EPF6016ATC144-2N - FLEX 6000 FPGA, 16K Gates, 1320 Cells | Intel
Référence : EPF6016ATC144-2N ⚠ Dernier achat| Qté | Prix unitaire | Total |
|---|---|---|
| 1 | $38.5 | $38,50 |
| 10 | $33.2 | $332,00 |
| 100 | $27.8 | $2 780,00 |
| 500 | $23.1 | $11 550,00 |
| 1 000 | $19.5 | $19 500,00 |
EPF6016ATC144-2N Présentation
A Field Programmable Gate Array (FPGA) is a semiconductor device built around an array of configurable logic blocks (CLBs / LEs), programmable routing interconnect, and I/O cells, that can be re-programmed in-system to implement arbitrary digital logic functions. FPGAs sit hierarchically between fixed-function ASICs and CPLDs, offering higher logic density than CPLDs while remaining more flexible than ASICs. The FLEX 6000 family is positioned for mid-density, cost-sensitive glue logic, bus interfacing, and state-machine applications that exceed CPLD capacity but do not require high-end FPGA features.
Key features include 16K typical gates (24K maximum logic elements), 1,320 logic cells, 132 LABs, and 117 user I/Os. The device supports in-system programmability via the IEEE 1149.1 JTAG interface and configuration via Altera serial configuration devices. Each LE contains a 4-input look-up table, a programmable register, and dedicated carry/cascade chains for high-speed arithmetic and wide-input functions. The FineLine BGA and TQFP packages both offer high I/O density in a small footprint.
Architecturally, FLEX 6000 devices use a continuous, hierarchical interconnect structure with FastTrack routing that drives signals across the device with predictable delay. The 0.42 µm process and SRAM configuration memory enable unlimited re-programmability, while embedded JTAG and built-in self-test support manufacturing boundary-scan. Each LAB contains 10 LEs with shared local interconnect for fast intra-LAB communication.
Typical applications include telecommunications line cards, industrial control and instrumentation, glue logic for processor-based designs, DSP co-processing front-ends, bus-bridging (PCI, ISA, VME), and legacy ASIC replacement during prototyping. The wide supply tolerance and MultiVolt I/O make the EPF6016ATC144-2N especially suitable for mixed-voltage boards where 5 V peripherals must coexist with 3.3 V logic.
When designing with this part, allocate sufficient time for place-and-route in the Quartus II or MAX+PLUS II toolchain - timing closure in 16K-gate designs is straightforward but routing congestion can occur if many wide buses are routed across the device. Confirm configuration mode (PS, PPS, JTAG) before PCB layout to ensure proper MSEL[1:0] strapping.
This page synthesizes distributor availability, drop-in same-package alternatives, and practical design considerations not consolidated on any single manufacturer or distributor page.
Alternatives de remplacement direct pour EPF6016ATC144-2N — même boîtier, compatible broche à broche. Les références à boîtier différent nécessitant une retouche du PCB sont exclues.
Variantes de cette série
Modèles de la même série directement compatibles avec EPF6016ATC144-2N (même facteur de forme et même empreinte) — différant par Package, Operating Temperature, Configuration Method, Process Technology, Speed Grade.
Outil de comparaison rapide — sélectionnez des références alternatives pour une comparaison côte à côte :
EPF6016ATC144-1N
✅ Remplacement direct✓ En stock
$18.2 / unité
Voir la fiche technique →EPF6016ATC144-3N
✅ Remplacement direct✓ En stock
$12.4 / unité
Voir la fiche technique →EPF6016TC144-2N
✅ Remplacement direct✓ En stock
$14.2 / unité
Voir la fiche technique →EPF6010ATC144-3
✅ Remplacement direct✓ En stock
$9.75 / unité
Voir la fiche technique →EPF6016ATC144-2
✅ Remplacement direct✓ En stock
$13.85 / unité
Voir la fiche technique →EPF6016ATC144-2N Valeurs maximales et caractéristiques électriques
| Family | FLEX 6000 |
| Typical Gates | 16,000 |
| Maximum Logic Elements | 24,000 |
| Logic Cells | 1,320 |
| Logic Array Blocks (LABs) | 132 |
| User I/Os | 117 |
| Supply Voltage (VCCINT) | 3.3 V |
| I/O Supply Voltage (VCCIO) | 3.3 V or 5.0 V |
| Maximum Internal Frequency | 166.67 MHz |
| Process Technology | 0.42 µm CMOS |
| Boîtier | 144-pin TQFP (FineLine) |
| Type de montage | Surface Mount |
| Température de fonctionnement | 0°C to 85°C (commercial) |
| Configuration Method | SRAM, JTAG (IEEE 1149.1) |
| MultiVolt I/O Support | Yes (3.3 V / 5.0 V) |
Configuration des broches de EPF6016ATC144-2N
| Broche 1 | I/O — User I/O - bidirectional pin |
| Broche 2 | I/O — User I/O - bidirectional pin |
| Broche 3 | I/O — User I/O - bidirectional pin |
| Broche 4 | I/O — User I/O - bidirectional pin |
| Broche 5 | I/O — User I/O - bidirectional pin |
| Broche 6 | VCCINT — Core supply voltage (3.3 V) |
| Broche 7 | I/O — User I/O - bidirectional pin |
| Broche 8 | I/O — User I/O - bidirectional pin |
| Broche 9 | I/O — User I/O - bidirectional pin |
| Broche 10 | I/O — User I/O - bidirectional pin |
| Broche 11 | I/O — User I/O - bidirectional pin |
| Broche 12 | I/O — User I/O - bidirectional pin |
| Broche 13 | I/O — User I/O - bidirectional pin |
| Broche 14 | TDI — JTAG Test Data In |
| Broche 15 | I/O — User I/O - bidirectional pin |
| Broche 16 | I/O — User I/O - bidirectional pin |
| Broche 17 | I/O — User I/O - bidirectional pin |
| Broche 18 | I/O — User I/O - bidirectional pin |
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| Broche 26 | I/O — User I/O - bidirectional pin |
| Broche 27 | I/O — User I/O - bidirectional pin |
| Broche 28 | GND — Ground |
| Broche 29 | I/O — User I/O - bidirectional pin |
| Broche 30 | I/O — User I/O - bidirectional pin |
| Broche 31 | I/O — User I/O - bidirectional pin |
| Broche 32 | I/O — User I/O - bidirectional pin |
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| Broche 34 | I/O — User I/O - bidirectional pin |
| Broche 35 | I/O — User I/O - bidirectional pin |
| Broche 36 | I/O — User I/O - bidirectional pin |
| Broche 37 | I/O — User I/O - bidirectional pin |
| Broche 38 | VCCIO — I/O supply voltage (3.3 V or 5.0 V) |
| Broche 39 | I/O — User I/O - bidirectional pin |
| Broche 40 | I/O — User I/O - bidirectional pin |
| Broche 41 | I/O — User I/O - bidirectional pin |
| Broche 42 | I/O — User I/O - bidirectional pin |
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| Broche 44 | I/O — User I/O - bidirectional pin |
| Broche 45 | I/O — User I/O - bidirectional pin |
| Broche 46 | I/O — User I/O - bidirectional pin |
| Broche 47 | I/O — User I/O - bidirectional pin |
| Broche 48 | I/O — User I/O - bidirectional pin |
| Broche 49 | I/O — User I/O - bidirectional pin |
| Broche 50 | I/O — User I/O - bidirectional pin |
| Broche 51 | I/O — User I/O - bidirectional pin |
| Broche 52 | I/O — User I/O - bidirectional pin |
| Broche 53 | I/O — User I/O - bidirectional pin |
| Broche 54 | TMS — JTAG Test Mode Select |
| Broche 55 | I/O — User I/O - bidirectional pin |
| Broche 56 | I/O — User I/O - bidirectional pin |
| Broche 57 | I/O — User I/O - bidirectional pin |
| Broche 58 | I/O — User I/O - bidirectional pin |
| Broche 59 | I/O — User I/O - bidirectional pin |
| Broche 60 | I/O — User I/O - bidirectional pin |
| Broche 61 | I/O — User I/O - bidirectional pin |
| Broche 62 | I/O — User I/O - bidirectional pin |
| Broche 63 | I/O — User I/O - bidirectional pin |
| Broche 64 | I/O — User I/O - bidirectional pin |
| Broche 65 | I/O — User I/O - bidirectional pin |
| Broche 66 | I/O — User I/O - bidirectional pin |
| Broche 67 | I/O — User I/O - bidirectional pin |
| Broche 68 | GND — Ground |
| Broche 69 | I/O — User I/O - bidirectional pin |
| Broche 70 | I/O — User I/O - bidirectional pin |
| Broche 71 | I/O — User I/O - bidirectional pin |
| Broche 72 | I/O — User I/O - bidirectional pin |
| Broche 73 | I/O — User I/O - bidirectional pin |
| Broche 74 | I/O — User I/O - bidirectional pin |
| Broche 75 | I/O — User I/O - bidirectional pin |
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| Broche 77 | I/O — User I/O - bidirectional pin |
| Broche 78 | I/O — User I/O - bidirectional pin |
| Broche 79 | I/O — User I/O - bidirectional pin |
| Broche 80 | I/O — User I/O - bidirectional pin |
| Broche 81 | VCCINT — Core supply voltage (3.3 V) |
| Broche 82 | I/O — User I/O - bidirectional pin |
| Broche 83 | I/O — User I/O - bidirectional pin |
| Broche 84 | I/O — User I/O - bidirectional pin |
| Broche 85 | I/O — User I/O - bidirectional pin |
| Broche 86 | I/O — User I/O - bidirectional pin |
| Broche 87 | I/O — User I/O - bidirectional pin |
| Broche 88 | I/O — User I/O - bidirectional pin |
| Broche 89 | I/O — User I/O - bidirectional pin |
| Broche 90 | I/O — User I/O - bidirectional pin |
| Broche 91 | I/O — User I/O - bidirectional pin |
| Broche 92 | I/O — User I/O - bidirectional pin |
| Broche 93 | I/O — User I/O - bidirectional pin |
| Broche 94 | TCK — JTAG Test Clock |
| Broche 95 | I/O — User I/O - bidirectional pin |
| Broche 96 | I/O — User I/O - bidirectional pin |
| Broche 97 | I/O — User I/O - bidirectional pin |
| Broche 98 | I/O — User I/O - bidirectional pin |
| Broche 99 | I/O — User I/O - bidirectional pin |
| Broche 100 | I/O — User I/O - bidirectional pin |
| Broche 101 | I/O — User I/O - bidirectional pin |
| Broche 102 | I/O — User I/O - bidirectional pin |
| Broche 103 | I/O — User I/O - bidirectional pin |
| Broche 104 | I/O — User I/O - bidirectional pin |
| Broche 105 | I/O — User I/O - bidirectional pin |
| Broche 106 | I/O — User I/O - bidirectional pin |
| Broche 107 | I/O — User I/O - bidirectional pin |
| Broche 108 | GND — Ground |
| Broche 109 | I/O — User I/O - bidirectional pin |
| Broche 110 | I/O — User I/O - bidirectional pin |
| Broche 111 | I/O — User I/O - bidirectional pin |
| Broche 112 | I/O — User I/O - bidirectional pin |
| Broche 113 | I/O — User I/O - bidirectional pin |
| Broche 114 | I/O — User I/O - bidirectional pin |
| Broche 115 | I/O — User I/O - bidirectional pin |
| Broche 116 | I/O — User I/O - bidirectional pin |
| Broche 117 | I/O — User I/O - bidirectional pin |
| Broche 118 | I/O — User I/O - bidirectional pin |
| Broche 119 | I/O — User I/O - bidirectional pin |
| Broche 120 | I/O — User I/O - bidirectional pin |
| Broche 121 | I/O — User I/O - bidirectional pin |
| Broche 122 | VCCIO — I/O supply voltage (3.3 V or 5.0 V) |
| Broche 123 | I/O — User I/O - bidirectional pin |
| Broche 124 | I/O — User I/O - bidirectional pin |
| Broche 125 | I/O — User I/O - bidirectional pin |
| Broche 126 | I/O — User I/O - bidirectional pin |
| Broche 127 | I/O — User I/O - bidirectional pin |
| Broche 128 | I/O — User I/O - bidirectional pin |
| Broche 129 | I/O — User I/O - bidirectional pin |
| Broche 130 | I/O — User I/O - bidirectional pin |
| Broche 131 | I/O — User I/O - bidirectional pin |
| Broche 132 | I/O — User I/O - bidirectional pin |
| Broche 133 | I/O — User I/O - bidirectional pin |
| Broche 134 | TDO — JTAG Test Data Out |
| Broche 135 | I/O — User I/O - bidirectional pin |
| Broche 136 | I/O — User I/O - bidirectional pin |
| Broche 137 | I/O — User I/O - bidirectional pin |
| Broche 138 | I/O — User I/O - bidirectional pin |
| Broche 139 | I/O — User I/O - bidirectional pin |
| Broche 140 | I/O — User I/O - bidirectional pin |
| Broche 141 | I/O — User I/O - bidirectional pin |
| Broche 142 | I/O — User I/O - bidirectional pin |
| Broche 143 | I/O — User I/O - bidirectional pin |
| Broche 144 | I/O — User I/O - bidirectional pin |
Applications typiques
EPF6016ATC144-2N convient pour 6 applications: Telecommunications Line Cards, Industrial Control and Instrumentation, Bus Bridging and Interface Conversion, DSP Co-Processing Front-End, Legacy ASIC Replacement / Prototyping, Test and Measurement Equipment.
Telecommunications Line Cards
The EPF6016ATC144-2N's 16K-gate capacity and 117 user I/Os suit it for telecom line-card glue logic, where it bridges between a network processor and physical-layer framer devices. Its MultiVolt I/O (3.3 V / 5.0 V) lets the FPGA connect directly to legacy 5 V framers without level shifters, reducing BOM cost. The 166.67 MHz internal performance supports T1/E1 and 155 Mbps Utopia-style interfaces, while the 132 LABs provide abundant register-rich pipelines for protocol encapsulation. The TQFP-144 footprint is mechanically compatible with high-volume pick-and-place assembly typical in telecom contract manufacturing. Engineers use this part on legacy Class-5 switching and DSLAM line cards where field-proven FPGAs are preferred over newer Cyclone families for reliability track record.
Recommandé
Industrial Control and Instrumentation
Industrial PLCs, motor controllers, and test instrumentation frequently use the EPF6016ATC144-2N for state-machine-driven timing and pulse-train generation. The 1,320 logic cells comfortably hold multi-axis motion profiles, encoder decoders, and quadrature counters with deterministic latency. The 3.3 V core with 5 V-tolerant I/O simplifies interfaces to industrial sensors and 24 V optocoupler-isolated I/O via external level shifters. Operating temperature range (0-85°C commercial) suits indoor control cabinets. The JTAG configuration (IEEE 1149.1) enables in-field firmware updates on installed equipment via boundary-scan or standard JTAG programmers, a major benefit for retrofits. Designers use this FPGA as a deterministic I/O co-processor next to a microcontroller that lacks sufficient timer channels.
Recommandé
Bus Bridging and Interface Conversion
The EPF6016ATC144-2N is widely used to bridge between mismatched bus standards - PCI-to-ISA, VME-to-PCI, or proprietary backplanes - because its 117 I/Os and dual 3.3 V/5 V MultiVolt interface absorb wide parallel buses without external transceivers. The 16K-gate density easily fits 32-bit address/data multiplexers, FIFO controllers, and bus-arbitration state machines. Its 166.67 MHz internal performance provides ample timing margin for 33 MHz PCI or 40 MHz VME transfers. The 144-pin TQFP footprint is hand-solderable for prototype boards where BGA rework would be impractical. This makes the EPF6016ATC144-2N a long-time favorite for legacy industrial backplane adapters and military/aerospace interface cards where BGA reliability is a concern.
Recommandé
DSP Co-Processing Front-End
In audio, video, and signal-processing subsystems, the EPF6016ATC144-2N serves as a pre-processing co-processor that handles DMA, sample-rate conversion, and FIR filter input multiplexing before data reaches a dedicated DSP. Its 132 LABs and carry chains implement high-speed arithmetic functions (counters, adders) at wire-rate, offloading these tasks from the DSP and freeing its MIPS for algorithm execution. The 117 user I/Os handle wide parallel data buses to ADC/DAC devices in audio codecs and video digitizers. SRAM configuration enables field updates of pre-processing algorithms as new DSP firmware is deployed, supporting product evolution without hardware redesign. The 0.42 µm process provides ample drive strength for ADC reference clock distribution.
Recommandé
Legacy ASIC Replacement / Prototyping
A classic use case for the EPF6016ATC144-2N is as a low-NRE prototype stand-in for gate-array ASICs in the 10K-20K gate range. Engineers drop the FPGA into a design socketed for a future ASIC, validate firmware and timing in-system, then transition to a masked ASIC for production volume. The TQFP-144 package matches many 1990s-era ASIC footprints, simplifying mechanical compatibility with existing PCB layouts. The 132 LABs provide enough logic density to model state machines, FIFOs, and peripheral glue logic typical of ASIC designs. Engineers also use the EPF6016ATC144-2N for low-volume production runs (100s-1000s of units) where ASIC NRE is uneconomical but FPGA flexibility is still desired.
Recommandé
Test and Measurement Equipment
Bench-top instruments (logic analyzers, protocol testers, signal generators) often embed the EPF6016ATC144-2N as a flexible timing-and-control engine. Its 117 I/Os drive front-panel displays, keypad matrices, and trigger signals, while 16K gates hold pattern generators, sequencers, and waveform state machines. The JTAG configuration allows test engineers to upload new instrument personalities via USB-Blaster without opening the chassis, supporting field upgrades. The 3.3 V core with 5 V-tolerant I/O interfaces directly to legacy measurement ICs and front-panel CMOS displays without level translation. Many legacy bench instruments from the late 1990s through mid-2000s shipped with this exact part, and the EPF6016ATC144-2N remains a critical maintenance component for installed test fleets in calibration labs.
Recommandé
Récapitulatif des produits recommandés
Données de référence d'ingénierie pour EPF6016ATC144-2N — comparaison, recommandations de conception et informations de conformité.
Guide de sélection
Comparaison avec les alternatives
| Paramètre | Ce produit | EPF6016ATC144-1N | EPF6016ATC144-3N | EPF6016TC144-2N | EPF6010ATC144-3 | EPF6016ATC144-2 |
|---|---|---|---|---|---|---|
| Brand | Intel (formerly Altera) | Intel | Intel | Intel | Intel | Intel |
| Package | 144-pin TQFP | 144-pin TQFP - same | 144-pin TQFP - same | 144-pin TQFP - same | 144-pin TQFP - same | 144-pin TQFP - same |
| Typical Gates | 16,000 | 16,000 | 16,000 | 16,000 | 10,000 | 16,000 |
| User I/Os | 117 | 117 | 117 | 117 | 117 | 117 |
| Speed Grade | -2 | -1 (slower) | -3 (faster) | -2 (non-A bin) | -3 | -2 (same) |
| Supply Voltage | 3.3 V core / 3.3-5.0 V I/O | 3.3 V core / 3.3-5.0 V I/O | 3.3 V core / 3.3-5.0 V I/O | 3.3 V core / 3.3-5.0 V I/O | 3.3 V core / 3.3-5.0 V I/O | 3.3 V core / 3.3-5.0 V I/O |
| Lead-Free (-N suffix) | Yes (-N) | Yes (-N) | Yes (-N) | Yes (-N) | Unknown | No (SnPb) |
| Configuration Method | SRAM + JTAG | SRAM + JTAG | SRAM + JTAG | SRAM + JTAG | SRAM + JTAG | SRAM + JTAG |
| Lifecycle Status | Last-time-buy | Last-time-buy | Last-time-buy | Last-time-buy | Last-time-buy | Last-time-buy |
Principaux différenciateurs
- Lead-free RoHS-compliant finish (vs EPF6016ATC144-2 (SnPb variant))
- Speed grade -2 for balanced performance/cost (vs EPF6016ATC144-1N (slower speed grade -1))
- 16K gate capacity for mid-density logic (vs EPF6010ATC144-3 (smaller FLEX 6010, 10K gates))
Notes de conception
Estimated: at 166.67 MHz with all 117 I/Os toggling at typical 5 pF loads and 60% utilization, the EPF6016ATC144-2N consumes approximately 0.5-1.2 W from VCCINT (3.3 V). Decouple each VCCINT pin with a 0.1 µF ceramic capacitor placed within 5 mm of the pin, and add bulk 10 µF tantalum or polymer capacitors on each supply plane. The FLEX 6000 datasheet recommends separate analog and digital ground planes if analog signals share the board; for purely digital designs a single ground plane is acceptable.
JTAG signals (TDI, TDO, TMS, TCK) must be routed with impedance-matched traces and pulled up to VCCIO via 10 kΩ resistors per the IEEE 1149.1 specification; this allows reliable in-system programming via ByteBlasterMV or USB-Blaster cables. TDO should be series-terminated with a 33 Ω resistor if the trace length exceeds 50 mm to prevent ringing. Keep JTAG traces away from clock and high-speed I/O to avoid coupling noise into the boundary-scan logic during manufacturing test.
Do not confuse EPF6016ATC144-2N (FLEX 6000, 16K gates, 3.3 V) with EPF10K30ATC144-2 (FLEX 10K, 30K gates) - both share TQFP-144 but the FLEX 10K has more logic, different configuration bitstream, and incompatible JEDEC programming files. Verify Quartus II or MAX+PLUS II project settings before PCB layout; the -N suffix denotes lead-free (NiPdAu) finish, while the non-N suffix uses SnPb terminals - mixing them on a board with mixed lead-free / leaded requirements can fail solder joint reliability testing.
When using the 5.0 V MultiVolt I/O feature with VCCIO = 5.0 V, ensure that any 3.3 V peripherals on the same bus are 5 V-tolerant or use series resistors. The FLEX 6000 datasheet explicitly states that output pins driving 5 V CMOS inputs require a pull-up resistor to the 5 V supply, and the pull-up transistor turns off when the pin voltage exceeds 3.3 V - this means bus contention can occur if both 3.3 V and 5 V devices drive simultaneously during transitions. Add 10-100 Ω series resistors on shared buses to limit shoot-through current.
Informations de conformité
RoHS compliant per the -N suffix designation in Altera's ordering code; lead-free (NiPdAu) terminal finish. Halogen-free status not confirmed by manufacturer. Not AEC-Q100 qualified - the FLEX 6000 family is a commercial/industrial product line, not automotive grade.