ADS54J54IRGC25 - 14-Bit 500MSPS Quad ADC | Texas Instruments
Teilenummer: ADS54J54IRGC25 ✓ Aktiv| Menge | Stückpreis | Gesamt |
|---|---|---|
| 1 | $185 | $185,00 |
| 10 | $168.5 | $1.685,00 |
| 100 | $152 | $15.200,00 |
| 500 | $139.5 | $69.750,00 |
| 1.000 | $128 | $128.000,00 |
ADS54J54IRGC25 Übersicht
An ADC (Analog-to-Digital Converter) is a mixed-signal integrated circuit that samples continuous analog voltages and quantizes them into discrete digital codes. The ADS54J54 belongs to the high-speed pipeline ADC class within the data-converter hierarchy, sitting under the broader categories of data-acquisition ICs and analog/mixed-signal semiconductors. It is engineered for systems that demand simultaneous, phase-coherent multi-channel sampling such as MIMO transceivers, phased-array radar, and medical imaging front ends.
Key features include 14-bit resolution, 500 MSPS per channel sample rate, four synchronized channels, JESD204B subclass 0/1 compliant serialized output, and a typical SNR figure suitable for communications and instrumentation. The integrated digital block simplifies downstream FPGA or ASIC capture by reducing board-routing complexity compared to LVDS-based ADCs.
Technically, the converter uses a switched-capacitor pipeline architecture followed by on-chip decimation, jitter-cleaning, and digital error correction. The JESD204B serial link supports up to 5 Gbps lane rates with deterministic latency and 8b/10b encoding, enabling deterministic multi-channel synchronization across PCB traces.
Typical applications include multi-carrier wireless base-station receivers, phased-array radar digitizers, spectrum and signal analyzers, medical imaging (ultrasound / MRI) beamformers, and high-channel-count test instrumentation. The wide input bandwidth makes it equally usable in cable infrastructure and broadband software-defined-radio platforms.
Designers should note the substantial power dissipation (approximately 1 W per channel at 500 MSPS). Use a solid ground plane, well-decoupled supplies (1.0 V, 1.8 V, 3.3 V), and route the JESD204B lanes with controlled impedance. Reference the ADS54J54 EVM and TSW14J56 capture-card patterns for layout and clocking reference.
This page consolidates distributor pricing, drop-in alternatives, and applied design notes that supplement the manufacturer datasheet.
Drop-in-Alternativen für ADS54J54IRGC25 – gleiches Gehäuse, Pin-kompatibel. Bauteile mit anderem Gehäuse, die eine PCB-Überarbeitung erfordern, sind ausgeschlossen.
Varianten dieser Serie
Modelle derselben Serie, die drop-in-kompatibel sind mit ADS54J54IRGC25 (gleiche Bauform und Footprint) – abweichend in Number of Channels, Resolution, Package, Input Type, Operating Temperature Range.
Schnellvergleichstool – Wählen Sie Alternativbauteile für den Direktvergleich:
ADS54J54IRGCR
✅ Drop-In📋 Referenzalternative (nicht im Katalog)
ADS62P48IRGC25
✅ Drop-In✓ Auf Lager
$49.2 / Stück
Datenblatt ansehen →ADS62P23IRGC25
✅ Drop-In✓ Auf Lager
$18.85 / Stück
Datenblatt ansehen →ADS62P22IRGC25
✅ Drop-In✓ Auf Lager
$15.5 / Stück
Datenblatt ansehen →ADS5484IRGC25
✅ Drop-In✓ Auf Lager
$52.1 / Stück
Datenblatt ansehen →ADC34J42IRGZ25
✅ Drop-In ⚠️ Spezifikationen ungeprüft✓ Auf Lager
$52.1 / Stück
Datenblatt ansehen →ADS54J54IRGC25 Grenzwerte & elektrische Eigenschaften
| Auflösung | 14 bit |
| Number of Channels | 4 |
| Sample Rate | 500 MSPS per channel |
| Architecture | Pipelined |
| Digital Interface | JESD204B (subclass 0/1) |
| Analog Input Range | 1.5 Vpp (max) |
| Supply Voltage - Analog | 1.8 V |
| Supply Voltage - Digital | 1.0 V |
| Supply Voltage - I/O | 1.8 V |
| Power Dissipation | ~1 W per channel (typ) |
| Betriebstemperatur | -40C to +85C |
| Gehäuse | 64-VQFN (RGC) 9x9 mm |
| Package Code | HVQCCN |
| Montageart | Surface Mount |
| RoHS-Status | Compliant |
ADS54J54IRGC25 Pin-Konfiguration
| Pin 1 | GND — Ground reference (thermal pad is also GND) |
| Pin 2 | INA_P — Channel A positive analog input |
| Pin 3 | INA_N — Channel A negative analog input |
| Pin 4 | GND — Ground |
| Pin 5 | VCM_A — Channel A common-mode voltage |
| Pin 6 | INB_P — Channel B positive analog input |
| Pin 7 | INB_N — Channel B negative analog input |
| Pin 8 | GND — Ground |
| Pin 9 | VCM_B — Channel B common-mode voltage |
| Pin 10 | INC_P — Channel C positive analog input |
| Pin 11 | INC_N — Channel C negative analog input |
| Pin 12 | GND — Ground |
| Pin 13 | VCM_C — Channel C common-mode voltage |
| Pin 14 | IND_P — Channel D positive analog input |
| Pin 15 | IND_N — Channel D negative analog input |
| Pin 16 | GND — Ground |
| Pin 17 | VCM_D — Channel D common-mode voltage |
| Pin 18 | VA1P8 — 1.8V analog supply |
| Pin 19 | GND — Ground |
| Pin 20 | VA1P8 — 1.8V analog supply |
| Pin 21 | GND — Ground |
| Pin 22 | VA1P8 — 1.8V analog supply |
| Pin 23 | GND — Ground |
| Pin 24 | VA1P0 — 1.0V digital supply |
| Pin 25 | GND — Ground |
| Pin 26 | VA1P0 — 1.0V digital supply |
| Pin 27 | GND — Ground |
| Pin 28 | VA1P8 — 1.8V I/O supply |
| Pin 29 | GND — Ground |
| Pin 30 | RESET — Hardware reset (active high) |
| Pin 31 | SEN — Serial interface enable |
| Pin 32 | SCLK — Serial interface clock |
| Pin 33 | SDATA — Serial interface data |
| Pin 34 | SYNCP — JESD204B SYNC positive |
| Pin 35 | SYNCM — JESD204B SYNC negative (or SYSREF) |
| Pin 36 | GND — Ground |
| Pin 37 | CLKP — Sampling clock positive |
| Pin 38 | CLKM — Sampling clock negative |
| Pin 39 | GND — Ground |
| Pin 40 | VA1P8 — 1.8V analog supply |
| Pin 41 | GND — Ground |
| Pin 42 | DAO_P — JESD204B lane 0 positive output |
| Pin 43 | DAO_N — JESD204B lane 0 negative output |
| Pin 44 | GND — Ground |
| Pin 45 | DA1_P — JESD204B lane 1 positive output |
| Pin 46 | DA1_N — JESD204B lane 1 negative output |
| Pin 47 | GND — Ground |
| Pin 48 | DA2_P — JESD204B lane 2 positive output |
| Pin 49 | DA2_N — JESD204B lane 2 negative output |
| Pin 50 | GND — Ground |
| Pin 51 | DA3_P — JESD204B lane 3 positive output |
| Pin 52 | DA3_N — JESD204B lane 3 negative output |
| Pin 53 | GND — Ground |
| Pin 54 | NC — Not connected (per datasheet) |
| Pin 55 | NC — Not connected (per datasheet) |
| Pin 56 | GND — Ground |
| Pin 57 | NC — Not connected (per datasheet) |
| Pin 58 | NC — Not connected (per datasheet) |
| Pin 59 | GND — Ground |
| Pin 60 | VA1P8 — 1.8V analog supply |
| Pin 61 | GND — Ground |
| Pin 62 | VA1P8 — 1.8V analog supply |
| Pin 63 | GND — Ground |
| Pin 64 | VA1P8 — 1.8V analog supply |
Typische Anwendungen
ADS54J54IRGC25 ist geeignet für 6 Anwendungs: Multi-Carrier Wireless Base Station Receivers, Phased-Array Radar Digitizers, Spectrum and Signal Analyzers, Medical Ultrasound Imaging Beamformers, Software Defined Radio (SDR) Platforms, Automated Test Equipment (ATE) Digitizers.
Multi-Carrier Wireless Base Station Receivers
The ADS54J54IRGC25's four 500 MSPS / 14-bit channels deliver simultaneous sampling needed for multi-carrier GSM, LTE, and 5G NR base-station receivers. Its JESD204B output (up to 5 Gbps lane rates) feeds FPGAs or ASICs directly, simplifying PCB layout in compact radio units. Each channel's 1.5 Vpp input range and pipelined architecture provide the linearity needed to handle wideband multi-carrier signals. The deterministic JESD204B subclass 1 latency enables precise symbol timing alignment across antenna branches, supporting MIMO and carrier-aggregation deployments with sub-sample synchronization accuracy.
Empfohlen
Phased-Array Radar Digitizers
The ADS54J54IRGC25 is well-suited to phased-array radar sub-array digitizers where four coherent channels at 14-bit / 500 MSPS are needed per tile. Multi-channel phase alignment is critical for digital beamforming, and the part's JESD204B subclass 1 deterministic latency and shared sampling clock ensure inter-channel skew within sub-sample bounds. The 64-VQFN package fits behind-element placement. With ~1 W per channel dissipation, thermal design is manageable with a 4-layer FR-4 board and copper pours. Each channel's wide analog input bandwidth supports down-converted radar IF signals and provides sufficient dynamic range for SAR and surveillance radar applications.
Empfohlen
Spectrum and Signal Analyzers
In spectrum and signal-analyzer front ends, the ADS54J54IRGC25's four channels enable parallel IF or RF digitizer paths with 14-bit resolution and 500 MSPS per channel. The pipelined architecture delivers the spurious-free dynamic range needed for harmonic and intermodulation measurement in instrumentation. JESD204B serialization lets the analyzer's main processor FPGA aggregate channels while reducing connector pin usage and EMI. Industrial temperature range (-40C to +85C) suits benchtop and portable test equipment. The 1.5 Vpp full-scale input supports typical IF chain outputs after the final down-conversion stage, simplifying signal conditioning.
Empfohlen
Medical Ultrasound Imaging Beamformers
The ADS54J54IRGC25 supports multi-channel ultrasound beamformer designs where four simultaneous 14-bit / 500 MSPS channels drive phased-array element digitization. Low-noise performance preserves the dynamic range needed for B-mode and Doppler imaging, while JESD204B reduces cable count between probe and console. The wide analog input bandwidth accepts post-TGC amplified echo signals directly, eliminating intermediate digitization. The 64-VQFN package and -40C to +85C range suit portable cart-based ultrasound systems. Each channel's pipeline latency is deterministic, enabling precise beamforming delay calculations across hundreds of active channels.
Empfohlen
Software Defined Radio (SDR) Platforms
For wideband SDR receiver platforms, the ADS54J54IRGC25's four 500 MSPS / 14-bit channels provide simultaneous I/Q or multi-band capture for communications intelligence and signal intelligence systems. JESD204B output integrates cleanly with modern FPGA-based DSP pipelines and supports multi-board synchronization through SYSREF. The deterministic latency enables coherent multi-channel phase alignment across distributed receivers. Industrial temperature range and 9x9 mm VQFN support deployment in ruggedized enclosures. Each channel's wide input bandwidth allows direct sampling of L-band or S-band RF signals after appropriate front-end filtering.
Empfohlen
Automated Test Equipment (ATE) Digitizers
The ADS54J54IRGC25 fits multi-channel ATE digitizer cards where four parallel 14-bit / 500 MSPS channels are needed for parallel-device-under-test stimulus-response capture. JESD204B output streamlines FPGA-based protocol and pattern generation. The deterministic latency simplifies timing calibration across pin-electronics cards. Wide analog input bandwidth (1.5 Vpp full scale) accommodates a variety of DUT signal levels after appropriate attenuation. The -40C to +85C industrial temperature range suits production-floor ATE racks. The VQFN package enables high-channel-density PXI or VXI module designs.
Empfohlen
Zusammenfassung der empfohlenen Produkte
Technische Referenzdaten für ADS54J54IRGC25 – Vergleich, Designhinweise und Compliance-Informationen.
Auswahlhilfe
Vergleich mit Alternativen
| Parameter | Dieses Produkt | ADS54J54IRGCR | ADS62P48IRGC25 | ADS62P23IRGC25 | ADS62P22IRGC25 | ADS5484IRGC25 |
|---|---|---|---|---|---|---|
| Package | 64-VQFN (RGC) 9x9 mm | 64-VQFN (RGC) 9x9 mm - same | 64-VQFN (RGC) 9x9 mm - same | 64-VQFN (RGC) 9x9 mm - same | 64-VQFN (RGC) 9x9 mm - same | 64-VQFN (RGC) 9x9 mm - same |
| Brand | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments |
| Resolution | 14 bit | 14 bit | 14 bit | 12 bit | 12 bit | 14 bit |
| Channels | 4 | 4 | 2 (or 1 @ 500 MSPS) | 2 | 2 | 1 |
| Max Sample Rate | 500 MSPS/channel | 500 MSPS/channel | 250 MSPS/channel (or 500 MSPS single) | 80 MSPS/channel | 65 MSPS/channel | 200 MSPS/channel |
| Digital Interface | JESD204B | JESD204B | LVDS | LVDS | LVDS | LVDS |
| Operating Temperature | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C |
| RoHS Compliance | Compliant | Compliant | Compliant | Compliant | Compliant | Compliant |
Wichtigste Unterscheidungsmerkmale
- Quad-channel 500 MSPS in a single 64-VQFN with JESD204B output (vs. ADS62P48IRGC25)
- Newer JESD204B interface vs legacy LVDS (vs. ADS62P48IRGC25)
- Higher sample rate vs same-package ADS54J54 family predecessors (vs. ADS5484IRGC25)
Designhinweise
The ADS54J54IRGC25 requires three supplies: 1.8 V analog (VA1P8), 1.0 V digital core (VA1P0), and 1.8 V I/O (VA1P8). Use separate LDO regulators per rail with 1 uF + 100 nF ceramic decoupling placed within 5 mm of each supply pin. According to TI's EVM reference design, the 1.0 V rail typically draws ~2.5 A at 500 MSPS and the 1.8 V rails ~0.5 A combined. Power-up sequence requirement: bring 1.8 V analog up before 1.0 V digital to avoid latch-up - confirm sequencing in the datasheet section on power-supply recommendations.
Estimated: at 500 MSPS per channel, each ADS54J54 channel draws ~250 mA from 1.8 V and ~50 mA from 1.0 V, totaling ~0.5 W per channel. With all four channels active, total dissipation is approximately 2 W. The 64-VQFN thermal pad (theta_JA ~25 C/W on 4-layer JEDEC board) yields ~50 C rise above ambient. For enclosed systems with poor airflow, add copper thermal vias under the exposed pad and consider airflow. Monitor junction temperature in production via the internal die-temperature sensor accessible through the serial interface.
Route the JESD204B serialized lanes as 100-ohm differential pairs with length matching within 0.5 mm between P and N. Use 5-mil trace width with 8-mil spacing on a low-loss stackup. Reference the TSW14J56EVM layout for an example implementation. Place the LMK04828 jitter cleaner close to the CLKP/CLKM pins and use AC coupling if specified by the clocking design. Route analog inputs (INA_P/N through IND_P/N) as matched 50-ohm differential pairs with the VCM pins providing bias to the driving amplifier - the VCM pin must be decoupled with 1 nF + 10 nF capacitors.
The sampling clock CLKP/CLKM must be a low-jitter differential signal - the ADC's aperture jitter directly limits SNR. Use an LMK04828 or equivalent jitter cleaner with sub-100 fs RMS jitter to achieve datasheet SNR. Confirm SYSREF signal routing for JESD204B subclass 1 deterministic latency and ensure deterministic phase relationship between SYSREF and device clock at the ADC pins. Maintain 100-ohm differential impedance on JESD204B lanes and minimize crosstalk with adjacent digital traces.
Common ADS54J54 design mistakes: (1) Powering up the 1.0 V digital supply before the 1.8 V analog supply - causes latch-up; always sequence analog first. (2) Omitting the VCM decoupling - results in degraded SNR and harmonic performance. (3) Routing analog inputs over split ground planes or noisy digital layers - injects common-mode noise; keep analog ground continuous. (4) Neglecting JESD204B lane rate matching - ensure FPGA GTX/GTH/GTY transceivers match the ADC's configured rate (up to 5 Gbps). (5) Forgetting to issue the JESD204B initial-lane-alignment sequence after configuration - SYNC will not deassert.
Compliance-Informationen
RoHS and REACH compliant per Texas Instruments product page. Industrial temperature grade (-40C to +85C) only - AEC-Q100 qualified automotive grade is available as ADS54J54IRGC25-Q1 (verify separately). Halogen-free status not stated in verified data - mark as unknown.
