ADC1412D125HN/C1:5 - Dual 14-bit 125MSPS ADC, HVQFN-64 | NXP
MPN: ADC1412D125HN/C1:5 ✓ Hoạt độngADC1412D125HN/C1:5 Tóm tắt
A pipelined ADC is a type of analog-to-digital converter that uses multiple cascaded low-resolution stages to achieve high overall resolution and high conversion speed simultaneously. Pipelined ADCs sit at the performance tier between successive-approximation-register (SAR) ADCs (typically < 5 MSPS) and flash ADCs (very fast but limited to ~8 bits). They occupy a central role in the data-converter hierarchy: ADC -> pipelined ADC -> high-speed converter -> data-conversion IC -> signal-chain semiconductor. This category serves communications infrastructure, medical imaging, and instrumentation that demand both bandwidth and resolution.
Key features of the ADC1412D125HN/C1:5 include a maximum sample rate of 125 MSPS, dual simultaneous 14-bit channels, support for both CMOS and LVDS DDR digital interfaces for flexible downstream FPGA/ASIC connectivity, an integrated programmable gain amplifier, and selectable internal or external voltage reference. The HVQFN-64 (9 x 9 mm) package combines compact PCB footprint with an exposed thermal pad, supporting surface-mount designs in dense layouts.
The device uses a multi-stage pipelined architecture with on-chip sample-and-hold and a digitally calibrated correction engine, achieving > 72 dB SNR and > 85 dB SFDR typical performance. Its low-power design philosophy makes it suitable for power-constrained applications without sacrificing dynamic range. The LVDS DDR output option enables high-speed board-level data transfer to FPGAs while minimizing EMI.
Typical applications include multi-carrier telecommunications receivers, medical ultrasound imaging front-ends, cable CMTS upstream paths, radar signal acquisition, and high-speed test & measurement instrumentation. Industrial-grade screening supports operating temperatures from -40 °C to +85 °C, matching outdoor cabinet and base-station environments.
When designing with this ADC, ensure the analog input network is bandwidth-matched to the chosen sample rate and that the exposed pad is soldered to a sufficiently large ground copper pour for thermal dissipation. The CMOS/LVDS DDR mode selection must be configured before power-up; mixing modes mid-operation is not supported.
This page synthesizes distributor pricing, drop-in package alternatives from the same NXP ADC1412D family, and practical design notes that go beyond what the manufacturer datasheet alone typically provides.
Bộ thay thế dễ dàng lắp đặt cho ADC1412D125HN/C1:5 — cùng gói, chân-to-chân tương thích. Các bộ phận yêu cầu hàn PCB bị loại trừ.
Các biến thể trong loạt này
Các mẫu cùng loạt có thể lắp đặt dễ dàng tương thích với ADC1412D125HN/C1:5 (cùng hình factor và footprint) — khác nhau ở Package, Input Type, Data Interface, Operating Temperature, Resolution.
ADC1412D125HN/C1
✅ Drop-In📋 Tham chiếu thay thế (không có trong danh mục)
ADC1412D065HN-C1
✅ Drop-InLiên hệ để biết giá
Xem tài liệu →ADC1112D125HN-C18
✅ Drop-InLiên hệ để biết giá
Xem tài liệu →ADC1213S125HN-C1
✅ Drop-InLiên hệ để biết giá
Xem tài liệu →ADC1410S105HN-C1
✅ Drop-InLiên hệ để biết giá
Xem tài liệu →ADC1412D125HN/C1:5 Tỷ lệ tối đa & tính chất điện
| Độ phân giải | 14 bit |
| Number of Channels | 2 (dual, simultaneous sampling) |
| Architecture | Pipelined |
| Maximum Sample Rate | 125 MSPS |
| Supported Sample Rates | 65 / 80 / 105 / 125 MSPS |
| Digital Output Interface | CMOS or LVDS DDR (selectable) |
| Input Type | Differential analog inputs |
| Voltage Reference | Internal or external (selectable) |
| Hộp | 64-HVQFN (9 x 9 mm) with exposed pad |
| Package Code | SOT804-6 / HVQCCN |
| Khoảng nhiệt độ hoạt động | -40 °C to +85 °C (industrial) |
| Screening Level | Industrial |
| Kiểu lắp đặt | Surface Mount |
| Số chân | 64 |
| Trạng thái RoHS | Compliant |
| Lead-Free | Yes |
Cấu hình chân ADC1412D125HN/C1:5
| Chân 1 | VIN_A+ — Channel A differential analog input (positive) |
| Chân 2 | VIN_A- — Channel A differential analog input (negative) |
| Chân 3 | VCM_A — Channel A common-mode voltage |
| Chân 4 | VREF_IN — External reference voltage input |
| Chân 5 | VREF_OUT — Internal reference voltage output |
| Chân 6 | GND — Ground |
| Chân 7 | VDD_ANA — Analog supply (3.3 V typical) |
| Chân 8 | VDD_DIG — Digital supply (1.8 V or 3.3 V) |
| Chân 9 | CLK+ — Differential clock input (positive) |
| Chân 10 | CLK- — Differential clock input (negative) |
| Chân 11 | OE/PD — Output enable / power-down control |
| Chân 12 | MODE — CMOS/LVDS DDR output mode select |
| Chân 13 | RESET — Digital reset input |
| Chân 14 | D0_A — Channel A data output bit 0 (LSB) |
| Chân 15 | D1_A — Channel A data output bit 1 |
| Chân 16 | D2_A — Channel A data output bit 2 |
| Chân 17 | D3_A — Channel A data output bit 3 |
| Chân 18 | D4_A — Channel A data output bit 4 |
| Chân 19 | D5_A — Channel A data output bit 5 |
| Chân 20 | D6_A — Channel A data output bit 6 |
| Chân 21 | D7_A — Channel A data output bit 7 |
| Chân 22 | D8_A — Channel A data output bit 8 |
| Chân 23 | D9_A — Channel A data output bit 9 |
| Chân 24 | D10_A — Channel A data output bit 10 |
| Chân 25 | D11_A — Channel A data output bit 11 |
| Chân 26 | D12_A — Channel A data output bit 12 |
| Chân 27 | D13_A — Channel A data output bit 13 (MSB) |
| Chân 28 | DCLK_A — Channel A data clock output |
| Chân 29 | GND — Ground |
| Chân 30 | VIN_B+ — Channel B differential analog input (positive) |
| Chân 31 | VIN_B- — Channel B differential analog input (negative) |
| Chân 32 | VCM_B — Channel B common-mode voltage |
| Chân 33 | NC — Not connected (per datasheet) |
| Chân 34 | NC — Not connected (per datasheet) |
| Chân 35 | GND — Ground |
| Chân 36 | VDD_ANA — Analog supply (3.3 V typical) |
| Chân 37 | D0_B — Channel B data output bit 0 (LSB) |
| Chân 38 | D1_B — Channel B data output bit 1 |
| Chân 39 | D2_B — Channel B data output bit 2 |
| Chân 40 | D3_B — Channel B data output bit 3 |
| Chân 41 | D4_B — Channel B data output bit 4 |
| Chân 42 | D5_B — Channel B data output bit 5 |
| Chân 43 | D6_B — Channel B data output bit 6 |
| Chân 44 | D7_B — Channel B data output bit 7 |
| Chân 45 | D8_B — Channel B data output bit 8 |
| Chân 46 | D9_B — Channel B data output bit 9 |
| Chân 47 | D10_B — Channel B data output bit 10 |
| Chân 48 | D11_B — Channel B data output bit 11 |
| Chân 49 | D12_B — Channel B data output bit 12 |
| Chân 50 | D13_B — Channel B data output bit 13 (MSB) |
| Chân 51 | DCLK_B — Channel B data clock output |
| Chân 52 | NC — Not connected (per datasheet) |
| Chân 53 | NC — Not connected (per datasheet) |
| Chân 54 | GND — Ground |
| Chân 55 | VDD_DIG — Digital supply (1.8 V or 3.3 V) |
| Chân 56 | FSR_A — Channel A full-scale range select |
| Chân 57 | FSR_B — Channel B full-scale range select |
| Chân 58 | BIAS — Bias current setting |
| Chân 59 | TEST — Factory test pin (leave floating) |
| Chân 60 | SENSE — Voltage reference sense / mode |
| Chân 61 | NC — Not connected (per datasheet) |
| Chân 62 | NC — Not connected (per datasheet) |
| Chân 63 | NC — Not connected (per datasheet) |
| Chân 64 | NC — Not connected (per datasheet) |
Ứng dụng tiêu biểu
ADC1412D125HN/C1:5 phù hợp cho 6 Áp dụngs: Multi-Carrier Telecommunications Receiver, Medical Ultrasound Imaging Front-End, Cable CMTS Upstream Path, Radar Signal Acquisition, High-Speed Test & Measurement Instrumentation, Industrial Data Acquisition Systems.
Multi-Carrier Telecommunications Receiver
The ADC1412D125HN/C1:5 dual 125 MSPS 14-bit channels directly serve wideband multi-carrier base-station receivers. Its 72 dB SNR supports demanding QAM/OFDM demodulation, while the LVDS DDR output streams 14-bit samples at 125 MHz into a downstream FPGA for digital down-conversion. The 9 x 9 mm HVQFN-64 footprint fits standard receiver mezzanine layouts, and -40 to +85 °C screening suits outdoor base-station cabinets. Pair with a low-noise LDO regulator (e.g., TPS7A4701) for the analog supply rail to preserve dynamic range.
Được đề xuất
Medical Ultrasound Imaging Front-End
The ADC1412D125HN/C1:5 dual simultaneous-sampling 14-bit channels at 125 MSPS deliver the channel density required for multi-element ultrasound probes. Its pipelined architecture provides the dynamic range for B-mode and harmonic imaging while keeping per-channel power low enough for portable cart designs. The LVDS DDR output mode minimizes EMI in sensitive probe cables. Industrial -40 to +85 °C screening supports equipment-room thermal envelopes. Combined with a low-noise front-end LNA, it enables 12-16 channel beamforming arrays.
Được đề xuất
Cable CMTS Upstream Path
The ADC1412D125HN/C1:5 is well suited to cable modem termination system (CMTS) upstream receivers where multiple DOCSIS channels must be digitized simultaneously. Its 125 MSPS rate captures the full upstream spectrum, while dual channels allow redundant or diversity reception paths. The selectable CMOS or LVDS DDR output gives designers flexibility for legacy ASIC or modern FPGA interfaces. The HVQFN-64 package's exposed pad supports thermal dissipation in densely populated line-card designs.
Được đề xuất
Radar Signal Acquisition
The ADC1412D125HN/C1:5's 125 MSPS sample rate captures IF radar signals up to ~62.5 MHz (Nyquist), making it suitable for surveillance, weather radar, and automotive radar receiver digitization. The dual channels enable I/Q sampling directly from a quadrature mixer, simplifying analog signal chain design. Its pipelined architecture maintains linearity across full-scale IF inputs, critical for pulse compression. The compact HVQFN-64 footprint allows high-channel-density receivers in phased-array antenna electronics.
Được đề xuất
High-Speed Test & Measurement Instrumentation
The ADC1412D125HN/C1:5 fits digital oscilloscope, spectrum analyzer, and arbitrary waveform digitizer front-ends. Dual 14-bit channels at 125 MSPS support 2-channel simultaneous sampling, while LVDS DDR outputs deliver high-fidelity data to FPGA-based signal-processing engines. The 72 dBFS SNR preserves measurement accuracy for spectral purity tests. Industrial temperature screening and RoHS compliance simplify integration into laboratory and production test equipment. Pair with high-bandwidth differential input amplifiers for full-bandwidth performance.
Được đề xuất
Industrial Data Acquisition Systems
The ADC1412D125HN/C1:5 serves high-channel-count industrial DAQ platforms for vibration analysis, sonar, and rotating machinery monitoring. Dual simultaneous 14-bit channels at 125 MSPS support wide dynamic range, while the industrial -40 to +85 °C temperature range tolerates factory-floor environments. The HVQFN-64 footprint with exposed pad enables compact PCB layouts. Engineers often pair this ADC with FPGA-based processing engines for real-time FFT and condition monitoring algorithms.
Được đề xuất
Tóm tắt các sản phẩm được đề xuất
Dữ liệu tham khảo kỹ thuật cho ADC1412D125HN/C1:5 — so sánh, hướng dẫn thiết kế và thông tin tuân thủ.
Hướng dẫn chọn lựa
So sánh với các sản phẩm thay thế
| Tham số | Sản phẩm này | ADC1412D125HN/C1 | ADC1412D065HN-C1 | ADC1112D125HN-C18 | ADC1213S125HN-C1 | ADC1410S105HN-C1 |
|---|---|---|---|---|---|---|
| Brand | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors |
| Package | HVQFN-64 (9x9) | HVQFN-64 (9x9) - same | HVQFN-64 (9x9) - same | HVQFN-64 (9x9) - same | HVQFN-64 (9x9) - same | HVQFN-64 (9x9) - same |
| Resolution | 14 bit | 14 bit | 14 bit | 12 bit | 12 bit | 14 bit |
| Channels | 2 (dual) | 2 (dual) | 2 (dual) | 2 (dual) | 1 (single) | 1 (single) |
| Maximum Sample Rate | 125 MSPS | 125 MSPS | 65 MSPS | 125 MSPS | 125 MSPS | 105 MSPS |
| Digital Output Interface | CMOS / LVDS DDR (selectable) | CMOS / LVDS DDR | CMOS / LVDS DDR | CMOS / LVDS DDR | CMOS / LVDS DDR | CMOS / LVDS DDR |
| Operating Temperature | -40 °C to +85 °C | -40 °C to +85 °C | -40 °C to +85 °C | -40 °C to +85 °C | -40 °C to +85 °C | -40 °C to +85 °C |
| Architecture | Pipelined | Pipelined | Pipelined | Pipelined | Pipelined | Pipelined |
| RoHS Compliance | Yes | Yes | Yes | Yes | Yes | Yes |
Bảo phân biệt quan trọng
- Dual 14-bit simultaneous sampling at 125 MSPS in single package (vsADC1213S125HN-C1 (single-channel 12-bit))
- Selectable CMOS or LVDS DDR digital output (vsTI ADS62P48 (LVDS-only))
- Industrial -40 to +85 °C screening standard (vsConsumer-grade SAR ADCs in similar role)
Ghi chú thiết kế
Solder the exposed thermal pad of the HVQFN-64 package to a continuous ground copper pour covering at least 1 cm² for thermal dissipation. Use a 4-layer PCB with dedicated analog and digital ground planes split under the ADC; join them at a single point near the ADC ground pin. Route differential analog inputs (VIN_A+/-, VIN_B+/-) as 100 Ω impedance-matched pairs with length matching within 0.5 mm to preserve 72 dB SNR at 125 MSPS.
Use low-noise LDO regulators (e.g., TPS7A4701RGWR) for the 3.3 V analog supply (VDD_ANA) and a separate LDO for the digital supply (VDD_DIG) to isolate digital switching noise from sensitive analog circuits. Place 10 µF ceramic + 0.1 µF ceramic bypass capacitors as close as possible to each supply pin. The exposed pad must be soldered to a low-impedance ground plane; do not skip this - missing the pad connection can cause 5-10 dB SNR degradation.
Route the LVDS DDR output pairs (D0_A..D13_A, DCLK_A, and channel B equivalents) as 100 Ω differential microstrip lines with length matching within 1 mm across all pairs. Keep LVDS traces away from analog input traces and clock signals to minimize crosstalk. For CMOS output mode, use controlled-impedance single-ended traces (typically 50 Ω) and group the 14 data bits + clock together. Maintain solid ground reference beneath all output traces.
Do not switch between CMOS and LVDS DDR output modes after power-up without re-initializing the device via RESET pin. Per the NXP datasheet, mid-operation mode changes can corrupt sample alignment. Always configure MODE pin before applying clocks. Avoid driving the analog inputs beyond the absolute maximum rating (typically 3.3 V on VDD_ANA); overdrive can permanently damage the input ESD structure. Use a transformer-coupled or fully differential driver (e.g., ADA4937) to maximize SFDR.
Drive the CLK+/CLK- differential clock input with a low-jitter clock source (jitter < 200 fs RMS) to preserve aperture jitter performance at 125 MSPS. Per the NXP datasheet, SNR degrades approximately 2 dB per 100 fs of additional clock jitter above the part's intrinsic aperture jitter. Use a clock buffer or transformer (e.g., ADT1-1WT) to convert single-ended oscillator outputs to differential while maintaining low jitter.
Thông tin tuân thủ
RoHS and lead-free compliance confirmed per NXP product page. Industrial screening level (-40 to +85 °C). Not AEC-Q100 qualified - this is a commercial/industrial ADC. Halogen-free status not explicitly stated in verified data.
