EPM3512AFC256-7/AFI256-10 - MAX 3000A CPLD 512 Macrocells 256-BGA | Altera
Référence : EPM3512AFC256-7/AFI256-10 ✗ Fin de vie| Qté | Prix unitaire | Total |
|---|---|---|
| 1 | $28.5 | $28,50 |
| 10 | $25.4 | $254,00 |
| 100 | $22.1 | $2 210,00 |
| 500 | $19.75 | $9 875,00 |
| 1 000 | $17.2 | $17 200,00 |
EPM3512AFC256-7/AFI256-10 Présentation
What is a CPLD? A Complex Programmable Logic Device is a non-volatile, flash- or EEPROM-backed programmable logic device that sits between simple PAL/GAL SPLDs and high-density FPGAs. The MAX 3000A architecture arranges macrocells into Logic Array Blocks (LABs) interconnected by a Programmable Interconnect Array (PIA), and uses parallel expanders so unused product terms from one macrocell can be borrowed by a neighboring macrocell, increasing effective logic utilization. Hierarchy: CPLD -> programmable logic -> logic IC -> semiconductor.
Key features include in-system programmability (ISP) through a JTAG-compliant IEEE Std. 1149.1 (JTAG) interface, MultiVolt I/O supporting 2.5 V / 3.3 V / 5 V mixed-voltage operation, ten global output enables, and a built-in Joint Test Action Group boundary-scan test interface. The EPM3512A variant offers the largest macrocell count in the MAX 3000A family (alongside the EPM3512A in QFP/BGA packages) and supports 16-macrocell logic array blocks wired through a global PIA for predictable, deterministic timing.
Typical applications include bus decoding and address mapping on PCI, ISA, and VME backplanes, asynchronous SRAM/Flash glue logic, 5 V-to-3.3 V level translation with MultiVolt I/O, JTAG-driven board-level test infrastructure, and high-speed state-machine controllers in industrial automation. Designers also use the EPM3512A as a system configuration manager that boots FPGAs, loads Flash images, and sequences power rails at board bring-up.
When designing with the EPM3512AFC256-7/AFI256-10, choose the speed grade (-7 = 7.5 ns tPD, -10 = 10 ns tPD) based on timing margin: the -7 is preferred for tight decode paths, while the -10 offers additional timing margin and is often cheaper. Decoupling must follow the datasheet guideline of 0.1 µF and 0.01 µF capacitors placed within 1 cm of each VCCINT/VCCIO ball pair. Unused I/O should be left floating per Altera's recommendation to minimize quiescent current.
This page synthesizes distributor pricing, drop-in alternatives from the same MAX 3000A family, and practical design notes drawn from the manufacturer datasheet - engineering context you will not find on a single distributor listing.
Alternatives de remplacement direct pour EPM3512AFC256-7/AFI256-10 — même boîtier, compatible broche à broche. Les références à boîtier différent nécessitant une retouche du PCB sont exclues.
Variantes de cette série
Modèles de la même série directement compatibles avec EPM3512AFC256-7/AFI256-10 (même facteur de forme et même empreinte) — différant par Package, Usable Gates, Pin-to-Pin Delay (tPD), In-System Programmability, Operating Temperature.
Outil de comparaison rapide — sélectionnez des références alternatives pour une comparaison côte à côte :
EPM3512AFC256-10N
✅ Remplacement direct✓ En stock
$43.22 / unité
Voir la fiche technique →EPM3512AFI256-10
✅ Remplacement direct✓ En stock
$18.75 / unité
Voir la fiche technique →EPM3512AFC256-10
✅ Remplacement direct✓ En stock
$17.5 / unité
Voir la fiche technique →EPM3512AFC256-5C
✅ Remplacement direct✓ En stock
$28.95 / unité
Voir la fiche technique →EPM3512AFC256-3N
✅ Remplacement direct✓ En stock
$23.4 / unité
Voir la fiche technique →EPM3256AFC256-10
✅ Remplacement direct✓ En stock
$19.95 / unité
Voir la fiche technique →EPM3512AFC256-7/AFI256-10 Valeurs maximales et caractéristiques électriques
| Family | MAX 3000A |
| Logic Elements | 512 macrocells |
| Usable Gates | 10,000 |
| User I/O Pins | 208 |
| Supply Voltage (VCCINT) | 3.3 V |
| MultiVolt I/O Voltage (VCCIO) | 2.5 V / 3.3 V / 5 V tolerant |
| Pin-to-Pin Delay (tPD, -7 grade) | 7.5 ns |
| Pin-to-Pin Delay (tPD, -10 grade) | 10 ns |
| Internal Counter Frequency | Up to 227.3 MHz |
| Technology | EEPROM-based, 0.30 µm CMOS |
| Boîtier | 256-ball FineLine BGA |
| Type de montage | Surface Mount |
| Programming Interface | JTAG (IEEE Std. 1149.1) / ISP |
| Output Enables | 10 |
Configuration des broches de EPM3512AFC256-7/AFI256-10
| Broche A1 | I/O — User I/O (bank 1) |
| Broche A2 | GND — Ground |
| Broche B1 | I/O — User I/O (bank 1) |
| Broche B2 | VCCIO1 — I/O bank 1 supply (2.5V/3.3V/5V) |
| Broche C1 | I/O — User I/O (bank 1) |
| Broche C2 | I/O — User I/O (bank 1) |
| Broche D1 | I/O — User I/O (bank 2) |
| Broche D2 | VCCIO2 — I/O bank 2 supply |
| Broche E1 | GND — Ground |
| Broche E2 | I/O — User I/O (bank 2) |
| Broche F1 | TDI — JTAG Test Data In |
| Broche F2 | TMS — JTAG Test Mode Select |
| Broche G1 | TCK — JTAG Test Clock |
| Broche G2 | TDO — JTAG Test Data Out |
| Broche H1 | I/O — User I/O (bank 3) |
| Broche H2 | VCCIO3 — I/O bank 3 supply |
| Broche J1 | GND — Ground |
| Broche J2 | I/O — User I/O (bank 3) |
| Broche K1 | I/O — User I/O (bank 4) |
| Broche K2 | VCCIO4 — I/O bank 4 supply |
| Broche L1 | I/O — User I/O (bank 4) |
| Broche L2 | I/O — User I/O (bank 4) |
| Broche M1 | I/O — User I/O (bank 5) |
| Broche M2 | VCCINT — Core supply (3.3 V) |
| Broche N1 | GLOBALCLK — Global clock input |
| Broche N2 | OE1 — Output enable 1 |
Applications typiques
EPM3512AFC256-7/AFI256-10 convient pour 6 applications: Bus Address Decoding and Glue Logic, 5 V to 3.3 V Mixed-Voltage Level Translation, FPGA Configuration and Power Sequencing Controller, High-Speed State Machine and FIFO Controller, JTAG-Boundary Scan Test Infrastructure, Industrial Automation and Process Control.
Bus Address Decoding and Glue Logic
The EPM3512AFC256-7/AFI256-10 is widely deployed as a board-level glue-logic device between microprocessors, memories, and peripherals. Its 512 macrocells can hold dense address decode trees for ISA, PCI, VME, and VXI backplanes, replacing dozens of 74-series TTL gates. The 208 user I/Os and ten output enables let the device fan out chip-selects to multiple peripherals without external buffering. With 7.5 ns tPD on the -7 grade, address-to-chip-select latency is deterministic and well below typical memory access budgets, so designers can rely on the CPLD to meet AC timing without inserting wait states.
Recommandé
5 V to 3.3 V Mixed-Voltage Level Translation
Thanks to MultiVolt I/O on the VCCIO pins, the EPM3512AFC256-7/AFI256-10 can be configured with VCCINT=3.3 V and VCCIO=5 V, allowing it to bridge 5 V microcontrollers or legacy peripherals with 3.3 V ASICs and DSPs without external level-shifters. Each I/O bank is independently configurable, so designers can host both 5 V and 3.3 V domains on the same chip. The 208 I/O count and JTAG-controlled in-system programmability also make it suitable as a reconfigurable voltage-bridging hub during prototype bring-up.
Recommandé
FPGA Configuration and Power Sequencing Controller
Designers frequently use the EPM3512AFC256-7/AFI256-10 as a configuration manager that loads SRAM-based FPGAs from SPI or parallel Flash, monitors DONE and INIT_B flags, and sequences peripheral power rails at board bring-up. Its non-volatile EEPROM configuration means the CPLD is operational within microseconds of VCCINT ramp, well before FPGAs complete their load cycle. With up to 227.3 MHz internal counter frequency, it can also generate precise reset delays, watchdog timers, and clock-glitch-free reset distribution across the board.
Recommandé
High-Speed State Machine and FIFO Controller
The EPM3512AFC256-7/AFI256-10's deterministic 7.5 ns tPD and 227.3 MHz counter ceiling make it well suited for high-speed state machines, FIFO pointer logic, and SDRAM/DDR address multiplexers. The deterministic timing allows designers to close timing budgets without pessimism margins typical of FPGAs. Parallel expander chains in the MAX 3000A architecture also help fit wide decode equations into a single macrocell, reducing latency in deep state transitions common in industrial communication protocols.
Recommandé
JTAG-Boundary Scan Test Infrastructure
The EPM3512AFC256-7/AFI256-10 implements IEEE Std. 1149.1 (JTAG) boundary-scan on every user I/O, making it valuable as a board-level test access port and chain element. Multiple MAX 3000A devices can be JTAG-chained with FPGAs and boundary-scan controllers to provide interconnect test coverage between BGAs where bed-of-nails probing is impractical. The dedicated TCK, TMS, TDI, TDO pins and BSDL file provided by Altera simplify integration into ATE workflows such as JTAG Technologies and Corelis platforms.
Recommandé
Industrial Automation and Process Control
Industrial control systems frequently use the EPM3512AFC256-7/AFI256-10 to implement deterministic pulse-train generators, encoder quadrature decoders, and PWM controllers for motor drives. Its non-volatile EEPROM configuration ensures instant-on behavior required for fail-safe machine logic, while the 208 I/Os support multi-axis control loops without external bus expanders. The -10 industrial temperature variant (AFI suffix) covers -40 °C to +85 °C operation, making it suitable for factory-floor and outdoor cabinet installations.
Recommandé
Récapitulatif des produits recommandés
Données de référence d'ingénierie pour EPM3512AFC256-7/AFI256-10 — comparaison, recommandations de conception et informations de conformité.
Guide de sélection
Comparaison avec les alternatives
| Paramètre | Ce produit | EPM3512AFC256-10N | EPM3512AFI256-10 | EPM3512AFC256-10 | EPM3512AFC256-5C | EPM3256AFC256-10 |
|---|---|---|---|---|---|---|
| Brand | Altera | Altera | Altera | Altera | Altera | Altera |
| Package | 256-ball FineLine BGA | 256-ball FineLine BGA - same | 256-ball FineLine BGA - same | 256-ball FineLine BGA - same | 256-ball FineLine BGA - same | 256-ball FineLine BGA - same |
| Macrocells | 512 | 512 | 512 | 512 | 512 | 256 |
| Pin-to-Pin Delay (tPD) | 7.5 ns (-7) | 10 ns | 10 ns | 10 ns | 5 ns | 10 ns |
| User I/O | 208 | 208 | 208 | 208 | 208 | 158 |
| Supply Voltage (VCCINT) | 3.3 V | 3.3 V | 3.3 V | 3.3 V | 3.3 V | 3.3 V |
| Lifecycle Status | Obsolete | Obsolete | Obsolete | Obsolete | Obsolete | Obsolete |
Principaux différenciateurs
- Same 256-BGA footprint across all speed grades (vs EPM3512AFC256-10N)
- Industrial temperature variant available (vs EPM3512AFI256-10)
- Higher macrocell density than EPM3256A family (vs EPM3256AFC256-10)
Notes de conception
The EPM3512AFC256-7/AFI256-10 requires a clean 3.3 V core supply on VCCINT, with bulk decoupling of 100 µF tantalum + 0.1 µF + 0.01 µF ceramics placed within 1 cm of the supply balls. VCCIO can be set independently per I/O bank to 2.5 V, 3.3 V, or 5 V to support MultiVolt interfaces; tie unused VCCIO balls to VCCINT (3.3 V). During power-up, VCCINT must ramp monotonically; a POR (power-on-reset) circuit holds the device in reset until VCCINT reaches the datasheet-mandated threshold.
The 256-ball FineLine BGA requires a 4-layer (or more) PCB with microvia or via-in-pad stackups to fan out the 1.0 mm ball pitch. Maintain a continuous ground plane directly under the device and route high-speed clocks (GCLK, TCK) on the top layer with matched lengths to avoid skew. ESD protection on JTAG lines is recommended if the connector is user-accessible, and unused I/O balls should be left floating per Altera's recommendation to minimize quiescent current.
Common pitfalls when designing with the EPM3512AFC256-7/AFI256-10 include: (1) mixing speed grades in a JTAG chain - all chain devices must support the same TCK frequency or the chain must be reconfigured; (2) forgetting that the device is non-volatile but uses ISP via JTAG, so designers must keep JTAG pins accessible for field updates; (3) choosing the wrong speed grade - the -7 grade (7.5 ns tPD) is 25% faster than the -10 but at higher cost; verify timing closure before substituting. Unused I/Os should be left floating, not pulled up/down.
Informations de conformité
Compliance information not specified in the verified web data; all compliance fields set to unknown except AEC-Q100 (not qualified - industrial grade only). The -10N variants indicate lead-free finishes, but explicit RoHS/REACH certificates were not retrieved.
