K9DVGB8U5M vs K9PDG08U5M 비교
다음의 상세 나란히 비교: K9DVGB8U5M 제조: Samsung Electronics 및 K9PDG08U5M 제조: Samsung Electronics. 주요 사양, 전기적 파라미터, 패키징, 수명 주기 상태, 가격 및 재고를 비교하여 설계 요구 사항에 가장 적합한 부품을 결정하십시오.
사양 비교
| 파라미터 | K9DVGB8U5M | K9PDG08U5M |
|---|---|---|
| 브랜드 | Samsung Electronics | Samsung Electronics |
| 카테고리 | Memory ICs | EEPROM |
| 수명 주기 상태 | 활성 | 수명 종료 |
| 재고 상태 | In Stock | In Stock |
| 단가 (USD) | $3.05 | $4.20 |
| 메모리 유형 | NAND Flash | NAND Flash (SLC) |
| 메모리 구성 | [DATA_NEEDED: capacity organization] | x8 (multiplexed I/O) |
| 인터페이스 | Asynchronous x8-bit I/O | — |
| 공급 전압 | [DATA_NEEDED: VCC range] | [DATA_NEEDED: supply voltage range] |
| 패키지 | [DATA_NEEDED: package type and dimensions] | TSOP1-48 |
| 실장 유형 | Surface Mount | Surface Mount |
| Page Size | [DATA_NEEDED: main page size] | [DATA_NEEDED: page size] |
| Block Size | [DATA_NEEDED: erase block size] | [DATA_NEEDED: block size] |
| Read Time (tR) | [DATA_NEEDED: page read cycle time] | — |
| Program Time (tPROG) | [DATA_NEEDED: page program time] | — |
| Erase Time (tBERS) | [DATA_NEEDED: block erase time] | — |
| Endurance | [DATA_NEEDED: program/erase cycles] | [DATA_NEEDED: program/erase cycles] |
| Data Retention | [DATA_NEEDED: retention specification] | — |
| 동작 온도 | [DATA_NEEDED: temperature range] | [DATA_NEEDED: operating temperature range] |
| Access Interface Signals | CLE, ALE, WE, RE, CE, R/B, WP | — |
| Bad Block Management | Host-managed (controller ECC and bad-block table required) | — |
| RoHS 상태 | [DATA_NEEDED: RoHS compliance] | [DATA_NEEDED: RoHS status] |
| Density | — | 4 Gbit |
| Page Read Time | — | [DATA_NEEDED: page read time] |
| Page Program Time | — | [DATA_NEEDED: page program time] |
| Block Erase Time | — | [DATA_NEEDED: block erase time] |
| Access Interface | — | Asynchronous multiplexed address/data, CLE/ALE control |
| Ready/Busy Output | — | Yes (R/B, open-drain) |
| Write Protect Pin | — | Yes (/WP) |