RTAX250SL-CQ352V vs RTAX1000SL-CQ352V तुलना
विस्तृत दोनों ओर की तुलना RTAX250SL-CQ352V द्वारा Microsemi और RTAX1000SL-CQ352V द्वारा Microchip Technology. मुख्य विशेषताओं, इलेक्ट्रिकल पैरामीटर, पैकेजिंग, चक्र स्थिति, मूल्यांकन और उपलब्धता को तुलना करके अपनी डिजाइन की आवश्यकताओं के लिए सबसे अच्छा घटक निर्धारित करें。
Microchip Technology
RTAX1000SL-CQ352V - 1M-Gate Rad-Tolerant FPGA | Microchip
RTAX1000SL-CQ352V ✓ सक्रियविशेषता तुलना
| पैरामीटर | RTAX250SL-CQ352V | RTAX1000SL-CQ352V |
|---|---|---|
| ब्रांड | Microsemi | Microchip Technology |
| श्रेणी | FPGA & CPLD | FPGA & CPLD |
| लाइफसाइकिल स्थिति | सक्रिय | सक्रिय |
| Family | RTAX-S/SL Radiation-Tolerant FPGAs | RTAX-SL (RTAX-S/SL Radiation-Tolerant FPGAs) |
| Equivalent System Gates | 250000 gates | 1,000,000 |
| Logic Cells | 4224 | 18,144 |
| Configurable Logic Blocks (CLBs) | 2816 | — |
| Process Technology | CMOS | 0.15 um CMOS |
| Core Supply Voltage (Nominal) | 1.5 V | — |
| Core Supply Voltage Range | 1.425 V to 1.575 V | — |
| Number of Inputs | 198 | — |
| आउटपुट की संख्या | 198 | — |
| Total Terminals | 352 | — |
| पैकेज | CQFP-352 (CQ352) ceramic | 352-pin Ceramic CQFP (CQ352V) |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | Embedded SRAM with built-in FIFO control logic |
| Combinatorial Delay (max) | 0.93 ns | — |
| Operation | Live at power-up | — |
| माउंटिंग प्रकार | Surface Mount | Surface Mount |
| Application Domain | Space-flight systems | — |
| User I/O | [DATA_NEEDED: user I/O count] | — |
| ऑपरेटिंग तापमान | [DATA_NEEDED: operating temperature range] | [DATA_NEEDED: operating temperature range] |
| CLBs (Logic Modules) | — | 12,096 |
| Maximum Toggle Frequency | — | 581 MHz |
| Core Voltage | — | 1.5 V |
| Programming Technology | — | Antifuse (one-time programmable) |
| Radiation Tolerance | — | Radiation-tolerant, space-flight qualified family |
| Power-Up Behavior | — | Live at power-up (non-volatile) |
| Configuration Upset Immunity | — | No SEU in configuration memory (antifuse) |
| I/O Voltage | — | [DATA_NEEDED: I/O bank voltage range] |
| Total Ionizing Dose (TID) | — | [DATA_NEEDED: TID rating in krad (Si)] |
| MSL स्तर | — | [DATA_NEEDED: moisture sensitivity level] |
| RoHS स्थिति | — | [DATA_NEEDED: RoHS compliance status] |
| Estimated Equivalent Gates per CLB | — | [DATA_NEEDED: gates-per-CLB ratio] |