EP610IDC-10 vs EP610DC-10 Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EP610IDC-10 sa pamamagitan ng Intel at EP610DC-10 sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EP610IDC-10 | EP610DC-10 |
|---|---|---|
| Brand | Intel | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | Obsolete |
| Device Family | Altera Classic EPLD | Altera Classic EPLD |
| Logic Capacity | 300 usable gates | — |
| Macrocell Count | 16 macrocells | — |
| Pin-to-Pin Logic Delay (tpd) | 10 ns | — |
| Maximum Counter Frequency (fCNT) | 100 MHz | — |
| Supply Voltage (VCC) | 5 V (nominal) | — |
| I/O Logic Compatibility | 100% TTL emulation | — |
| Technology | CMOS, UV-erasable (windowed ceramic) | CMOS, EPROM-based (UV-erasable) |
| Package Type | 24-pin Ceramic DIP (CDIP) | — |
| Dedicated Inputs | 4 | — |
| I/O Pins | 20 | [DATA_NEEDED: exact I/O count for CDIP-24 variant] |
| Hanay ng Temperature na Operasyon | 0 °C to +70 °C (commercial) | — |
| Programmable Interconnect | Yes (on-chip) | — |
| In-System Programmability | Yes (via MAX+PLUS II) | — |
| Boundary-Scan Test | Yes (per device documentation) | — |
| Tindminan RoHS | [DATA_NEEDED: RoHS status of CDIP-10 variant] | [DATA_NEEDED: not stated in verified web data] |
| Uri ng Pagpapasok | Through-hole | Through-Hole |
| Macrocells | — | 16 |
| Maximum Pipelined Data Rate | — | 100 MHz |
| Pin-to-Pin Propagation Delay (tpd) | — | 10 ns |
| Speed Grade | — | -10 |
| Packhaging | — | 24-pin CDIP (Ceramic DIP, windowed) |
| Volte ng Pagbibigay | — | 5 V (single supply) |
| Temperature na Operasyon | — | 0C to +70C (commercial) |
| Logic Elements | — | 16 macrocells (programmable AND/OR array) |
| Configuration Memory | — | UV-erasable EPROM |
| Reprogrammable | — | Yes (UV erase window on package) |