ADC1210S105HN/C1:5 - 12-Bit 105 Msps ADC, CMOS/LVDS DDR | NXP
부품 번호: ADC1210S105HN/C1:5 ✓ 활성| 수량 | 단가 | 합계 |
|---|---|---|
| 1 | $13.33 | $13.33 |
| 10 | $13.33 | $133.30 |
| 100 | $13.33 | $1,333.00 |
| 1,000 | $13.33 | $13,330.00 |
| 10,000 | $13.33 | $133,300.00 |
ADC1210S105HN/C1:5 개요
A pipelined analog-to-digital converter (ADC) is a high-speed Nyquist-rate data converter that resolves an analog input into a digital code through multiple cascaded low-resolution stages, each driving a residue amplifier into the next stage. In the broader signal-chain hierarchy, ADCs sit between the analog front-end (amplifiers, filters, drivers) and the digital back-end (FPGA, ASIC, microcontroller), where they convert real-world signals such as IF, video, imaging, or industrial sensor outputs into binary words for processing. Pipelined ADCs dominate the 40-250 Msps performance window because they combine high sampling rate with moderate resolution (10-14 bits) at low power per conversion.
Key features of the ADC1210S105HN/C1:5 include a 105 Msps maximum sample rate, 12-bit resolution, single analog input channel, a choice of parallel CMOS or LVDS DDR digital interfaces, internal bandgap reference with optional external reference override, and a clock duty-cycle stabilizer that tolerates non-50% input clock duty cycles. The 6x6 mm HVQFN-40 footprint preserves board area while the exposed pad keeps junction temperature low at full conversion rate. The device is part of a broader speed-grades family spanning 65, 80, 105, and 125 Msps from the same silicon.
Typical applications include IF/baseband digitization in wireless infrastructure, medical imaging front-ends (ultrasound beamformers), industrial test and measurement digitizers, defense signal-intelligence receivers, and high-speed data acquisition systems for instrumentation. In each case the ADC1210S105HN/C1:5 occupies the boundary between analog signal conditioning and digital signal processing.
When designing the analog input network, drive the AIN pin with a low-impedance differential or single-ended amplifier and provide proper anti-alias filtering before the sampler. Decouple AVDD and DVDD rails close to the package and tie the exposed pad to a clean analog ground plane to manage thermal dissipation at full 105 Msps.
This page synthesizes distributor pricing, drop-in compatible 65/80/125 Msps speed-grade alternatives, and practical PCB layout guidance not found in the bare manufacturer datasheet.
드롭인 대체품: ADC1210S105HN/C1:5 — 동일 패키지, 핀 호환. PCB 재작업이 필요한 다른 패키지 부품은 제외됩니다.
이 시리즈의 변형
다음과 드롭인 호환되는 동일 시리즈 모델: ADC1210S105HN/C1:5 (동일 폼 팩터 및 풋프린트) — 차이점: Package, Number of Channels, Resolution, Operating Temperature, Input Type.
빠른 비교 도구 — 나란히 비교할 대체 부품을 선택하십시오:
ADC1210S125HN/C1:5
✅ 드롭인✓ 재고 있음
$21.1 / 개
데이터시트 보기 →ADC1210S080HN/C1:5
✅ 드롭인📋 참조 대체품 (카탈로그에 없음)
ADC1210S065HN/C1:5
✅ 드롭인 ⚠️ 사양 미검증📋 참조 대체품 (카탈로그에 없음)
ADC1112D125HN-C18
✅ 드롭인 ⚠️ 사양 미검증✓ 재고 있음
$9.48 / 개
데이터시트 보기 →ADC1015S125HN/C1
✅ 드롭인 ⚠️ 사양 미검증✓ 재고 있음
$10.4 / 개
데이터시트 보기 →ADC1012D080HN/C1:5
✅ 드롭인 ⚠️ 사양 미검증✓ 재고 있음
$12.1 / 개
데이터시트 보기 →ADC1210S105HN/C1:5 최대 정격 & 전기적 특성
| 분해능 | 12 bit |
| Number of Channels | 1 |
| Architecture | Pipelined |
| Max Sample Rate | 105 Msps |
| Speed Grade Family | 65 / 80 / 105 / 125 Msps |
| Digital Output Interface | Parallel CMOS or LVDS DDR (selectable) |
| Analog Input Type | Single-ended, 1 channel |
| 패키지 | HVQFN-40 (6x6 mm, 0.85 mm height, exposed pad) |
| Package Code (JEDEC) | SOT618-1 (MO-220 variant) |
| 동작 온도 | -40C to +85C |
| Screening Level | Industrial |
| Internal Reference | Yes (bandgap, with external override option) |
| Clock Duty-Cycle Stabilizer | Yes |
| 실장 유형 | Surface Mount |
ADC1210S105HN/C1:5 핀 구성
| 핀 1 | AIN — Analog input (single-ended, 1 channel) |
| 핀 2 | AVSS — Analog ground |
| 핀 3 | AVDD — Analog supply |
| 핀 4 | VCM — Common-mode voltage bypass |
| 핀 5 | REF_IN — Reference input (external override of internal bandgap) |
| 핀 6 | REFT — Reference top decoupling |
| 핀 7 | REFB — Reference bottom decoupling |
| 핀 8 | CLK+ — Differential clock input (positive) |
| 핀 9 | CLK- — Differential clock input (negative) |
| 핀 10 | OE — Output enable |
| 핀 11 | DFS — Data format select |
| 핀 12 | MODE — CMOS / LVDS DDR mode select |
| 핀 13 | D0 — Data output bit 0 (LSB) |
| 핀 14 | D1 — Data output bit 1 |
| 핀 15 | D2 — Data output bit 2 |
| 핀 16 | D3 — Data output bit 3 |
| 핀 17 | D4 — Data output bit 4 |
| 핀 18 | D5 — Data output bit 5 |
| 핀 19 | D6 — Data output bit 6 |
| 핀 20 | D7 — Data output bit 7 |
| 핀 21 | D8 — Data output bit 8 |
| 핀 22 | D9 — Data output bit 9 |
| 핀 23 | D10 — Data output bit 10 |
| 핀 24 | D11 — Data output bit 11 (MSB) |
| 핀 25 | DCLK — Digital clock output (CMOS mode) / DDR clock (LVDS mode) |
| 핀 26 | NC — Not connected (per datasheet) |
| 핀 27 | NC — Not connected (per datasheet) |
| 핀 28 | DRVDD — Digital output driver supply |
| 핀 29 | DRVSS — Digital output driver ground |
| 핀 30 | NC — Not connected (per datasheet) |
| 핀 31 | NC — Not connected (per datasheet) |
| 핀 32 | DVDD — Digital core supply |
| 핀 33 | DVSS — Digital core ground |
| 핀 34 | PD — Power-down control |
| 핀 35 | RESET — Digital reset |
| 핀 36 | CS — Chip select / serial interface select |
| 핀 37 | SCLK — Serial interface clock |
| 핀 38 | SDIO — Serial interface data input/output |
| 핀 39 | SDO — Serial interface data output |
| 핀 40 | EPAD — Exposed thermal pad - tie to analog ground |
일반적인 애플리케이션
ADC1210S105HN/C1:5 적합 용도: 7 애플리케이션s: Wireless IF / Baseband Digitization, Medical Ultrasound Beamforming, Industrial Test & Measurement Digitizers, Defense Signal-Intelligence Receivers, High-Speed Imaging & Machine Vision, Communications Test Equipment, Radar & Lidar Front-End Digitization.
Wireless IF / Baseband Digitization
The ADC1210S105HN/C1:5's 105 Msps sampling rate comfortably satisfies Nyquist for IF signals up to ~45 MHz, making it well-suited to digitize intermediate-frequency stages in wireless infrastructure receivers and software-defined radio front-ends. Selectable LVDS DDR outputs minimize skew when routing 12-bit words at full rate into an FPGA across several centimeters of board trace, which is essential for maintaining timing margin at 105 Msps. Its industrial -40C to +85C rating tolerates outdoor base-station environments, while the internal bandgap reference and clock duty-cycle stabilizer simplify the analog front-end and clock-generation circuitry, reducing BOM and PCB area.
추천
Medical Ultrasound Beamforming
In phased-array ultrasound systems, the ADC1210S105HN/C1:5 delivers 12-bit resolution at 105 Msps - enough dynamic range and sample rate to digitize RF echoes from 5 MHz transducers with adequate harmonic capture. Its selectable LVDS DDR output pairs naturally with multi-channel FPGA beamformers that aggregate samples from many transducers, while the compact HVQFN-40 (6x6 mm) footprint preserves front-end board area. The exposed pad reduces junction-to-ambient thermal resistance, critical in dense probe-head PCBs where many channels operate continuously. Industrial temperature grading covers clinical and portable ultrasound deployments.
추천
Industrial Test & Measurement Digitizers
The ADC1210S105HN/C1:5 suits digitizer channels in oscilloscopes, spectrum analyzers, and data-acquisition modules that need 12-bit resolution at 105 Msps. Its pipelined architecture provides low latency and high spurious-free dynamic range, both critical for accurate capture of repetitive waveforms. The HVQFN-40 package exposes a thermal pad that maintains junction temperature during continuous full-rate conversion. CMOS output mode can be selected to interface directly with a host MCU or FPGA without an LVDS receiver, simplifying lower-cost 2-channel digitizer boards used in bench instruments.
추천
Defense Signal-Intelligence Receivers
Wideband COMINT/SIGINT receivers need ADCs that capture large instantaneous bandwidth with sufficient dynamic range; the ADC1210S105HN/C1:5's 12 bits at 105 Msps cover signal segments up to ~45 MHz while keeping ENOB high enough to resolve weak signals in the presence of strong interferers. Its selectable LVDS DDR outputs are essential for routing data across the densely packed RF-to-digital backplane of an EW receiver. Industrial temperature rating supports ground-vehicle and fixed-site installations. The on-chip clock duty-cycle stabilizer relaxes the requirement on the upstream synthesizer, reducing system cost and phase-noise sensitivity.
추천
High-Speed Imaging & Machine Vision
Line-scan and area-scan cameras that interface to FPGA frame grabbers often use the ADC1210S105HN/C1:5 to digitize analog video outputs from CCD or CMOS image sensors at pixel rates up to 105 MHz. Its 12-bit resolution captures fine grayscale gradation needed for inspection and metrology, while the parallel CMOS output mode can drive an FPGA directly without an external deserializer. The HVQFN-40 footprint is small enough to fit behind BNC connectors on camera interface boards, and the industrial temperature range supports factory-floor and outdoor machine-vision installations.
추천
Communications Test Equipment
Protocol analyzers and bit-error-rate testers for high-speed serial links need wideband digitizers; the ADC1210S105HN/C1:5 captures eye-diagram traces and jitter profiles with 12-bit amplitude resolution at 105 Msps, providing the bandwidth needed to analyze signals up to several hundred MHz when used with proper frontend. CMOS output mode allows simple capture into deep SRAM buffers, and the small HVQFN-40 (6x6 mm) footprint fits in handheld tester form factors. Its internal reference reduces calibration drift in field-deployed test gear, an important practical benefit for service technicians.
추천
Radar & Lidar Front-End Digitization
Short-range automotive radar and lidar baseband receivers can use the ADC1210S105HN/C1:5 to digitize IF outputs of the mixer stage at sample rates up to 105 Msps. Its 12-bit resolution is sufficient to resolve target returns in moderately cluttered environments, while LVDS DDR outputs cleanly deliver data to a Spartan-6 or Artix-7 FPGA for FFT and target detection. The HVQFN-40 exposed pad keeps the junction cool enough for continuous operation in sealed, fanless sensor housings, and the industrial temperature rating covers underhood and outdoor mounting.
추천
추천 제품 요약
엔지니어링 참조 데이터: ADC1210S105HN/C1:5 — 비교, 설계 지침 및 규정 준수 정보.
선택 가이드
대체품과의 비교
| 파라미터 | 이 제품 | ADC1210S125HN/C1:5 | ADC1210S080HN/C1:5 | ADC1210S065HN/C1:5 | ADC1112D125HN-C18 | ADC1015S125HN/C1 | ADC1012D080HN/C1:5 |
|---|---|---|---|---|---|---|---|
| Brand | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors |
| Package | HVQFN-40 (6x6 mm) | HVQFN-40 (6x6 mm) - same | HVQFN-40 (6x6 mm) - same | HVQFN-40 (6x6 mm) - same | HVQFN-40 (6x6 mm) - same | HVQFN-40 (6x6 mm) - same | HVQFN-40 (6x6 mm) - same |
| Resolution | 12 bit | 12 bit | 12 bit | 12 bit | 11 bit | 10 bit | 10 bit |
| Max Sample Rate | 105 Msps | 125 Msps | 80 Msps | 65 Msps | 125 Msps | 125 Msps | 80 Msps |
| Number of Channels | 1 | 1 | 1 | 1 | 2 | 1 | 2 |
| Architecture | Pipelined | Pipelined | Pipelined | Pipelined | Pipelined | Pipelined | Pipelined |
| Digital Output Interface | CMOS or LVDS DDR (selectable) | CMOS or LVDS DDR | CMOS or LVDS DDR | CMOS or LVDS DDR | CMOS or LVDS DDR | CMOS or LVDS DDR | CMOS or LVDS DDR |
| Operating Temperature | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C |
주요 차별점
- Selectable CMOS or LVDS DDR digital outputs in one package (vs ADC1210S080HN/C1:5)
- Internal bandgap reference with external override (vs ADC1210S065HN/C1:5)
- Single-channel 12-bit at 105 Msps in 6x6 mm HVQFN-40 (vs ADC1112D125HN-C18)
- Speed-grade family from one silicon platform (vs ADC1010S105HN/C1:5)
설계 노트
Solder the exposed thermal pad (EPAD) of the HVQFN-40 directly to a contiguous analog-ground copper pour on the top layer, with at least eight thermal vias to the inner ground plane. The exposed pad provides the lowest-impedance return path for the analog input and is mandatory to meet the datasheet thermal resistance. Use a star-ground topology that ties the ADC AVSS, DRVSS, and DVSS pins together only at the package exposed pad to avoid ground-loop noise coupling into the analog front-end.
Decouple AVDD, DVDD, and DRVDD locally at the package pins with a 100 nF X7R ceramic capacitor in parallel with a 10 uF tantalum or polymer cap on each rail. The reference pins REFT and REFB need 100 nF X7R ceramics placed within 2 mm of the pins to keep reference noise low. According to the manufacturer datasheet, the on-chip bandgap reference can be overdriven by an external low-noise reference if tighter DC accuracy is needed - in that case disable the internal reference via the serial interface.
When using LVDS DDR output mode, route the 12 data bits plus the DDR clock as length-matched differential pairs to the receiving FPGA, keeping intra-pair skew below 5 ps and trace impedance at 100 ohms differential. For CMOS mode at 105 Msps, keep data traces under 50 mm, series-terminate each output with a 33 ohm resistor close to the ADC pin, and avoid crossing noisy digital traces over the analog ground pour. According to the manufacturer datasheet, the clock duty-cycle stabilizer relaxes the input-clock duty cycle requirement but does not eliminate the need for a low-jitter clock source.
Do not connect the analog input (AIN) directly to a high-impedance source; the ADC's track-and-hold requires a low-impedance driver with bandwidth at least 5x the sample rate. Estimated: at 105 Msps, the input bandwidth must exceed ~525 MHz to preserve ENOB - an op-amp like AD8055ARZ or AD8021ARMZ is appropriate. Always perform a power-on reset via the RESET pin after AVDD/DVDD are stable, and verify that the MODE pin is tied correctly before power-up because the output interface (CMOS vs LVDS DDR) is latched at reset.
규정 준수 정보
Compliance fields not present in the verified web data; defaults set to 'unknown' pending manufacturer datasheet confirmation. Device is industrial-grade and not AEC-Q100 qualified - not suitable for automotive applications.
