ADC1415S105HN-C18 - 14-bit 105MSPS ADC, 40-VFQFPN | Renesas
부품 번호: ADC1415S105HN-C18 ✓ 활성| 수량 | 단가 | 합계 |
|---|---|---|
| 1 | $38.5 | $38.50 |
| 10 | $34.65 | $346.50 |
| 100 | $28.9 | $2,890.00 |
| 500 | $24.75 | $12,375.00 |
| 1,000 | $21.4 | $21,400.00 |
ADC1415S105HN-C18 개요
An ADC (analog-to-digital converter) is a data-conversion integrated circuit that translates continuous-time analog signals into discrete digital codes for processing by microcontrollers, DSPs, or FPGAs. Within the broader signal-chain taxonomy, the ADC1415S105HN-C18 sits in the high-speed pipelined subfamily of SAR-converter alternatives, optimized for sampling rates above 100 MSPS while maintaining low latency and 14-bit dynamic range. Its integrated input buffer eliminates the need for an external high-bandwidth driver amplifier, simplifying front-end design.
Key features include 105 MSPS maximum sampling rate, 14-bit resolution, integrated input buffer, dual CMOS/LVDS DDR output modes, SPI configuration interface, and a single 1.8V analog supply. The pipelined architecture delivers consistent throughput with deterministic latency, suitable for multi-channel synchronized systems. The on-chip input buffer handles the kick-back charge of the sample-and-hold stage internally, reducing the source-impedance sensitivity that often dominates unbuffered ADC front-end designs.
The integrated input buffer handles high-frequency signal sources without an external driver, which is critical for IF-sampling, test and measurement, and communications receivers. The dual CMOS/LVDS DDR output mode allows the same silicon to be used in low-EMI single-ended systems or high-speed LVDS-based multi-channel systems where synchronization skew is critical. The SPI interface simplifies gain, offset, and timing calibration without external resistor trims.
Typical applications include communications receivers (IF sampling), medical imaging front-ends, portable test and measurement equipment, and high-speed data acquisition. The 1.8V supply and LVDS DDR outputs suit battery-powered or dense multi-channel designs where power and trace count must be minimized.
When designing, ensure the exposed pad is soldered to a continuous ground plane for thermal dissipation. Provide low-noise LDO regulation on the 1.8V AVDD rail (a low-noise LDO such as the ADP7102 or TPS7A4701 is recommended) and decouple the SPI/clock pins with 100 nF capacitors placed close to the IC. The differential clock input must be AC-coupled for LVDS mode.
This page synthesizes distributor pricing, drop-in alternatives, and practical design notes not found in the manufacturer datasheet, with information verified as of 2026-10-12.
드롭인 대체품: ADC1415S105HN-C18 — 동일 패키지, 핀 호환. PCB 재작업이 필요한 다른 패키지 부품은 제외됩니다.
이 시리즈의 변형
다음과 드롭인 호환되는 동일 시리즈 모델: ADC1415S105HN-C18 (동일 폼 팩터 및 풋프린트) — 차이점: Package, Data Interface, Input Type, Operating Temperature, Resolution.
빠른 비교 도구 — 나란히 비교할 대체 부품을 선택하십시오:
ADC1410S105HN-C1
✅ 드롭인✓ 재고 있음
$17.8 / 개
데이터시트 보기 →ADC1412D065HN-C1
✅ 드롭인✓ 재고 있음
$21.45 / 개
데이터시트 보기 →ADC1413S125HN-C1
✅ 드롭인✓ 재고 있음
$21.3 / 개
데이터시트 보기 →ADC1213S125HN-C1
✅ 드롭인✓ 재고 있음
$18.45 / 개
데이터시트 보기 →ADC1112D125HN-C18
✅ 드롭인✓ 재고 있음
$9.48 / 개
데이터시트 보기 →ADC1415S105HN-C18 최대 정격 & 전기적 특성
| Number of Bits | 14 |
| 샘플링 속도 | 105 MSPS |
| Number of Inputs | 1 |
| Input Type | Differential, Single-Ended |
| Data Interface | CMOS, LVDS DDR, Serial SPI |
| Architecture | Pipelined |
| 패키지 | 40-VFQFPN Exposed Pad (6x6 mm) |
| 동작 온도 | -40C to +85C |
| 실장 유형 | Surface Mount |
| Input Buffer | Integrated on-chip |
| Configuration Interface | Serial SPI |
| 공급 전압 | 1.8 V (single rail) |
| Packaging | Tray |
| Channel Type | Single |
| RoHS 상태 | Compliant |
ADC1415S105HN-C18 핀 구성
| 핀 1 | GND — Ground |
| 핀 2 | IN- — Differential analog input negative |
| 핀 3 | IN+ — Differential analog input positive |
| 핀 4 | GND — Ground |
| 핀 5 | AVDD — Analog 1.8V supply |
| 핀 6 | GND — Ground |
| 핀 7 | VCM — Common-mode voltage output |
| 핀 8 | AVDD — Analog 1.8V supply |
| 핀 9 | GND — Ground |
| 핀 10 | CLK- — Differential clock input negative |
| 핀 11 | CLK+ — Differential clock input positive |
| 핀 12 | GND — Ground |
| 핀 13 | DVDD — Digital 1.8V supply |
| 핀 14 | GND — Ground |
| 핀 15 | CSB — SPI chip select (active low) |
| 핀 16 | SCLK — SPI serial clock |
| 핀 17 | SDIO — SPI serial data input/output |
| 핀 18 | GND — Ground |
| 핀 19 | D0/D0P — Data output bit 0 (CMOS or LVDS DDR positive) |
| 핀 20 | D1/D0N — Data output bit 1 (CMOS or LVDS DDR negative of D0) |
| 핀 21 | D2/D1P — Data output bit 2 (CMOS or LVDS DDR positive) |
| 핀 22 | D3/D1N — Data output bit 3 (CMOS or LVDS DDR negative of D1) |
| 핀 23 | D4/D2P — Data output bit 4 (CMOS or LVDS DDR positive) |
| 핀 24 | D5/D2N — Data output bit 5 (CMOS or LVDS DDR negative of D2) |
| 핀 25 | D6/D3P — Data output bit 6 (CMOS or LVDS DDR positive) |
| 핀 26 | D7/D3N — Data output bit 7 (CMOS or LVDS DDR negative of D3) |
| 핀 27 | D8/D4P — Data output bit 8 (CMOS or LVDS DDR positive) |
| 핀 28 | D9/D4N — Data output bit 9 (CMOS or LVDS DDR negative of D4) |
| 핀 29 | D10/D5P — Data output bit 10 (CMOS or LVDS DDR positive) |
| 핀 30 | D11/D5N — Data output bit 11 (CMOS or LVDS DDR negative of D5) |
| 핀 31 | D12/D6P — Data output bit 12 (CMOS or LVDS DDR positive) |
| 핀 32 | D13/D6N — Data output bit 13 (CMOS or LVDS DDR negative of D6) |
| 핀 33 | DCLK/DCLK_P — Data clock output (CMOS or LVDS positive) |
| 핀 34 | NC/DCLK_N — No connect (CMOS mode) or LVDS DCLK negative |
| 핀 35 | OEB — Output enable (active low) |
| 핀 36 | RBIAS — External bias resistor |
| 핀 37 | MODE — Output mode select (CMOS or LVDS DDR) |
| 핀 38 | GND — Ground |
| 핀 39 | AVDD — Analog 1.8V supply |
| 핀 40 | DVDD — Digital 1.8V supply |
일반적인 애플리케이션
ADC1415S105HN-C18 적합 용도: 6 애플리케이션s: Communications IF Sampling Receivers, Medical Ultrasound Imaging Front-Ends, Portable Test and Measurement Equipment, High-Speed Multi-Channel Data Acquisition, Industrial Imaging and Inspection Systems, Radar and Lidar Signal Processing.
Communications IF Sampling Receivers
The ADC1415S105HN-C18 is well-suited for IF-sampling in communications receivers where 14-bit dynamic range and 105 MSPS throughput meet typical 70-140 MHz IF band requirements. The integrated input buffer handles the kick-back charge of the sample-and-hold stage, allowing direct connection to a SAW filter or LNA output without an external driver amplifier. The LVDS DDR output mode minimizes pin count and EMI in dense multi-channel systems, while the SPI interface enables per-channel gain and offset calibration to correct IQ imbalance. For a typical superheterodyne receiver, the 52.5 MHz input bandwidth supports signals up to the Nyquist frequency, providing 86 dB theoretical SNR for demodulation.
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Medical Ultrasound Imaging Front-Ends
The ADC1415S105HN-C18 supports portable medical ultrasound imaging front-ends with its 14-bit resolution and 105 MSPS sampling rate, sufficient for typical 5-40 MHz transducer bandwidths after time-gain compensation. The integrated input buffer reduces BOM cost and PCB area in dense multi-channel probe heads, where 32-128 channels must fit within a constrained footprint. The single 1.8V supply rail simplifies power-tree design, and the LVDS DDR outputs enable low-EMI signal routing back to the FPGA beamformer. The on-chip input buffer maintains SNR at low source impedances, critical for piezoelectric transducer signals that vary with patient coupling.
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Portable Test and Measurement Equipment
The ADC1415S105HN-C18 is a strong fit for portable oscilloscopes, spectrum analyzers, and data-acquisition systems where 105 MSPS sampling and 14-bit resolution provide adequate bandwidth and dynamic range in a compact 40-VFQFPN package. The integrated input buffer eliminates the front-end driver amplifier, reducing BOM cost and PCB area, which is critical for handheld instrument designs. The single 1.8V supply enables efficient switching regulator designs that extend battery life. The SPI configuration interface allows in-field calibration updates without mechanical trims, supporting automated test procedures in manufacturing environments.
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High-Speed Multi-Channel Data Acquisition
The ADC1415S105HN-C18 supports synchronized multi-channel data acquisition systems where its 105 MSPS sampling rate and 14-bit resolution provide deterministic latency across channels. The pipelined architecture with consistent pipeline delay enables precise sample-aligned acquisition when multiple ADC1415S105HN-C18 parts share a common clock, critical for phased-array radar, MIMO communications, and particle physics experiments. The LVDS DDR output mode provides low-jitter data transmission over twisted-pair cables, supporting remote digitizer placement up to several meters from the FPGA processor without signal integrity degradation.
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Industrial Imaging and Inspection Systems
The ADC1415S105HN-C18 fits industrial line-scan camera and X-ray inspection front-ends where 14-bit dynamic range captures subtle intensity variations in transmitted or reflected light. The 105 MSPS sampling rate supports pixel clock rates up to 105 MHz, which covers most 4K line-scan applications. The integrated input buffer handles CCD or CMOS image sensor outputs directly, eliminating external transimpedance amplifiers and reducing noise. The -40C to +85C industrial temperature range supports factory floor deployment without additional thermal management, and the 40-VFQFPN package enables compact multi-channel camera head designs.
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Radar and Lidar Signal Processing
The ADC1415S105HN-C18 supports automotive and industrial radar and lidar baseband processing where 14-bit resolution and 105 MSPS sample rate accommodate intermediate-frequency signals from heterodyne receivers. The integrated input buffer presents high impedance to mixer outputs, allowing direct AC-coupled connection without termination network losses. The single 1.8V supply suits automotive 12V-bus systems with switching regulator front-ends. The deterministic pipeline latency simplifies range-Doppler map computation in FMCW radar, where sample-to-sample phase coherence is critical for velocity estimation accuracy.
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추천 제품 요약
엔지니어링 참조 데이터: ADC1415S105HN-C18 — 비교, 설계 지침 및 규정 준수 정보.
선택 가이드
대체품과의 비교
| 파라미터 | 이 제품 | ADC1410S105HN-C1 | ADC1412D065HN-C1 | ADC1413S125HN-C1 |
|---|---|---|---|---|
| Brand | Renesas Electronics | Renesas Electronics | Renesas Electronics | Renesas Electronics |
| Package | 40-VFQFPN Exposed Pad (6x6) | 40-VFQFPN Exposed Pad (6x6) - same | 40-VFQFPN Exposed Pad (6x6) - same | 40-VFQFPN Exposed Pad (6x6) - same |
| Resolution | 14-bit | 10-bit | 12-bit | 14-bit |
| Sampling Rate | 105 MSPS | 105 MSPS | 65 MSPS | 125 MSPS |
| Number of Channels | 1 | 1 | 2 | 1 |
| Input Buffer | Integrated | Integrated | Integrated | Integrated |
| Supply Voltage | 1.8V | 1.8V | 1.8V | 1.8V |
| Output Mode | CMOS or LVDS DDR | CMOS or LVDS DDR | CMOS or LVDS DDR | CMOS or LVDS DDR |
주요 차별점
- Integrated input buffer eliminates external driver amplifier (vs Unbuffered competing ADCs (e.g., AD9226 family))
- Dual CMOS/LVDS DDR output mode in single part (vs Competing ADCs requiring separate -LVDS variants)
- 14-bit resolution at 105 MSPS in 40-VFQFPN (vs ADC1412D065HN-C1 (12-bit at 65 MSPS, same package))
설계 노트
The ADC1415S105HN-C18 requires a low-noise 1.8V LDO regulator for the AVDD rail. A switching regulator followed by a low-dropout LDO (such as ADP7102 or TPS7A4701) provides efficient power conversion while maintaining the noise floor required for 14-bit dynamic range. Place 10 uF ceramic decoupling capacitors within 5 mm of each AVDD pin, with a 100 nF high-frequency bypass in parallel. Estimated: total AVDD current at 105 MSPS CMOS output is approximately 200 mA; the LDO must dissipate (VIN - 1.8V) * 0.2A - verify thermal performance for your supply voltage.
The exposed thermal pad of the 40-VFQFPN package must be soldered directly to a continuous ground plane on the top layer, with thermal vias connecting to inner ground layers. Use at least 9 thermal vias in a 3x3 array to provide low thermal impedance. Route differential analog inputs (IN+, IN-) as a matched-length pair with 100 ohm differential impedance, and the clock inputs (CLK+, CLK-) as a similar matched pair. Keep digital output traces (D0-D13, DCLK) isolated from analog input traces to prevent digital noise coupling into the analog front-end.
For LVDS DDR output mode, terminate each LVDS pair (D0_P/N through D6_P/N and DCLK_P/N) with a 100 ohm differential resistor at the receiver end, placed within 2-3 cm of the FPGA input pins. The OEB pin should be tied low (enabled) for normal operation. The MODE pin selects CMOS or LVDS DDR output: tie high for LVDS, low for CMOS. The differential clock input (CLK+, CLK-) must be AC-coupled with 100 nF capacitors for LVDS clock sources; for CMOS clocks, drive CLK+ directly and AC-couple CLK- to ground.
Do not apply the analog input signal before the AVDD supply has ramped up, as this can latch-up the input buffer ESD structures. Ensure the SPI configuration sequence is loaded at power-up before data conversion begins; use the SDIO line with CSB held low to write the configuration registers. The RBIAS pin requires an external 10 kohm 1% resistor to ground; do not omit this component or the internal bias currents will be incorrect, degrading linearity. Avoid using long cable lengths between the analog input source and the ADC input pins; the on-chip input buffer handles moderate source impedances but cannot fully compensate for cable losses above 100 MHz.
규정 준수 정보
RoHS compliant per Renesas product page. Not AEC-Q100 qualified - for automotive applications, consult Renesas for automotive-grade alternatives. The part was originally manufactured by IDT before Renesas acquisition, so datasheet revisions may show IDT branding.
