K9XXG08U0M vs K9PDG08U5M 比較
詳細並排比較 K9XXG08U0M 由 Samsung Electronics 與 K9PDG08U5M 由 Samsung Electronics. 比較關鍵規格、電氣參數、封裝、生命週期狀態、價格與供貨情況，以找出最符合您設計需求的元件。
規格比較
| 參數 | K9XXG08U0M | K9PDG08U5M |
|---|---|---|
| 品牌 | Samsung Electronics | Samsung Electronics |
| 類別 | Memory ICs | EEPROM |
| 生命週期狀態 | Obsolete | 停產終止 |
| 記憶體類型 | NAND Flash | NAND Flash (SLC) |
| Density | 8 G-bit | 4 Gbit |
| 組織 | 1G x 8 bit | x8 (multiplexed I/O) |
| Spare Area | 256 M-bit (per K9K8G08U0M) | — |
| 供應電壓 | 2.7 V to 3.6 V (3.3V device) | [DATA_NEEDED: supply voltage range] |
| 介面 | 8-bit parallel NAND (command/address/data multiplexed) | — |
| Page Read Time | 20 us | [DATA_NEEDED: page read time] |
| 封裝 | 48-pin TSOP-I | TSOP1-48 |
| 安裝類型 | Surface Mount | Surface Mount |
| 工作溫度 | [DATA_NEEDED: operating temperature range] | [DATA_NEEDED: operating temperature range] |
| Access Interface Standard | Samsung legacy NAND command set | — |
| Bad Block Management | Factory bad block marking (host-managed ECC required) | — |
| Cell Type | SLC (K9K8G08U0M) / MLC (K9G8G08U0M variants) | — |
| ECC Requirement | External ECC by host controller | — |
| RoHS 狀態 | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS status] |
| MSL 等級 | [DATA_NEEDED: moisture sensitivity level] | — |
| Page Size | — | [DATA_NEEDED: page size] |
| Block Size | — | [DATA_NEEDED: block size] |
| Page Program Time | — | [DATA_NEEDED: page program time] |
| Block Erase Time | — | [DATA_NEEDED: block erase time] |
| Access Interface | — | Asynchronous multiplexed address/data, CLE/ALE control |
| Ready/Busy Output | — | Yes (R/B, open-drain) |
| Write Protect Pin | — | Yes (/WP) |
| Endurance | — | [DATA_NEEDED: program/erase cycles] |