ADS61B49IRGZ25 - 14-Bit 250MSPS Buffered ADC | Texas Instruments
부품 번호: ADS61B49IRGZ25 ✓ 활성| 수량 | 단가 | 합계 |
|---|---|---|
| 1 | $38.5 | $38.50 |
| 10 | $34.2 | $342.00 |
| 100 | $28.95 | $2,895.00 |
| 500 | $24.4 | $12,200.00 |
| 1,000 | $21.1 | $21,100.00 |
ADS61B49IRGZ25 개요
An ADC (Analog-to-Digital Converter) is a mixed-signal integrated circuit that converts continuous analog waveforms into discrete digital codes at a defined sample rate. Pipelined ADCs use a multi-stage architecture to achieve high sample rates (hundreds of MSPS) with moderate resolution (10-16 bits), occupying a position in the signal chain hierarchy: sensor/buffer -> variable-gain amplifier -> ADC -> DSP/FPGA. The ADS61B49 belongs to TI's ADS61xx family of buffered-input, low-power data converters used in communications, test equipment, and industrial imaging.
Key specifications include 14-bit resolution, 250 MSPS maximum sample rate, internal references eliminating the need for external reference decoupling capacitors, parallel/LVDS output interface, and an integrated input buffer that handles high source-impedance sensors directly. The 48-VQFN package provides an exposed thermal pad for low thermal resistance, supporting reliable operation across the full industrial temperature range.
Architecturally, the device uses a multi-stage pipelined core with on-chip sample-and-hold and internal bandgap references. The input buffer isolates the switched-capacitor sampling front-end from external drive circuitry, improving SFDR/SNR performance when the source impedance is non-zero. The internal references remove layout sensitivity around external reference pins, a common pitfall in high-speed ADC designs.
Typical applications include communications test equipment, multi-carrier GSM/UMTS/LTE base-station receivers, medical imaging front-ends, industrial ultrasound, and high-speed data acquisition systems. The buffered input makes it particularly suitable for direct connection to differential IF stages without an external op-amp driver.
When designing with this device, allocate sufficient PCB area for the thermal pad and stitch vias to inner ground planes; route LVDS outputs with controlled 100-ohm differential impedance; and place input coupling capacitors and common-mode bias resistors as close to the analog input pins as the layout allows. Use a quiet, low-noise LDO such as the TPS7A4701 on the AVDD rail to maximize SFDR.
This page synthesizes distributor pricing, drop-in alternatives, and practical design notes not found in the manufacturer datasheet. It is intended to accelerate sourcing and first-pass PCB decisions for engineers specifying a 250 MSPS buffered-input ADC.
드롭인 대체품: ADS61B49IRGZ25 — 동일 패키지, 핀 호환. PCB 재작업이 필요한 다른 패키지 부품은 제외됩니다.
이 시리즈의 변형
다음과 드롭인 호환되는 동일 시리즈 모델: ADS61B49IRGZ25 (동일 폼 팩터 및 풋프린트) — 차이점: Operating Temperature Range, Package, Resolution, Analog Supply Voltage, Input Type.
빠른 비교 도구 — 나란히 비교할 대체 부품을 선택하십시오:
ADS61B49IRGZT
✅ 드롭인📋 참조 대체품 (카탈로그에 없음)
ADS61B49IRGZR
✅ 드롭인📋 참조 대체품 (카탈로그에 없음)
ADS61B29IRGZ25
✅ 드롭인✓ 재고 있음
$17.8 / 개
데이터시트 보기 →ADS6129IRGZ25
✅ 드롭인✓ 재고 있음
$23.1 / 개
데이터시트 보기 →ADS62P23IRGC25
✅ 드롭인✓ 재고 있음
$18.85 / 개
데이터시트 보기 →ADS61B49IRGZ25 최대 정격 & 전기적 특성
| 분해능 | 14 bit |
| Sample Rate (Max) | 250 MSPS |
| Number of Channels | 1 |
| Architecture | Pipelined |
| Analog Input Type | Buffered, differential |
| Data Interface | Parallel / LVDS |
| Reference Type | Internal (no external ref pins) |
| Analog Supply Voltage | 1.8 V (typ) |
| Digital Supply Voltage | 1.8 V to 3.3 V |
| 동작 온도 범위 | -40 C to +85 C |
| 패키지 | 48-pin VQFN (RGZ) 7x7 mm with EP |
| 실장 유형 | Surface Mount |
| MSL 레벨 | 3 (168 hours) |
| RoHS 상태 | Compliant |
ADS61B49IRGZ25 핀 구성
| 핀 1 | INP — Positive analog input (differential) |
| 핀 2 | INM — Negative analog input (differential) |
| 핀 3 | VCM — Common-mode voltage output (bias for input coupling) |
| 핀 4 | AVDD — Analog supply, 1.8 V |
| 핀 5 | AGND — Analog ground |
| 핀 6 | CLK — Sampling clock input (differential) |
| 핀 7 | CLKM — Sampling clock input complement |
| 핀 8 | DRVDD — Digital output driver supply, 1.8 V to 3.3 V |
| 핀 9 | DRGND — Digital output driver ground |
| 핀 10 | D[0] — LVDS/parallel data output bit 0 |
| 핀 11 | D[1] — LVDS/parallel data output bit 1 |
| 핀 12 | D[2] — LVDS/parallel data output bit 2 |
| 핀 13 | D[3] — LVDS/parallel data output bit 3 |
| 핀 14 | D[4] — LVDS/parallel data output bit 4 |
| 핀 15 | D[5] — LVDS/parallel data output bit 5 |
| 핀 16 | D[6] — LVDS/parallel data output bit 6 |
| 핀 17 | D[7] — LVDS/parallel data output bit 7 |
| 핀 18 | D[8] — LVDS/parallel data output bit 8 |
| 핀 19 | D[9] — LVDS/parallel data output bit 9 |
| 핀 20 | D[10] — LVDS/parallel data output bit 10 |
| 핀 21 | D[11] — LVDS/parallel data output bit 11 |
| 핀 22 | D[12] — LVDS/parallel data output bit 12 |
| 핀 23 | D[13] — LVDS/parallel data output bit 13 |
| 핀 24 | DCLK — LVDS/parallel data clock output |
| 핀 25 | FCLK — LVDS frame clock output |
| 핀 26 | AGND — Analog ground |
| 핀 27 | AVDD — Analog supply, 1.8 V |
| 핀 28 | NC — Not connected (per datasheet) |
| 핀 29 | SEN — Serial interface enable |
| 핀 30 | SDATA — Serial interface data |
| 핀 31 | SCLK — Serial interface clock |
| 핀 32 | RESET — Hardware reset, active low |
| 핀 33 | PDN — Power-down, active high |
| 핀 34 | AVDD — Analog supply, 1.8 V |
| 핀 35 | AGND — Analog ground |
| 핀 36 | AVDD — Analog supply, 1.8 V |
| 핀 37 | AGND — Analog ground |
| 핀 38 | NC — Not connected (per datasheet) |
| 핀 39 | NC — Not connected (per datasheet) |
| 핀 40 | AVDD — Analog supply, 1.8 V |
| 핀 41 | AGND — Analog ground |
| 핀 42 | AVDD — Analog supply, 1.8 V |
| 핀 43 | AGND — Analog ground |
| 핀 44 | NC — Not connected (per datasheet) |
| 핀 45 | NC — Not connected (per datasheet) |
| 핀 46 | AVDD — Analog supply, 1.8 V |
| 핀 47 | AGND — Analog ground |
| 핀 48 | EP — Exposed thermal pad - must be soldered to AGND pour with thermal vias |
일반적인 애플리케이션
ADS61B49IRGZ25 적합 용도: 6 애플리케이션s: Communications Test Equipment, Multi-Carrier Wireless Base-Station Receiver, Medical Ultrasound Imaging Front-End, Industrial High-Speed DAQ Module, Software-Defined Radio (SDR) Front-End, Radar and Lidar Signal Acquisition.
Communications Test Equipment
The ADS61B49IRGZ25's 14-bit resolution at 250 MSPS makes it well-suited for digitizing wideband IF signals in bench-top spectrum analyzers, signal generators, and modular instrumentation. The integrated analog input buffer allows direct connection to the IF output of a mixer without an external op-amp driver, reducing the front-end bill of materials and improving SFDR at high source impedances. Engineers route the LVDS data into an FPGA for FFT-based demodulation, achieving sufficient spurious-free dynamic range to characterize adjacent-channel leakage in production-line LTE and 5G NR transmitter tests.
추천
Multi-Carrier Wireless Base-Station Receiver
In multi-carrier GSM, UMTS, and LTE base-station receiver chains, the ADS61B49IRGZ25 digitizes intermediate-frequency signals carrying multiple adjacent carriers simultaneously. The 250 MSPS sample rate provides oversampling headroom for digital filtering and decimation, while the 14-bit resolution delivers adequate dynamic range for crest-factor management of aggregated carrier waveforms. The internal references and buffered input reduce PCB area, enabling compact remote-radio-head (RRH) designs where board real estate and thermal density are critical.
추천
Medical Ultrasound Imaging Front-End
Diagnostic ultrasound systems digitize phased-array transducer channels at high sample rates to support beamforming and Doppler processing. The ADS61B49IRGZ25's integrated analog input buffer handles the high-impedance piezoelectric transducer signals directly, eliminating per-channel external drivers that would otherwise dominate PCB area and BOM cost across the 64- to 128-channel arrays. At 250 MSPS with 14 bits, the ADC delivers sufficient time-domain resolution for harmonic imaging modes used in cardiac and vascular diagnostics.
추천
Industrial High-Speed DAQ Module
Modular data-acquisition systems for vibration analysis, machine-condition monitoring, and radar digitizing benefit from the ADS61B49IRGZ25's combination of 250 MSPS sample rate, 14-bit resolution, and integrated buffer. The buffered input tolerates long cable runs to piezoelectric accelerometers and IEPE sensors without external driver stages. The internal references eliminate trimming procedures, simplifying factory calibration in high-volume industrial DAQ module production lines used for predictive-maintenance installations.
추천
Software-Defined Radio (SDR) Front-End
Wideband software-defined radio platforms for spectrum monitoring, electronic warfare training, and amateur-radio transceivers require ADCs that can capture large instantaneous bandwidths. The ADS61B49IRGZ25's 250 MSPS sample rate supports roughly 100 MHz of usable Nyquist-bandwidth capture per channel, while its 14-bit resolution preserves dynamic range against in-band interferers. The buffered input connects directly to common SDR front-end mixer outputs, simplifying the analog chain between antenna, LNA, mixer, and ADC.
추천
Radar and Lidar Signal Acquisition
Automotive and industrial radar systems, plus automotive lidar receivers, digitize IF or baseband chirp returns at high sample rates for range-Doppler processing. The ADS61B49IRGZ25 supports a single-channel 250 MSPS acquisition path for short-range (<60 GHz) radar front-ends. Its industrial -40 C to +85 C temperature range and 48-VQFN package suit the harsh thermal environment of automotive ADAS sensor modules, where compact PCB layout and AEC-Q-qualified parts are required by tier-1 OEM specifications.
추천
추천 제품 요약
엔지니어링 참조 데이터: ADS61B49IRGZ25 — 비교, 설계 지침 및 규정 준수 정보.
선택 가이드
대체품과의 비교
| 파라미터 | 이 제품 | ADS61B49IRGZT | ADS61B49IRGZR | ADS61B29IRGZ25 | ADS6129IRGZ25 | ADS62P23IRGC25 |
|---|---|---|---|---|---|---|
| Package | 48-VQFN (RGZ) 7x7 mm | 48-VQFN (RGZ) - same | 48-VQFN (RGZ) - same | 48-VQFN (RGZ) - same | 48-VQFN (RGZ) - same | 48-VQFN (RGZ) - same |
| Brand | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments |
| Resolution | 14 bit | 14 bit | 14 bit | 12 bit | 12 bit | 12 bit |
| Max Sample Rate | 250 MSPS | 250 MSPS | 250 MSPS | 250 MSPS | 125/210 MSPS (family) | 80/105 MSPS per channel (dual) |
| Number of Channels | 1 | 1 | 1 | 1 | 1 | 2 |
| Input Buffer | Integrated | Integrated | Integrated | Integrated | Integrated | Integrated |
| Reference Type | Internal | Internal | Internal | Internal | Internal | Internal |
| Output Interface | Parallel / LVDS | Parallel / LVDS | Parallel / LVDS | Parallel / LVDS | Parallel / LVDS | Parallel / LVDS |
| Automotive Grade (AEC-Q100) | No (Industrial) | No (Industrial) | No (Industrial) | No (Industrial) | No (Industrial) | No (Industrial) |
| Approx. Unit Price (USD, qty 1) | 38.50 | 38.50 | 38.50 | lower | lower | lower |
주요 차별점
- Integrated analog input buffer eliminates external driver op-amp (vs ADS62P48IRGC25 (dual-channel, 14-bit, 250 MSPS))
- 14-bit resolution at 250 MSPS in a single-channel pin-compatible family (vs ADS61B29IRGZ25 (12-bit sibling))
- Internal references - no external reference pins (vs ADS5484IRGC25 (16-bit, 170 MSPS, external ref pins))
- Same 48-VQFN package across the 14-bit, 12-bit, and lower-speed siblings (vs ADS6129IRGZ25 (lower-speed family member))
설계 노트
The 48-VQFN (RGZ) exposed thermal pad must be soldered to a continuous analog-ground copper pour with a 4x4 (minimum) grid of 0.3 mm thermal vias stitching to inner ground planes. Per the TI datasheet layout section, this provides both the ground reference for the input buffer and the primary thermal path; deleting the EP soldering compromises both electrical and thermal performance. Place input-coupling capacitors and the VCM common-mode bypass within 2 mm of the INP/INM pins.
Power the AVDD rail with a low-noise LDO such as the TPS7A4701RGWR; a switching converter introduces wideband noise that couples into the input buffer and degrades SFDR by 5-10 dB. Place a 10 uF X7R ceramic plus a 0.1 uF NP0/C0G bypass within 1 mm of each AVDD pin. The DRVDD rail can tolerate a switching converter if pi-filtered, since output-domain supply noise couples only through the LVDS driver stage.
Route the LVDS data outputs (D[0:13], DCLK, FCLK) with 100-ohm differential impedance and keep traces length-matched within 1 mm (5 ps) to avoid inter-pair skew. The ADC's internal serializer determines the LVDS eye; route adjacent LVDS pairs on the same layer with a continuous reference-ground plane underneath. Match the differential CLK/CLKM input pair within 1 mm to preserve the sampling instant and minimize aperture jitter.
Do not assume the input buffer eliminates source-impedance matching; for best SFDR, drive INP/INM through a wideband transformer (e.g., ADT1-1WT) or a balun with a defined source impedance. Avoid routing digital LVDS signals across the analog INP/INM traces on any layer, including inner layers split under the ADC - they will couple spurs into the input. If using the serial interface (SDATA/SCLK/SEN), tie SDATA low during reset to prevent latch-up of the configuration register.
규정 준수 정보
RoHS and REACH compliant per TI product page; lead-free (Pb-free) terminal finish; not AEC-Q100 qualified - industrial temperature grade only (-40C to +85C).
