EPM7512BQC208-10 - 512-Macrocell MAX 7000B CPLD, 10ns, PQFP-208 | Altera (Intel)
MPN: EPM7512BQC208-10 ✗ انتهى عمره الإنتاجيEPM7512BQC208-10 نظرة عامة
What is a CPLD? A Complex Programmable Logic Device is a non-volatile programmable logic device that combines multiple PAL-like macrocell arrays with a central interconnect matrix. CPLDs sit between simple SPLDs and FPGAs in the programmable-logic hierarchy, providing fast, deterministic pin-to-pin timing (no boot time), instant-on operation, and EEPROM- or flash-based configuration that retains the bitstream across power cycles. The MAX 7000B family specifically is built on a 2.5 V CMOS EEPROM Multiple Array Matrix (MAX) architecture and was designed as a glue-logic replacement for multiple 74-series TTL parts.
Key features of the EPM7512BQC208-10 include 32 Logic Array Blocks (LABs) of 16 macrocells each, four pin-to-pin output enable signals, in-system programmability through a JTAG-compliant IEEE Std. 1149.1 interface, and a commercial operating temperature grade of 0 to +70 degrees C. The device operates from an internal 2.5 V core supply (2.375 V to 2.625 V) and is supported by the legacy Altera MAX+PLUS II and Quartus II design software.
Architecturally, the MAX 7000B device uses a second-generation MAX architecture with a programmable interconnect array (PIA) that routes signals between LABs. Each macrocell contains a programmable AND/OR array, a flip-flop, and configurable I/O architecture supporting JTAG boundary-scan testing, which simplifies board-level test in production. The -10 speed grade places this part at the slower end of the MAX 7000B range, trading off fmax for reduced cost and easier timing closure in glue-logic applications.
Typical applications include bus-interface bridging, address decoding, state-machine control, peripheral glue logic, industrial I/O expansion, and legacy 5 V/3.3 V system interfacing where the MAX 7000B I/O tolerance is required. The 176 user I/O count is generous for replacing many discrete 74LS/74HC packages with a single device.
When designing, note that the EPM7512BQC208-10 is part of the mature MAX 7000B line: many MAX 7000B variants are now NRND or EOL, so check the latest lifecycle status before committing to a new design. The 208-pin PQFP package requires careful PCB layout, with thermal and high-speed signal-integrity considerations; XAIPART can cross-reference compatible MAX 7000B speed grades (e.g., -7, -10, -12, -15) that share this PQFP-208 footprint.
This page synthesizes distributor stock data, parametric comparison with sibling MAX 7000B speed grades, and practical design considerations not aggregated in any single source.
بدائل مباشرة لـ EPM7512BQC208-10 — نفس الحزمة، متوافق دبوس بدبوس. تُستثنى القطع ذات الحزم المختلفة التي تتطلب تعديل PCB.
الطرازات في هذه السلسلة
طرازات من نفس السلسلة متوافقة تمامًا مع EPM7512BQC208-10 (نفس عامل الشكل والبصمة) — يختلف في Operating Temperature, Programmable Type, Device Type, Package Code, Propagation Delay (tPD).
EPM7512BQC208-7
✅ بديل مباشرتواصل لمعرفة السعر
عرض ورقة البيانات ←EPM7512BQC208-6
✅ بديل مباشر📋 بديل مرجعي (غير موجود في الكتالوج)
EPM7512BQC208-5
✅ بديل مباشرتواصل لمعرفة السعر
عرض ورقة البيانات ←EPM7512BQC208-12
✅ بديل مباشر📋 بديل مرجعي (غير موجود في الكتالوج)
EPM7512BQC208-15
✅ بديل مباشر📋 بديل مرجعي (غير موجود في الكتالوج)
EPM7512BQC208-10 الحدود القصوى والخصائص الكهربائية
| Family | MAX 7000B |
| Series | MAX 7000B |
| Macrocells | 512 |
| Logic Elements / Blocks | 32 LABs (16 macrocells per LAB) |
| Usable Gates | 10,000 |
| User I/Os | 176 |
| Propagation Delay (tpd) | 10 ns (max, pin-to-pin) |
| Programmable Type | In-System Programmable (EEPROM) |
| Internal Supply Voltage | 2.375 V to 2.625 V (nominal 2.5 V) |
| درجة حرارة التشغيل | 0 C to +70 C (commercial) |
| العلبة / الحالة | 208-pin PQFP (28x28 mm), S-PQFP-G208 |
| نوع التركيب | Surface Mount |
| Architecture | CMOS, Multiple Array Matrix (MAX) second-generation |
| JTAG / Boundary Scan | IEEE Std 1149.1 compliant |
| حالة RoHS | unknown |
تكوين أطراف EPM7512BQC208-10
| دبوس 1 | I/O — User I/O pin (function depends on user design) |
| دبوس 2 | I/O — User I/O pin |
| دبوس 3 | I/O — User I/O pin |
| دبوس 4 | I/O — User I/O pin |
| دبوس 5 | I/O — User I/O pin |
| دبوس 6 | I/O — User I/O pin |
| دبوس 7 | I/O — User I/O pin |
| دبوس 8 | I/O — User I/O pin |
| دبوس 9 | I/O — User I/O pin |
| دبوس 10 | I/O — User I/O pin |
| دبوس 11 | I/O — User I/O pin |
| دبوس 12 | I/O — User I/O pin |
| دبوس 13 | I/O — User I/O pin |
| دبوس 14 | I/O — User I/O pin |
| دبوس 15 | I/O — User I/O pin |
| دبوس 16 | I/O — User I/O pin |
| دبوس 17 | I/O — User I/O pin |
| دبوس 18 | I/O — User I/O pin |
| دبوس 19 | I/O — User I/O pin |
| دبوس 20 | I/O — User I/O pin |
| دبوس 21 | I/O — User I/O pin |
| دبوس 22 | I/O — User I/O pin |
| دبوس 23 | I/O — User I/O pin |
| دبوس 24 | I/O — User I/O pin |
| دبوس 25 | I/O — User I/O pin |
| دبوس 26 | I/O — User I/O pin |
| دبوس 27 | I/O — User I/O pin |
| دبوس 28 | I/O — User I/O pin |
| دبوس 29 | I/O — User I/O pin |
| دبوس 30 | I/O — User I/O pin |
| دبوس 31 | I/O — User I/O pin |
| دبوس 32 | I/O — User I/O pin |
| دبوس 33 | I/O — User I/O pin |
| دبوس 34 | I/O — User I/O pin |
| دبوس 35 | I/O — User I/O pin |
| دبوس 36 | I/O — User I/O pin |
| دبوس 37 | I/O — User I/O pin |
| دبوس 38 | I/O — User I/O pin |
| دبوس 39 | I/O — User I/O pin |
| دبوس 40 | I/O — User I/O pin |
| دبوس 41 | I/O — User I/O pin |
| دبوس 42 | I/O — User I/O pin |
| دبوس 43 | I/O — User I/O pin |
| دبوس 44 | I/O — User I/O pin |
| دبوس 45 | I/O — User I/O pin |
| دبوس 46 | I/O — User I/O pin |
| دبوس 47 | I/O — User I/O pin |
| دبوس 48 | I/O — User I/O pin |
| دبوس 49 | I/O — User I/O pin |
| دبوس 50 | I/O — User I/O pin |
| دبوس 51 | I/O — User I/O pin |
| دبوس 52 | I/O — User I/O pin |
| دبوس 53 | TDI — JTAG Test Data In (IEEE 1149.1) |
| دبوس 54 | TMS — JTAG Test Mode Select |
| دبوس 55 | TCK — JTAG Test Clock |
| دبوس 56 | I/O — User I/O pin |
| دبوس 57 | I/O — User I/O pin |
| دبوس 58 | I/O — User I/O pin |
| دبوس 59 | I/O — User I/O pin |
| دبوس 60 | I/O — User I/O pin |
| دبوس 61 | I/O — User I/O pin |
| دبوس 62 | I/O — User I/O pin |
| دبوس 63 | I/O — User I/O pin |
| دبوس 64 | I/O — User I/O pin |
| دبوس 65 | I/O — User I/O pin |
| دبوس 66 | I/O — User I/O pin |
| دبوس 67 | I/O — User I/O pin |
| دبوس 68 | I/O — User I/O pin |
| دبوس 69 | I/O — User I/O pin |
| دبوس 70 | I/O — User I/O pin |
| دبوس 71 | I/O — User I/O pin |
| دبوس 72 | I/O — User I/O pin |
| دبوس 73 | I/O — User I/O pin |
| دبوس 74 | I/O — User I/O pin |
| دبوس 75 | I/O — User I/O pin |
| دبوس 76 | I/O — User I/O pin |
| دبوس 77 | I/O — User I/O pin |
| دبوس 78 | I/O — User I/O pin |
| دبوس 79 | I/O — User I/O pin |
| دبوس 80 | I/O — User I/O pin |
| دبوس 81 | I/O — User I/O pin |
| دبوس 82 | I/O — User I/O pin |
| دبوس 83 | I/O — User I/O pin |
| دبوس 84 | I/O — User I/O pin |
| دبوس 85 | I/O — User I/O pin |
| دبوس 86 | I/O — User I/O pin |
| دبوس 87 | I/O — User I/O pin |
| دبوس 88 | I/O — User I/O pin |
| دبوس 89 | I/O — User I/O pin |
| دبوس 90 | I/O — User I/O pin |
| دبوس 91 | I/O — User I/O pin |
| دبوس 92 | I/O — User I/O pin |
| دبوس 93 | I/O — User I/O pin |
| دبوس 94 | I/O — User I/O pin |
| دبوس 95 | I/O — User I/O pin |
| دبوس 96 | I/O — User I/O pin |
| دبوس 97 | I/O — User I/O pin |
| دبوس 98 | I/O — User I/O pin |
| دبوس 99 | I/O — User I/O pin |
| دبوس 100 | I/O — User I/O pin |
| دبوس 101 | I/O — User I/O pin |
| دبوس 102 | I/O — User I/O pin |
| دبوس 103 | I/O — User I/O pin |
| دبوس 104 | I/O — User I/O pin |
| دبوس 105 | TDO — JTAG Test Data Out |
| دبوس 106 | I/O — User I/O pin |
| دبوس 107 | I/O — User I/O pin |
| دبوس 108 | I/O — User I/O pin |
| دبوس 109 | I/O — User I/O pin |
| دبوس 110 | I/O — User I/O pin |
| دبوس 111 | I/O — User I/O pin |
| دبوس 112 | I/O — User I/O pin |
| دبوس 113 | I/O — User I/O pin |
| دبوس 114 | I/O — User I/O pin |
| دبوس 115 | I/O — User I/O pin |
| دبوس 116 | I/O — User I/O pin |
| دبوس 117 | I/O — User I/O pin |
| دبوس 118 | I/O — User I/O pin |
| دبوس 119 | I/O — User I/O pin |
| دبوس 120 | I/O — User I/O pin |
| دبوس 121 | I/O — User I/O pin |
| دبوس 122 | I/O — User I/O pin |
| دبوس 123 | I/O — User I/O pin |
| دبوس 124 | I/O — User I/O pin |
| دبوس 125 | I/O — User I/O pin |
| دبوس 126 | I/O — User I/O pin |
| دبوس 127 | I/O — User I/O pin |
| دبوس 128 | I/O — User I/O pin |
| دبوس 129 | I/O — User I/O pin |
| دبوس 130 | I/O — User I/O pin |
| دبوس 131 | I/O — User I/O pin |
| دبوس 132 | I/O — User I/O pin |
| دبوس 133 | I/O — User I/O pin |
| دبوس 134 | I/O — User I/O pin |
| دبوس 135 | I/O — User I/O pin |
| دبوس 136 | I/O — User I/O pin |
| دبوس 137 | I/O — User I/O pin |
| دبوس 138 | I/O — User I/O pin |
| دبوس 139 | I/O — User I/O pin |
| دبوس 140 | I/O — User I/O pin |
| دبوس 141 | I/O — User I/O pin |
| دبوس 142 | I/O — User I/O pin |
| دبوس 143 | I/O — User I/O pin |
| دبوس 144 | I/O — User I/O pin |
| دبوس 145 | I/O — User I/O pin |
| دبوس 146 | I/O — User I/O pin |
| دبوس 147 | I/O — User I/O pin |
| دبوس 148 | I/O — User I/O pin |
| دبوس 149 | I/O — User I/O pin |
| دبوس 150 | I/O — User I/O pin |
| دبوس 151 | I/O — User I/O pin |
| دبوس 152 | I/O — User I/O pin |
| دبوس 153 | I/O — User I/O pin |
| دبوس 154 | I/O — User I/O pin |
| دبوس 155 | I/O — User I/O pin |
| دبوس 156 | I/O — User I/O pin |
| دبوس 157 | GND — Ground |
| دبوس 158 | I/O — User I/O pin |
| دبوس 159 | I/O — User I/O pin |
| دبوس 160 | I/O — User I/O pin |
| دبوس 161 | I/O — User I/O pin |
| دبوس 162 | I/O — User I/O pin |
| دبوس 163 | I/O — User I/O pin |
| دبوس 164 | I/O — User I/O pin |
| دبوس 165 | I/O — User I/O pin |
| دبوس 166 | I/O — User I/O pin |
| دبوس 167 | I/O — User I/O pin |
| دبوس 168 | I/O — User I/O pin |
| دبوس 169 | I/O — User I/O pin |
| دبوس 170 | I/O — User I/O pin |
| دبوس 171 | I/O — User I/O pin |
| دبوس 172 | I/O — User I/O pin |
| دبوس 173 | I/O — User I/O pin |
| دبوس 174 | I/O — User I/O pin |
| دبوس 175 | I/O — User I/O pin |
| دبوس 176 | I/O — User I/O pin |
| دبوس 177 | I/O — User I/O pin |
| دبوس 178 | I/O — User I/O pin |
| دبوس 179 | I/O — User I/O pin |
| دبوس 180 | I/O — User I/O pin |
| دبوس 181 | I/O — User I/O pin |
| دبوس 182 | I/O — User I/O pin |
| دبوس 183 | I/O — User I/O pin |
| دبوس 184 | I/O — User I/O pin |
| دبوس 185 | I/O — User I/O pin |
| دبوس 186 | I/O — User I/O pin |
| دبوس 187 | I/O — User I/O pin |
| دبوس 188 | I/O — User I/O pin |
| دبوس 189 | I/O — User I/O pin |
| دبوس 190 | I/O — User I/O pin |
| دبوس 191 | I/O — User I/O pin |
| دبوس 192 | I/O — User I/O pin |
| دبوس 193 | I/O — User I/O pin |
| دبوس 194 | I/O — User I/O pin |
| دبوس 195 | I/O — User I/O pin |
| دبوس 196 | I/O — User I/O pin |
| دبوس 197 | I/O — User I/O pin |
| دبوس 198 | I/O — User I/O pin |
| دبوس 199 | I/O — User I/O pin |
| دبوس 200 | I/O — User I/O pin |
| دبوس 201 | I/O — User I/O pin |
| دبوس 202 | I/O — User I/O pin |
| دبوس 203 | I/O — User I/O pin |
| دبوس 204 | I/O — User I/O pin |
| دبوس 205 | I/O — User I/O pin |
| دبوس 206 | I/O — User I/O pin |
| دبوس 207 | I/O — User I/O pin |
| دبوس 208 | VCC — Core supply (2.5 V nominal) |
التطبيقات النموذجية
EPM7512BQC208-10 مناسب لـ 6 التطبيقs: Address Decoding and Bus Bridging, State Machine and Control Logic, Industrial Control and I/O Expansion, Legacy Peripheral Glue Logic, Telecommunications Backplane Bridging, Test and Measurement Equipment Front-End.
Address Decoding and Bus Bridging
The EPM7512BQC208-10 is widely used in microprocessor-based systems for address decoding, chip-select generation, and bus-bridging between asynchronous bus domains. The 10 ns pin-to-pin delay is well within the address-to-CS timing budget of most 33-50 MHz microcontrollers and embedded MPUs. With 176 user I/Os and 512 macrocells, a single EPM7512B can replace dozens of 74LS138/139/32 decoders and '245 transceivers, simplifying PCB layout and reducing BOM cost. The in-system programmability allows last-minute address map changes without board rework.
موصى به
State Machine and Control Logic
The 512 macrocells and 32 LABs of the EPM7512BQC208-10 provide ample capacity for implementing complex multi-state control machines, sequencers, and protocol controllers. Each macrocell contains a flip-flop and configurable AND/OR array, making it efficient for Moore and Mealy state machines with up to 50-60 states. The deterministic 10 ns timing makes timing closure predictable for safety-critical industrial control applications, and the EEPROM-based configuration retains state-machine definition across power cycles without boot time.
موصى به
Industrial Control and I/O Expansion
The commercial 0 to +70 C temperature grade and 176 user I/Os make the EPM7512BQC208-10 suitable for industrial controller backplanes, PLC I/O expansion cards, and motor-control interfaces. The 2.5 V internal core combined with 5 V-tolerant I/O cells allows direct interfacing to legacy 5 V logic and 3.3 V peripherals. JTAG boundary-scan support simplifies board-level test in production, and the PQFP-208 footprint is widely accepted by industrial assembly houses with established surface-mount lines.
موصى به
Legacy Peripheral Glue Logic
Many legacy embedded designs still require the EPM7512BQC208-10 to integrate asynchronous peripherals such as UARTs, parallel ports, SCSI controllers, and IDE interfaces. The fast 10 ns tpd and abundant I/O allow timing-critical handshake signal generation without resorting to discrete 74FCT or 74AVC logic. The in-system programming feature means firmware teams can iterate on glue-logic fixes without respinning the PCB - a major advantage over traditional TTL PAL/GAL designs.
موصى به
Telecommunications Backplane Bridging
In telecom backplanes, the EPM7512BQC208-10 serves as a low-latency protocol bridge between legacy TDM buses and modern packet interfaces. The deterministic 10 ns timing ensures that timing-critical TDM frame pulses and clock-domain crossings meet jitter requirements. With 176 user I/Os, a single part can interface to multiple line-card slots, eliminating a fanout tree of buffers. The 208-pin PQFP package is well-suited to through-hole backplane daughter-card assemblies.
موصى به
Test and Measurement Equipment Front-End
The EPM7512BQC208-10's deterministic timing and abundant I/O make it a useful front-end controller for legacy test and measurement equipment such as benchtop oscilloscopes, logic analyzers, and ATE fixtures. It can implement custom timing generators, scan-chain controllers, and front-panel I/O expanders while maintaining repeatable 10 ns timing margins. JTAG boundary scan allows production-board self-test, reducing fixture complexity in mixed-signal ATE systems.
موصى به
ملخص المنتجات الموصى بها
بيانات مرجعية هندسية لـ EPM7512BQC208-10 — المقارنة وإرشادات التصميم ومعلومات الامتثال.
دليل الاختيار
المقارنة مع البدائل
| المعامل | هذا المنتج | EPM7512BQC208-7 | EPM7512BQC208-6 | EPM7512BQC208-5 | EPM7512BQC208-12 | EPM7512BQC208-15 |
|---|---|---|---|---|---|---|
| Package | PQFP-208 (28x28 mm) | PQFP-208 (same) | PQFP-208 (same) | PQFP-208 (same) | PQFP-208 (same) | PQFP-208 (same) |
| Brand | Altera | Altera | Altera | Altera | Altera | Altera |
| Macrocells | 512 | 512 | 512 | 512 | 512 | 512 |
| User I/Os | 176 | 176 | 176 | 176 | 176 | 176 |
| Propagation Delay (tpd) | 10 ns | 7 ns | 6 ns | 5 ns | 12 ns | 15 ns |
| Internal Supply Voltage | 2.5 V (2.375-2.625 V) | 2.5 V (same) | 2.5 V (same) | 2.5 V (same) | 2.5 V (same) | 2.5 V (same) |
| Operating Temperature | 0 to +70 C (commercial) | 0 to +70 C (same) | 0 to +70 C (same) | 0 to +70 C (same) | 0 to +70 C (same) | 0 to +70 C (same) |
| Usable Gates | 10,000 | 10,000 | 10,000 | 10,000 | 10,000 | 10,000 |
| Lifecycle Status | NRND | NRND | NRND | NRND | NRND | NRND |
أبرز الفروقات
- 10 ns speed grade offers best cost/timing balance for general-purpose glue logic (مقابلEPM7512BQC208-7)
- 208-pin PQFP footprint is the highest-pin-count package in the MAX 7000B family (مقابلEPM7512BFC256-7 (BGA-256))
- 512 macrocells in MAX 7000B series is the highest density (مقابلEPM7256SQC208-10 (256 macrocells))
ملاحظات التصميم
The 208-pin PQFP package (0.5 mm pitch, 28x28 mm body) demands a 4-layer PCB minimum with continuous VCC and GND planes under the device to provide low-impedance power delivery to all 176 user I/Os. Route high-speed signals (e.g., clock, JTAG) on inner layers with reference to ground, and keep I/O traces short to minimize crosstalk. Estimated: with 4-layer stack-up and 1 oz copper, expect approximately 0.5-1.0 C/W thermal resistance improvement over a 2-layer board.
Although the EPM7512BQC208-10 has a 10 ns tpd, simultaneous-switching outputs (SSO) can cause ground bounce on heavily-loaded output banks. Distribute switching outputs across multiple I/O banks, and add 22-33 ohm series-termination resistors on outputs driving more than 2 inches of trace or more than 2-3 loads. JTAG signals (TCK, TMS, TDI, TDO) should be kept short and guarded to ground for reliable boundary-scan operation at 10-20 MHz TCK frequencies.
Critical: do not confuse the EPM7512BQC208-10 (MAX 7000B, 2.5 V core) with the older EPM7512AQC208-10 (MAX 7000A, 3.3 V core) - the VCCINT supply differs (2.5 V vs 3.3 V) and the parts are NOT drop-in compatible at the supply level. Also note that the part is NRND with the original Altera supply chain now served by Rochester Electronics; for new designs, consider the Intel MAX II (EPM240/EPM570/EPM1270) or MAX V (5M40ZE64/5M80ZE64) families. Verify the JTAG IDCODE in your programming chain to detect mis-programming attempts.
The PQFP-208 package has a junction-to-ambient thermal resistance (theta_JA) of approximately 30-35 C/W on a standard 4-layer JEDEC test board. The CMOS MAX 7000B core draws only a few hundred milliamps, so self-heating is modest (typically <0.5 W). Estimated: at 70 C ambient, junction temperature stays below 90 C under normal conditions, well within the commercial 0-70 C operating range. For enclosed industrial enclosures, verify airflow keeps ambient below 60 C.
معلومات الامتثال
Compliance data not available from the verified sources. Original Altera datasheets from 1998-2002 typically predate RoHS mandate; parts produced after 2006 may have lead-free/RoHS variants. Check the specific shipment lot or request compliance documentation from Rochester Electronics for the franchised inventory.
