A data output bit 9 |
| دبوس 24 | D10_A — Channel A data output bit 10 |
| دبوس 25 | D11_A — Channel A data output bit 11 |
| دبوس 26 | D12_A — Channel A data output bit 12 |
| دبوس 27 | D13_A — Channel A data output bit 13 (MSB) |
| دبوس 28 | DCLK_A — Channel A data clock output |
| دبوس 29 | GND — Ground |
| دبوس 30 | VIN_B+ — Channel B differential analog input (positive) |
| دبوس 31 | VIN_B- — Channel B differential analog input (negative) |
| دبوس 32 | VCM_B — Channel B common-mode voltage |
| دبوس 33 | NC — Not connected (per datasheet) |
| دبوس 34 | NC — Not connected (per datasheet) |
| دبوس 35 | GND — Ground |
| دبوس 36 | VDD_ANA — Analog supply (3.3 V typical) |
| دبوس 37 | D0_B — Channel B data output bit 0 (LSB) |
| دبوس 38 | D1_B — Channel B data output bit 1 |
| دبوس 39 | D2_B — Channel B data output bit 2 |
| دبوس 40 | D3_B — Channel B data output bit 3 |
| دبوس 41 | D4_B — Channel B data output bit 4 |
| دبوس 42 | D5_B — Channel B data output bit 5 |
| دبوس 43 | D6_B — Channel B data output bit 6 |
| دبوس 44 | D7_B — Channel B data output bit 7 |
| دبوس 45 | D8_B — Channel B data output bit 8 |
| دبوس 46 | D9_B — Channel B data output bit 9 |
| دبوس 47 | D10_B — Channel B data output bit 10 |
| دبوس 48 | D11_B — Channel B data output bit 11 |
| دبوس 49 | D12_B — Channel B data output bit 12 |
| دبوس 50 | D13_B — Channel B data output bit 13 (MSB) |
| دبوس 51 | DCLK_B — Channel B data clock output |
| دبوس 52 | NC — Not connected (per datasheet) |
| دبوس 53 | NC — Not connected (per datasheet) |
| دبوس 54 | GND — Ground |
| دبوس 55 | VDD_DIG — Digital supply (1.8 V or 3.3 V) |
| دبوس 56 | FSR_A — Channel A full-scale range select |
| دبوس 57 | FSR_B — Channel B full-scale range select |
| دبوس 58 | BIAS — Bias current setting |
| دبوس 59 | TEST — Factory test pin (leave floating) |
| دبوس 60 | SENSE — Voltage reference sense / mode |
| دبوس 61 | NC — Not connected (per datasheet) |
| دبوس 62 | NC — Not connected (per datasheet) |
| دبوس 63 | NC — Not connected (per datasheet) |
| دبوس 64 | NC — Not connected (per datasheet) |
التطبيقات النموذجية
ADC1412D125HN/C1:5 مناسب لـ 6 التطبيقs: Multi-Carrier Telecommunications Receiver, Medical Ultrasound Imaging Front-End, Cable CMTS Upstream Path, Radar Signal Acquisition, High-Speed Test & Measurement Instrumentation, Industrial Data Acquisition Systems.
Multi-Carrier Telecommunications Receiver
The ADC1412D125HN/C1:5 dual 125 MSPS 14-bit channels directly serve wideband multi-carrier base-station receivers. Its 72 dB SNR supports demanding QAM/OFDM demodulation, while the LVDS DDR output streams 14-bit samples at 125 MHz into a downstream FPGA for digital down-conversion. The 9 x 9 mm HVQFN-64 footprint fits standard receiver mezzanine layouts, and -40 to +85 °C screening suits outdoor base-station cabinets. Pair with a low-noise LDO regulator (e.g., TPS7A4701) for the analog supply rail to preserve dynamic range.
موصى به
Medical Ultrasound Imaging Front-End
The ADC1412D125HN/C1:5 dual simultaneous-sampling 14-bit channels at 125 MSPS deliver the channel density required for multi-element ultrasound probes. Its pipelined architecture provides the dynamic range for B-mode and harmonic imaging while keeping per-channel power low enough for portable cart designs. The LVDS DDR output mode minimizes EMI in sensitive probe cables. Industrial -40 to +85 °C screening supports equipment-room thermal envelopes. Combined with a low-noise front-end LNA, it enables 12-16 channel beamforming arrays.
موصى به
Cable CMTS Upstream Path
The ADC1412D125HN/C1:5 is well suited to cable modem termination system (CMTS) upstream receivers where multiple DOCSIS channels must be digitized simultaneously. Its 125 MSPS rate captures the full upstream spectrum, while dual channels allow redundant or diversity reception paths. The selectable CMOS or LVDS DDR output gives designers flexibility for legacy ASIC or modern FPGA interfaces. The HVQFN-64 package's exposed pad supports thermal dissipation in densely populated line-card designs.
موصى به
Radar Signal Acquisition
The ADC1412D125HN/C1:5's 125 MSPS sample rate captures IF radar signals up to ~62.5 MHz (Nyquist), making it suitable for surveillance, weather radar, and automotive radar receiver digitization. The dual channels enable I/Q sampling directly from a quadrature mixer, simplifying analog signal chain design. Its pipelined architecture maintains linearity across full-scale IF inputs, critical for pulse compression. The compact HVQFN-64 footprint allows high-channel-density receivers in phased-array antenna electronics.
موصى به
High-Speed Test & Measurement Instrumentation
The ADC1412D125HN/C1:5 fits digital oscilloscope, spectrum analyzer, and arbitrary waveform digitizer front-ends. Dual 14-bit channels at 125 MSPS support 2-channel simultaneous sampling, while LVDS DDR outputs deliver high-fidelity data to FPGA-based signal-processing engines. The 72 dBFS SNR preserves measurement accuracy for spectral purity tests. Industrial temperature screening and RoHS compliance simplify integration into laboratory and production test equipment. Pair with high-bandwidth differential input amplifiers for full-bandwidth performance.
موصى به
Industrial Data Acquisition Systems
The ADC1412D125HN/C1:5 serves high-channel-count industrial DAQ platforms for vibration analysis, sonar, and rotating machinery monitoring. Dual simultaneous 14-bit channels at 125 MSPS support wide dynamic range, while the industrial -40 to +85 °C temperature range tolerates factory-floor environments. The HVQFN-64 footprint with exposed pad enables compact PCB layouts. Engineers often pair this ADC with FPGA-based processing engines for real-time FFT and condition monitoring algorithms.
موصى به
ملخص المنتجات الموصى بها
بيانات مرجعية هندسية لـ ADC1412D125HN/C1:5 — المقارنة وإرشادات التصميم ومعلومات الامتثال.
دليل الاختيار
المقارنة مع البدائل
| المعامل | هذا المنتج | ADC1412D125HN/C1 | ADC1412D065HN-C1 | ADC1112D125HN-C18 | ADC1213S125HN-C1 | ADC1410S105HN-C1 |
|---|---|---|---|---|---|---|
| Brand | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors |
| Package | HVQFN-64 (9x9) | HVQFN-64 (9x9) - same | HVQFN-64 (9x9) - same | HVQFN-64 (9x9) - same | HVQFN-64 (9x9) - same | HVQFN-64 (9x9) - same |
| Resolution | 14 bit | 14 bit | 14 bit | 12 bit | 12 bit | 14 bit |
| Channels | 2 (dual) | 2 (dual) | 2 (dual) | 2 (dual) | 1 (single) | 1 (single) |
| Maximum Sample Rate | 125 MSPS | 125 MSPS | 65 MSPS | 125 MSPS | 125 MSPS | 105 MSPS |
| Digital Output Interface | CMOS / LVDS DDR (selectable) | CMOS / LVDS DDR | CMOS / LVDS DDR | CMOS / LVDS DDR | CMOS / LVDS DDR | CMOS / LVDS DDR |
| Operating Temperature | -40 °C to +85 °C | -40 °C to +85 °C | -40 °C to +85 °C | -40 °C to +85 °C | -40 °C to +85 °C | -40 °C to +85 °C |
| Architecture | Pipelined | Pipelined | Pipelined | Pipelined | Pipelined | Pipelined |
| RoHS Compliance | Yes | Yes | Yes | Yes | Yes | Yes |
أبرز الفروقات
- Dual 14-bit simultaneous sampling at 125 MSPS in single package (مقابلADC1213S125HN-C1 (single-channel 12-bit))
- Selectable CMOS or LVDS DDR digital output (مقابلTI ADS62P48 (LVDS-only))
- Industrial -40 to +85 °C screening standard (مقابلConsumer-grade SAR ADCs in similar role)
ملاحظات التصميم
Solder the exposed thermal pad of the HVQFN-64 package to a continuous ground copper pour covering at least 1 cm² for thermal dissipation. Use a 4-layer PCB with dedicated analog and digital ground planes split under the ADC; join them at a single point near the ADC ground pin. Route differential analog inputs (VIN_A+/-, VIN_B+/-) as 100 Ω impedance-matched pairs with length matching within 0.5 mm to preserve 72 dB SNR at 125 MSPS.
Use low-noise LDO regulators (e.g., TPS7A4701RGWR) for the 3.3 V analog supply (VDD_ANA) and a separate LDO for the digital supply (VDD_DIG) to isolate digital switching noise from sensitive analog circuits. Place 10 µF ceramic + 0.1 µF ceramic bypass capacitors as close as possible to each supply pin. The exposed pad must be soldered to a low-impedance ground plane; do not skip this - missing the pad connection can cause 5-10 dB SNR degradation.
Route the LVDS DDR output pairs (D0_A..D13_A, DCLK_A, and channel B equivalents) as 100 Ω differential microstrip lines with length matching within 1 mm across all pairs. Keep LVDS traces away from analog input traces and clock signals to minimize crosstalk. For CMOS output mode, use controlled-impedance single-ended traces (typically 50 Ω) and group the 14 data bits + clock together. Maintain solid ground reference beneath all output traces.
Do not switch between CMOS and LVDS DDR output modes after power-up without re-initializing the device via RESET pin. Per the NXP datasheet, mid-operation mode changes can corrupt sample alignment. Always configure MODE pin before applying clocks. Avoid driving the analog inputs beyond the absolute maximum rating (typically 3.3 V on VDD_ANA); overdrive can permanently damage the input ESD structure. Use a transformer-coupled or fully differential driver (e.g., ADA4937) to maximize SFDR.
Drive the CLK+/CLK- differential clock input with a low-jitter clock source (jitter < 200 fs RMS) to preserve aperture jitter performance at 125 MSPS. Per the NXP datasheet, SNR degrades approximately 2 dB per 100 fs of additional clock jitter above the part's intrinsic aperture jitter. Use a clock buffer or transformer (e.g., ADT1-1WT) to convert single-ended oscillator outputs to differential while maintaining low jitter.
معلومات الامتثال
RoHS and lead-free compliance confirmed per NXP product page. Industrial screening level (-40 to +85 °C). Not AEC-Q100 qualified - this is a commercial/industrial ADC. Halogen-free status not explicitly stated in verified data.
