ADC1210S125HN/C1:5 - 12-bit 125MSPS ADC | NXP
Référence : ADC1210S125HN/C1:5 ✓ Actif| Qté | Prix unitaire | Total |
|---|---|---|
| 1 | $32.5 | $32,50 |
| 10 | $29.2 | $292,00 |
| 100 | $25.8 | $2 580,00 |
| 500 | $23.4 | $11 700,00 |
| 1 000 | $21.1 | $21 100,00 |
ADC1210S125HN/C1:5 Présentation
An Analog-to-Digital Converter (ADC) is a mixed-signal data-acquisition component that translates continuous analog voltages into discrete digital codes for processing by FPGAs, DSPs, microcontrollers, or ASICs. Within the broader product hierarchy, the ADC1210S125HN/C1:5 is a high-speed pipelined ADC, a sub-category of Nyquist-rate data converters used in communications, imaging, and instrumentation. The pipelined topology balances conversion speed and power efficiency by partitioning conversion across cascaded low-resolution stages, with the trade-off of a fixed number of clock-cycle latency that simplifies digital host synchronization.
Key features include user-selectable 65, 80, 105, or 125 MSPS operation, flexible CMOS/LVDS DDR output modes for FPGA/ASIC interface compatibility, internal bandgap reference with external override, and built-in input common-mode adjustment for transformer-coupled or single-ended drive. The 40-HVQFN package with exposed pad (SOT618-1 / MO-220) gives thermal resistance low enough to handle typical dissipation without external heatsinking.
Typical applications are high-density medical imaging front ends, cable DOCSIS edge digitizers, wireless IF baseband receivers, and radar/sonar pre-processing channels. The pipelined latency and DDR outputs are well-suited to FPGA-based digital downconversion.
When designing with this part, route analog inputs as 50 ohm differential microstrip with controlled impedance, place the decoupling capacitors within 2 mm of the supply pins, and follow the datasheet layout guidance for the exposed pad (EP) thermal connection to a continuous ground plane.
Alternatives de remplacement direct pour ADC1210S125HN/C1:5 — même boîtier, compatible broche à broche. Les références à boîtier différent nécessitant une retouche du PCB sont exclues.
Variantes de cette série
Modèles de la même série directement compatibles avec ADC1210S125HN/C1:5 (même facteur de forme et même empreinte) — différant par Package, Resolution, Operating Temperature, Digital Output Interface, Input Type.
Outil de comparaison rapide — sélectionnez des références alternatives pour une comparaison côte à côte :
ADC1015S125HN/C1
✅ Remplacement direct ⚠️ Spécifications non vérifiées✓ En stock
$10.4 / unité
Voir la fiche technique →ADC1010S125HN/C1:5
✅ Remplacement direct✓ En stock
$22.1 / unité
Voir la fiche technique →ADC1210S065HN/C1
✅ Remplacement direct✓ En stock
$8.4 / unité
Voir la fiche technique →ADC1010S105HN/C1:5
✅ Remplacement direct✓ En stock
$9.62 / unité
Voir la fiche technique →ADC1012D080HN/C1:5
✅ Remplacement direct✓ En stock
$12.1 / unité
Voir la fiche technique →ADC1210S125HN/C1:5 Valeurs maximales et caractéristiques électriques
| Résolution | 12 bit |
| Number of Channels | 1 |
| Sample Rate | 125 MSPS |
| Input Type | Differential, Single-Ended |
| Data Interface | CMOS / LVDS DDR |
| Architecture | Pipelined |
| Boîtier | HVQFN-40 (6x6 mm) SOT618-1, MO-220 |
| Package Height | 0.85 mm |
| Température de fonctionnement | -40C to +85C |
| Screening Level | Industrial |
| Nombre de broches | 40 |
| Type de montage | Surface Mount |
| Reference Type | Internal / External |
| Statut RoHS | Compliant |
| Lead-Free | Yes |
Configuration des broches de ADC1210S125HN/C1:5
| Broche 1 | AVDD — Analog supply voltage |
| Broche 2 | VIN+ — Differential analog input positive |
| Broche 3 | VIN- — Differential analog input negative |
| Broche 4 | VCM — Common-mode voltage output |
| Broche 5 | REFT — Top reference decoupling |
| Broche 6 | REFB — Bottom reference decoupling |
| Broche 7 | VREF — Reference voltage I/O |
| Broche 8 | AGND — Analog ground |
| Broche 9 | CLK+ — Differential clock input positive |
| Broche 10 | CLK- — Differential clock input negative |
| Broche 11 | DRVDD — Digital output supply |
| Broche 12 | DRGND — Digital ground |
| Broche 13 | D0_0 — LVDS/CMOS data output bit 0 (LSB lane 0) |
| Broche 14 | D0_1 — LVDS/CMOS data output bit 1 (lane 0) |
| Broche 15 | D0_2 — LVDS/CMOS data output bit 2 (lane 0) |
| Broche 16 | D0_3 — LVDS/CMOS data output bit 3 (lane 0) |
| Broche 17 | D0_4 — LVDS/CMOS data output bit 4 (lane 0) |
| Broche 18 | D0_5 — LVDS/CMOS data output bit 5 (lane 0) |
| Broche 19 | D0_6 — LVDS/CMOS data output bit 6 (lane 0) |
| Broche 20 | D0_7 — LVDS/CMOS data output bit 7 (lane 0) |
| Broche 21 | D0_8 — LVDS/CMOS data output bit 8 (lane 0) |
| Broche 22 | D0_9 — LVDS/CMOS data output bit 9 (lane 0) |
| Broche 23 | D0_10 — LVDS/CMOS data output bit 10 (lane 0) |
| Broche 24 | D0_11 — LVDS/CMOS data output bit 11 (MSB lane 0) |
| Broche 25 | DCLK — LVDS/CMOS data clock output |
| Broche 26 | DRGND — Digital ground |
| Broche 27 | DRVDD — Digital output supply |
| Broche 28 | OGND — Output driver ground |
| Broche 29 | OVDD — Output driver supply |
| Broche 30 | CS — Chip select / serial interface enable |
| Broche 31 | SCLK — Serial interface clock |
| Broche 32 | SDIO — Serial interface data I/O |
| Broche 33 | SDO — Serial interface data output |
| Broche 34 | RESET — Active-low chip reset |
| Broche 35 | PD — Active-low power down |
| Broche 36 | MODE — Output mode select (CMOS / LVDS DDR) |
| Broche 37 | AVDD — Analog supply voltage |
| Broche 38 | AVDD — Analog supply voltage |
| Broche 39 | AGND — Analog ground |
| Broche 40 | AGND — Analog ground |
Applications typiques
ADC1210S125HN/C1:5 convient pour 6 applications: Medical Imaging (Ultrasound / OCT), Cable / Broadband DOCSIS Edge Digitizer, Wireless IF Baseband Receiver, Radar / Sonar Pre-Processing, Industrial Test & Measurement Instrumentation, Imaging / Video Broadcast Processing.
Medical Imaging (Ultrasound / OCT)
The ADC1210S125HN/C1:5 fits ultrasound beamformer and OCT receiver front ends because its 12-bit resolution and 125 MSPS sample rate give adequate dynamic range for mid-tier imaging channels. The differential analog input accepts transformer-coupled transducer drive with the datasheet-recommended input network, while the LVDS DDR output mode streams samples directly into an FPGA-based beamforming pipeline. Compared to lower-speed medical ADCs (40-65 MSPS), the 125 MSPS rate captures wider IF bandwidth and supports harmonic imaging without aliasing. The 40-HVQFN exposed pad provides thermal headroom for the dense channel counts typical of phased-array ultrasound probes.
Recommandé
Cable / Broadband DOCSIS Edge Digitizer
Cable edge QAM/DOCSIS receivers demand 100+ MSPS ADCs with strong SFDR to capture multi-MHz channel bands without aliasing. The ADC1210S125HN/C1:5's 125 MSPS rate comfortably samples the upstream cable spectrum at baseband, and its LVDS DDR outputs route cleanly to DOCSIS MAC/FPGA processors over controlled-impedance differential traces. The selectable CMOS mode simplifies designs targeting lower-cost ASIC MACs. Compared to integrated tuner solutions, a discrete ADC1210S125HN/C1:5 + FPGA chain gives designers flexibility to tune anti-alias filtering and channelization for evolving DOCSIS 3.1 / 4.0 requirements.
Recommandé
Wireless IF Baseband Receiver
The ADC1210S125HN/C1:5 suits wireless IF baseband digitizers in software-defined radio (SDR) and small-cell base station receivers, where 12-bit / 125 MSPS captures IF bandwidths of 30-60 MHz with sufficient dynamic range. The differential analog input accepts direct IF sampling from the mixer output, removing the need for a final downconversion stage in many architectures. Its LVDS DDR outputs feed FPGAs implementing DDC (digital downconversion), CIC filtering, and channelization. Compared to 14-16 bit parts at this speed, the 12-bit ADC trades dynamic range for lower power - appropriate for non-AFE critical SDR chains.
Recommandé
Radar / Sonar Pre-Processing
Radar IF digitizers and sonar beamforming channels benefit from the ADC1210S125HN/C1:5's combination of 12-bit resolution, 125 MSPS rate, and pipelined deterministic latency. Pipelined ADCs introduce a fixed clock-cycle latency that simplifies multi-channel phase alignment - critical for phased-array beamforming. The LVDS DDR outputs maintain timing integrity over the backplane distances typical of sonar arrays. Compared to lower-rate SAR ADCs, the pipelined architecture avoids per-sample conversion overhead and supports continuous streaming at full bandwidth without throughput gaps.
Recommandé
Industrial Test & Measurement Instrumentation
Test and measurement digitizer cards (oscilloscope channels, spectrum analyzer IFs, data-acquisition boards) commonly use 12-bit 100-125 MSPS ADCs like the ADC1210S125HN/C1:5 for accurate waveform capture at MHz bandwidths. The selectable CMOS or LVDS DDR output mode lets designers route signals to FPGAs or to backplane connectors for multi-channel synchronization. The exposed-pad HVQFN package improves thermal performance when digitizer channels are densely populated. Compared to higher-resolution (16-bit) ADCs at the same speed, the 12-bit ADC1210S125HN/C1:5 offers lower cost and lower power while still meeting typical mid-tier instrument accuracy requirements.
Recommandé
Imaging / Video Broadcast Processing
Professional video broadcast and image processing systems use 12-bit ADCs at 100+ MSPS for component video digitizing, video capture cards, and broadcast signal processing. The ADC1210S125HN/C1:5's selectable CMOS outputs and LVDS DDR mode give flexibility to interface directly to broadcast ASICs or high-speed FPGAs handling real-time video pipelines. The differential input rejects common-mode noise from long cable runs typical in broadcast environments. Compared to dedicated video ADCs with embedded clamping, the ADC1210S125HN/C1:5 requires external input conditioning but provides wider sample-rate flexibility for non-standard video formats.
Recommandé
Récapitulatif des produits recommandés
Données de référence d'ingénierie pour ADC1210S125HN/C1:5 — comparaison, recommandations de conception et informations de conformité.
Guide de sélection
Comparaison avec les alternatives
| Paramètre | Ce produit | ADC1015S125HN/C1 | ADC1010S125HN/C1:5 | ADC1210S065HN/C1 | ADC1010S105HN/C1:5 | ADC1012D080HN/C1:5 |
|---|---|---|---|---|---|---|
| Package | HVQFN-40 (6x6 mm) | HVQFN-40 (6x6 mm) - same | HVQFN-40 (6x6 mm) - same | HVQFN-40 (6x6 mm) - same | HVQFN-40 (6x6 mm) - same | HVQFN-40 (6x6 mm) - same |
| Brand | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors |
| Resolution | 12 bit | 10 bit | 10 bit | 12 bit | 10 bit | 10 bit |
| Sample Rate | 125 MSPS | 125 MSPS | 125 MSPS | 65 MSPS | 105 MSPS | 80 MSPS |
| Number of Channels | 1 | 1 | 1 | 1 | 1 | 2 |
| Architecture | Pipelined | Pipelined | Pipelined | Pipelined | Pipelined | Pipelined |
| Output Interface | CMOS / LVDS DDR | CMOS / LVDS DDR | CMOS / LVDS DDR | CMOS / LVDS DDR | CMOS / LVDS DDR | CMOS / LVDS DDR |
| Operating Temperature | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C |
Principaux différenciateurs
- Selectable CMOS / LVDS DDR outputs (vs ADC1210S065HN/C1)
- 12-bit resolution at 125 MSPS (vs ADC1015S125HN/C1)
- Single 12-bit channel at full speed (vs ADC1012D080HN/C1:5)
Notes de conception
Route analog inputs (VIN+/VIN-) and clock inputs (CLK+/CLK-) as 50 ohm controlled-impedance differential microstrip pairs with reference plane on the layer immediately below. Place input common-mode network within 5 mm of the input pins and isolate the analog section from the digital output section with a continuous ground moat - this prevents digital switching noise from coupling into the sensitive analog front end.
Decouple AVDD and DRVDD supplies with separate ferrite beads or filter inductors, then place a 0.1 uF ceramic capacitor within 2 mm of each supply pin plus a 10 uF bulk capacitor per supply rail. Avoid sharing analog and digital supply planes - the ADC1210S125HN/C1:5 datasheet specifies independent AVDD/DRVDD/OVDD pins precisely to prevent digital switching transients from modulating the analog front end and degrading SFDR.
The HVQFN-40 exposed pad (EP) is the primary thermal dissipation path - solder it to a continuous ground plane with thermal vias (5x5 array of 0.3 mm vias recommended) connecting to inner ground layers. Without proper EP soldering, junction temperature can rise 20-30C above expected at 125 MSPS operation, degrading long-term reliability. Estimated: at typical 1.0W dissipation and JEDEC EIA/JESD51 test board, theta_JA is ~30 C/W.
Clock jitter directly limits achievable SNR at high input frequencies - use a low-jitter clock source (jitter < 1 ps rms) and route the clock traces symmetrically with matched length for CLK+/CLK-. The LVDS DDR mode doubles the per-pin data rate; ensure the FPGA receiver supports the resulting 250 Mbps DDR rate per data lane. Do not exceed the maximum AVDD supply voltage rating or omit the VCM decoupling capacitor (10 uF ceramic).
Informations de conformité
RoHS and lead-free compliance stated on distributor listings. AEC-Q100 automotive qualification not available for this industrial-grade part; no -Q1 automotive variant listed by NXP. REACH and halogen-free status not explicitly stated in verified web data.
