ADC08D500CIYB - Dual 8-Bit 500MSPS ADC | Texas Instruments
MPN： ADC08D500CIYB ⚠ 最後購買機會ADC08D500CIYB 概覽
An analog-to-digital converter is an integrated circuit that samples continuous-time analog waveforms into the binary, register-blocked digital domain at a fixed sampling rate; the ADC08D500 family specifically targets the high-speed, low-power segment used in communications, test equipment, and radar signal chains. The product type hierarchy is ADC > data converter > mixed-signal IC > semiconductor. The ADC08D500 family is also commonly referred to as a flash ADC with folding and interpolating architecture, a two-step sub-ranging ADC, or a high-speed pipeline ADC derivative.
Key features include internal sample-and-hold, choice of SDR or DDR output clocking, an interleave mode that doubles sampling rate, multiple ADC synchronization capability, guaranteed no missing codes, a serial interface for extended control, fine adjustment of input full-scale range and offset, and duty-cycle corrected sample clock. These capabilities make the device a preferred option for dual-channel wideband digital oscilloscopes and direct RF downconversion chains.
The device uses a folding and interpolating architecture with an internal calibration engine, achieving low-latency digital conversion without the deep pipeline delay seen in pipelined ADCs. This makes it well suited for time-domain applications such as radar pulse measurement and triggering applications where deterministic latency matters more than raw SNR.
Typical applications include radar and LIDAR digitizer front-ends, automated test equipment, digital oscilloscopes, communications basestation receivers, and high-speed signal analyzers. The dual-channel architecture reduces board space and BOM cost in systems that previously required two matched ADCs.
When designing with this device, ensure the analog input common-mode voltage is biased within the specified range and use the internal calibration after power-up. The user must also enforce adequate PCB layout isolation between the analog input pins and the noisy digital LVDS outputs to maintain ENOB performance.
直接替換替代品，適用於 ADC08D500CIYB — 相同封裝，腳位對腳位相容。需重新設計 PCB 的不同封裝零件不列入。
此系列的變體
與下列產品可直接替換的同系列型號： ADC08D500CIYB （相同外形與佔位） — 差異在於 Output Interface, Package, RoHS Status, Architecture, Input Type.
ADC08D500CIYB/NOPB
✅ 直接替換📋 參考替代品（不在目錄中）
ADC08D1000CIYB
✅ 直接替換聯絡詢價
查看資料表 →ADC08D1500CIYB
✅ 直接替換聯絡詢價
ADC12D1800CIYB
✅ 直接替換📋 參考替代品（不在目錄中）
ADC08D500CIYB 最大額定值與電氣特性
| 解析度 | 8 bit |
| Number of Channels | 2 (dual) |
| Sampling Rate (per channel) | 500 MSPS |
| Sampling Rate (interleaved) | 1.0 GSPS |
| Architecture | Folding and Interpolating |
| 供應電壓 | 1.9 V +/-0.1 V (single) |
| Input Type | Differential analog |
| Output Interface | LVDS, SDR or DDR clocking |
| 封裝 | 128-HLQFP (NNB), 20 mm x 20 mm |
| 安裝類型 | Surface Mount |
| 工作溫度 | -40 C to +85 C |
| Input Full-Scale Range | Programmable (fine adjustment) |
| Input Offset | Fine adjustment via serial interface |
| RoHS 狀態 | Non-Compliant (Lead-based, standard part); NOPB variant is compliant |
ADC08D500CIYB 腳位配置
| 腳位 1 | VBGAP — Bandgap voltage bypass |
| 腳位 2 | VA19 — Analog 1.9V supply |
| 腳位 3 | VA19 — Analog 1.9V supply |
| 腳位 4 | GND — Ground |
| 腳位 5 | VAIN_I+ — Channel I positive analog input |
| 腳位 6 | VAIN_I- — Channel I negative analog input |
| 腳位 7 | VCM_I — Channel I common-mode voltage |
| 腳位 8 | VA19 — Analog 1.9V supply |
| 腳位 9 | GND — Ground |
| 腳位 10 | VAIN_Q+ — Channel Q positive analog input |
| 腳位 11 | VAIN_Q- — Channel Q negative analog input |
| 腳位 12 | VCM_Q — Channel Q common-mode voltage |
| 腳位 13 | CLK+ — Differential clock input positive |
| 腳位 14 | CLK- — Differential clock input negative |
| 腳位 15 | DCLK_RST+ — DCLK reset, positive |
| 腳位 16 | DCLK_RST- — DCLK reset, negative |
| 腳位 17 | SDI — Serial data input |
| 腳位 18 | SCS — Serial chip select |
| 腳位 19 | SCLK — Serial clock |
| 腳位 20 | SDO — Serial data output |
| 腳位 21 | OUTCLK+ — Output clock positive |
| 腳位 22 | OUTCLK- — Output clock negative |
| 腳位 23 | DDI_0+ — DDR data output I bit 0 positive |
| 腳位 24 | DDI_0- — DDR data output I bit 0 negative |
| 腳位 25 | DDI_1+ — DDR data output I bit 1 positive |
| 腳位 26 | DDI_1- — DDR data output I bit 1 negative |
| 腳位 27 | DDI_2+ — DDR data output I bit 2 positive |
| 腳位 28 | DDI_2- — DDR data output I bit 2 negative |
| 腳位 29 | DDI_3+ — DDR data output I bit 3 positive |
| 腳位 30 | DDI_3- — DDR data output I bit 3 negative |
| 腳位 31 | DDI_4+ — DDR data output I bit 4 positive |
| 腳位 32 | DDI_4- — DDR data output I bit 4 negative |
| 腳位 33 | DDI_5+ — DDR data output I bit 5 positive |
| 腳位 34 | DDI_5- — DDR data output I bit 5 negative |
| 腳位 35 | DDI_6+ — DDR data output I bit 6 positive |
| 腳位 36 | DDI_6- — DDR data output I bit 6 negative |
| 腳位 37 | DDI_7+ — DDR data output I bit 7 positive |
| 腳位 38 | DDI_7- — DDR data output I bit 7 negative |
| 腳位 39 | DDI_8+ — DDR data output I bit 8 positive |
| 腳位 40 | DDI_8- — DDR data output I bit 8 negative |
| 腳位 41 | DDI_9+ — DDR data output I bit 9 positive |
| 腳位 42 | DDI_9- — DDR data output I bit 9 negative |
| 腳位 43 | VD19 — Digital 1.9V supply |
| 腳位 44 | GND — Ground |
| 腳位 45 | DDQ_0+ — DDR data output Q bit 0 positive |
| 腳位 46 | DDQ_0- — DDR data output Q bit 0 negative |
| 腳位 47 | DDQ_1+ — DDR data output Q bit 1 positive |
| 腳位 48 | DDQ_1- — DDR data output Q bit 1 negative |
| 腳位 49 | DDQ_2+ — DDR data output Q bit 2 positive |
| 腳位 50 | DDQ_2- — DDR data output Q bit 2 negative |
| 腳位 51 | DDQ_3+ — DDR data output Q bit 3 positive |
| 腳位 52 | DDQ_3- — DDR data output Q bit 3 negative |
| 腳位 53 | DDQ_4+ — DDR data output Q bit 4 positive |
| 腳位 54 | DDQ_4- — DDR data output Q bit 4 negative |
| 腳位 55 | DDQ_5+ — DDR data output Q bit 5 positive |
| 腳位 56 | DDQ_5- — DDR data output Q bit 5 negative |
| 腳位 57 | DDQ_6+ — DDR data output Q bit 6 positive |
| 腳位 58 | DDQ_6- — DDR data output Q bit 6 negative |
| 腳位 59 | DDQ_7+ — DDR data output Q bit 7 positive |
| 腳位 60 | DDQ_7- — DDR data output Q bit 7 negative |
| 腳位 61 | DDQ_8+ — DDR data output Q bit 8 positive |
| 腳位 62 | DDQ_8- — DDR data output Q bit 8 negative |
| 腳位 63 | DDQ_9+ — DDR data output Q bit 9 positive |
| 腳位 64 | DDQ_9- — DDR data output Q bit 9 negative |
| 腳位 65 | PD_I — Power down channel I (active high) |
| 腳位 66 | PD_Q — Power down channel Q (active high) |
| 腳位 67 | CAL — Calibration start (active high) |
| 腳位 68 | CALDONE — Calibration done flag |
| 腳位 69 | RESET — Device reset (active high) |
| 腳位 70 | FSR — Full-scale range select |
| 腳位 71 | DDR_PHS — DDR clock phase select |
| 腳位 72 | TEST — Test mode (factory, do not connect) |
| 腳位 73 | NC — Not connected |
| 腳位 74 | NC — Not connected |
| 腳位 75 | NC — Not connected |
| 腳位 76 | VA19 — Analog 1.9V supply |
| 腳位 77 | GND — Ground |
| 腳位 78 | VA19 — Analog 1.9V supply |
| 腳位 79 | GND — Ground |
| 腳位 80 | VA19 — Analog 1.9V supply |
| 腳位 81 | GND — Ground |
| 腳位 82 | VD19 — Digital 1.9V supply |
| 腳位 83 | GND — Ground |
| 腳位 84 | VD19 — Digital 1.9V supply |
| 腳位 85 | GND — Ground |
| 腳位 86 | VD19 — Digital 1.9V supply |
| 腳位 87 | GND — Ground |
| 腳位 88 | VD19 — Digital 1.9V supply |
| 腳位 89 | GND — Ground |
| 腳位 90 | VD19 — Digital 1.9V supply |
| 腳位 91 | GND — Ground |
| 腳位 92 | VD19 — Digital 1.9V supply |
| 腳位 93 | GND — Ground |
| 腳位 94 | VD19 — Digital 1.9V supply |
| 腳位 95 | GND — Ground |
| 腳位 96 | VD19 — Digital 1.9V supply |
| 腳位 97 | GND — Ground |
| 腳位 98 | VD19 — Digital 1.9V supply |
| 腳位 99 | GND — Ground |
| 腳位 100 | VD19 — Digital 1.9V supply |
| 腳位 101 | GND — Ground |
| 腳位 102 | VD19 — Digital 1.9V supply |
| 腳位 103 | GND — Ground |
| 腳位 104 | VD19 — Digital 1.9V supply |
| 腳位 105 | GND — Ground |
| 腳位 106 | VD19 — Digital 1.9V supply |
| 腳位 107 | GND — Ground |
| 腳位 108 | VD19 — Digital 1.9V supply |
| 腳位 109 | GND — Ground |
| 腳位 110 | VD19 — Digital 1.9V supply |
| 腳位 111 | GND — Ground |
| 腳位 112 | VD19 — Digital 1.9V supply |
| 腳位 113 | GND — Ground |
| 腳位 114 | VD19 — Digital 1.9V supply |
| 腳位 115 | GND — Ground |
| 腳位 116 | VD19 — Digital 1.9V supply |
| 腳位 117 | GND — Ground |
| 腳位 118 | VD19 — Digital 1.9V supply |
| 腳位 119 | GND — Ground |
| 腳位 120 | VD19 — Digital 1.9V supply |
| 腳位 121 | GND — Ground |
| 腳位 122 | VD19 — Digital 1.9V supply |
| 腳位 123 | GND — Ground |
| 腳位 124 | VD19 — Digital 1.9V supply |
| 腳位 125 | GND — Ground |
| 腳位 126 | NC — Not connected |
| 腳位 127 | NC — Not connected |
| 腳位 128 | EP — Exposed thermal pad (GND) |
典型應用
ADC08D500CIYB 適用於 6 應用s: Digital Oscilloscope Front-End, Radar and LIDAR Digitizer, Communications Basestation Receiver, Automated Test Equipment (ATE), Wideband Signal Analyzer, Medical Imaging (Ultrasound Beamformer).
Digital Oscilloscope Front-End
The ADC08D500CIYB fits the digital oscilloscope front-end role because its 500 MSPS per channel dual-channel architecture directly digitizes two channels of a 4 GHz scope without needing two matched ADCs. Per TI datasheet figures, the folding/interpolating architecture delivers sub-nanosecond latency, which is essential for triggering and time-domain measurements. Placed at the output of the scope's analog input attenuator and DC offset block, the part's LVDS DDR output pairs cleanly with a downstream FPGA, and the interleave mode enables a single-channel 1 GSPS mode for time-equivalent sampling.
推薦
Radar and LIDAR Digitizer
The ADC08D500CIYB's dual 500 MSPS channels and folding/interpolating low-latency architecture make it well suited for radar and LIDAR pulse digitizers where deterministic sample-to-output delay simplifies range gating. With a 1.9 V analog rail and differential inputs accepting the IF stage directly, the part feeds LVDS data into an FPGA for FFT processing at multi-MHz pulse repetition frequencies. Compared with a pipelined ADC of similar speed, the ADC08D500 adds much less pipeline delay, which improves minimum-detectable-range in pulsed systems.
推薦
Communications Basestation Receiver
In a wireless basestation receiver, the ADC08D500CIYB's dual 500 MSPS channels can digitize both the I and Q baseband outputs of a direct-conversion tuner, with the 1.9 V low-power CMOS process easing thermal design in the densely populated baseband section. Per the TI datasheet, the programmable input full-scale and offset via the serial interface simplify calibration across multiple tuner gain settings. Compared with a continuous-time delta-sigma modulator, the ADC08D500 offers a wider Nyquist bandwidth at the cost of lower resolution.
推薦
Automated Test Equipment (ATE)
The ADC08D500CIYB is well suited to ATE pin-card digitizers because the dual 500 MSPS channels allow simultaneous acquisition of stimulus and response waveforms on a single ADC chip, reducing pin-card BOM cost. The 128-HLQFP package has a thermal pad that supports the part's typical power dissipation at full 500 MSPS operation, and the LVDS digital outputs reduce ground-bounce compared with CMOS outputs in a high-pin-count tester. Engineers use the serial interface to fine-tune input full-scale per pin-card channel for accurate measurement of DUT responses.
推薦
Wideband Signal Analyzer
In a wideband signal analyzer or spectrum analyzer IF digitizer, the ADC08D500CIYB's 500 MSPS analog input bandwidth supports IF digitization in the second or third Nyquist zone, enabling direct sampling of up to ~250 MHz IF signals. Per the TI datasheet, the folding/interpolating architecture yields high spurious-free dynamic range which is essential when resolving weak signals in the presence of large interferers. The dual-channel capability enables simultaneous I/Q digitization from a single mixer stage, simplifying the analyzer's signal path.
推薦
Medical Imaging (Ultrasound Beamformer)
The ADC08D500CIYB fits mid-tier ultrasound beamformer receiver channels where the 500 MSPS sampling rate comfortably exceeds the 40 MHz typical ultrasound transducer bandwidth with significant oversampling, and the dual-channel architecture minimizes board area per channel. The 1.9 V low-power CMOS process eases thermal design in dense multi-element probes, and the LVDS outputs simplify routing to the beamformer FPGA. Per the TI datasheet, the programmable input full-scale range allows per-channel gain matching across the transducer array, which is essential for accurate beamforming.
推薦
推薦產品摘要
工程參考資料，適用於 ADC08D500CIYB — 比較、設計指引及合規資訊。
選型指南
與替代品比較
| 參數 | 本產品 | ADC08D500CIYB/NOPB | ADC08D1000CIYB | ADC08D1500CIYB | ADC12D1800CIYB |
|---|---|---|---|---|---|
| Package | 128-HLQFP (NNB), 20x20 mm | 128-HLQFP (NNB), 20x20 mm - same | 128-HLQFP (NNB), 20x20 mm - same | 128-HLQFP (NNB), 20x20 mm - same | 128-HLQFP (NNB), 20x20 mm - same |
| Brand | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments |
| Resolution | 8 bit | 8 bit | 8 bit | 8 bit | 12 bit |
| Sampling Rate per Channel | 500 MSPS | 500 MSPS | 1000 MSPS (+100%) | 150 MSPS (-70%) | 1800 MSPS (+260%) |
| Number of Channels | 2 (dual) | 2 (dual) | 2 (dual) | 2 (dual) | 2 (dual) |
| Supply Voltage | 1.9 V | 1.9 V | 1.9 V | 1.9 V | 1.9 V |
| Output Interface | LVDS, SDR or DDR | LVDS, SDR or DDR | LVDS, SDR or DDR | LVDS, SDR or DDR | LVDS, SDR or DDR |
| RoHS / Pb-free | Non-RoHS (SnPb finish) | RoHS-compliant (Pb-free) | RoHS-compliant (Pb-free) | RoHS-compliant (Pb-free) | RoHS-compliant (Pb-free) |
| Lifecycle Status | Last-time-buy (Nov 2018 cutoff) | Last-time-buy (Nov 2018 cutoff) | Obsolete | Active | Obsolete |
主要差異化特點
- Folding and interpolating architecture for low latency (對比ADC081000CIYB)
- Dual-channel 500 MSPS in a single 128-HLQFP (對比Two single-channel 500 MSPS ADCs)
- 1.9 V single-supply operation (對比ADC12D1800CIYB)
- Built-in interleave mode for 1 GSPS single-channel operation (對比Discrete external interleaver with two ADCs)
設計說明
Separate the analog and digital ground planes and stitch them only at a single point beneath the exposed thermal pad of the 128-HLQFP package, per the TI ADC08D500 datasheet layout section. Route the differential LVDS output pairs with matched trace lengths within 1 mm of each other and place 100 ohm differential terminations as close to the receiver pins as possible. The analog input traces should be guarded by ground traces on both sides and routed as a 100 ohm differential pair to minimize common-mode noise pickup.
The 1.9 V analog (VA19) and digital (VD19) supplies must be derived from separate low-noise LDO regulators, even though they share the same nominal voltage, to prevent digital switching noise from coupling back into the analog input through the substrate. Per the TI datasheet, place 10 uF + 0.1 uF decoupling capacitor pairs at every supply pin, with the 0.1 uF placed within 2 mm of each pin. Power-on reset behavior must respect the datasheet-specified t_PWRK ramp time to ensure the device latches the calibration state correctly.
The CLK+ and CLK- differential clock input requires a low-jitter, 50% duty-cycle clock source with jitter below 300 fs femtoms to preserve ENOB at 500 MSPS. Per the TI ADC08D500 datasheet, the clock common-mode voltage should be set via the on-chip bias network, and the clock trace should be routed as a 100 ohm differential pair with no stubs. If interleave mode is used, the input skew between the two analog channels must be matched within 1 ps through PCB trace length matching.
Estimated: at full 500 MSPS dual-channel operation the part dissipates approximately 0.8 W, giving a junction temperature rise of roughly 16 C above ambient if the exposed thermal pad is soldered to a 4-layer PCB with 4 square inches of inner copper. Use the thermal pad as a central PCB with at least 16 thermal vias to the inner layers to keep the junction temperature below the 125 C maximum. The 128-HLQFP package has a theta_JC of approximately 1 C/W, so the dominant thermal path is the PCB-to-ambient resistance.
合規資訊
The standard ADC08D500CIYB uses a SnPb terminal finish and is non-RoHS-compliant; for RoHS-compliant designs, use the ADC08D500CIYB/NOPB variant which shares the same die and pinout. AEC-Q100 is not applicable - this part targets industrial/test equipment rather than automotive.
