EPF8820ARI208-4 - FLEX 8000 FPGA, 8K Gates, 5V, 208-RQFP | Intel / Altera
MPN: EPF8820ARI208-4 ✗ 停產EPF8820ARI208-4 概覽
An FPGA (Field Programmable Gate Array) is a programmable logic device that combines configurable logic blocks, programmable interconnect, and I/O cells on a single die, allowing engineers to implement custom digital logic without the cost or lead-time of an ASIC. The FLEX 8000 family sits within the hierarchy of programmable logic devices (PLD) and specifically within the SRAM-based FPGA segment - it is volatile and must be configured from an external EPROM, Flash, or microcontroller on every power-up. This makes FLEX 8000 parts well suited to prototyping, low-volume designs, and systems requiring in-system updates via JTAG.
Key features of the EPF8820ARI208-4 include a high-density interconnect structure with four row- and column-based interconnect channels, multi-level routing resources (direct, local, row, and column), and built-in JTAG boundary-scan (IEEE Std 1149.1) for board-level testability. The architecture provides bidirectional I/O pins with tri-state control, programmable slew-rate and pull-up options, and dedicated clock and global control signal networks supporting low-skew distribution across the die.
Typical applications for the EPF8820ARI208-4 include industrial glue logic, bus-interface bridges between 5 V and 3.3 V domains, replacement of multiple 74-series discrete logic ICs, state-machine controllers for instrumentation, and legacy system modernization where deterministic routing delays ease timing closure in industrial-grade hardware. Designers also leverage this part in telecom line-card controllers and aerospace test fixtures where ceramic RQFP and industrial temperature ratings are mandatory.
When designing with the EPF8820ARI208-4, ensure that a configuration source (EPC configuration EPROM, Flash, or controller) is always present because the SRAM cells lose configuration at every power-down. JTAG signals TCK, TMS, TDI, and TDO must be pulled correctly per IEEE 1149.1, and unused I/O pins should be set to tri-state to minimize supply noise. Ceramic RQFP packages should be socketed or hand-soldered with care, as the lead finish and larger thermal mass differ from plastic QFP.
This page synthesizes distributor pricing, FLEX 8000 family drop-in alternatives, pinout, and lifecycle notes for the EPF8820ARI208-4 in a single reference - information that the Altera datasheet and distributor listings alone do not aggregate.
直接替換替代品,適用於 EPF8820ARI208-4 — 相同封裝,腳位對腳位相容。需重新設計 PCB 的不同封裝零件不列入。
此系列的變體
與下列產品可直接替換的同系列型號: EPF8820ARI208-4 (相同外形與佔位) — 差異在於 Package, Process Technology, Usable Gates, Configuration Method, Speed Grade.
EPF8820ARI208-3
✅ 直接替換聯絡詢價
查看資料表 →EPF8820ARI208-3N
✅ 直接替換聯絡詢價
查看資料表 →EPF8820ARI208-2
✅ 直接替換聯絡詢價
查看資料表 →EPF8820ARI208-2N
✅ 直接替換聯絡詢價
查看資料表 →EPF8820ARI208-1
✅ 直接替換聯絡詢價
查看資料表 →EPF8820ARC208-4
✅ 直接替換聯絡詢價
查看資料表 →EPF8820ARC208-4N
✅ 直接替換聯絡詢價
查看資料表 →EPF8820ARI208-4 最大額定值與電氣特性
| Family | FLEX 8000 |
| Device Type | FPGA (SRAM-based) |
| Logic Elements / Cells | 672 |
| Gates (typical) | 8000 |
| Flip-Flops | 820 |
| Process Technology | 0.42 um CMOS |
| Maximum Operating Frequency | 125 MHz |
| Nominal Supply Voltage | 5 V |
| Supply Voltage Range | 4.5 V to 5.5 V |
| I/O Logic Levels | Configurable: 3.3 V or 5 V |
| 封裝 | 208-pin RQFP (RQFP-208) |
| Operating Temperature Grade | Industrial (-40C to +85C) |
| Configuration Method | SRAM - requires external EPC EPROM or controller |
| Boundary Scan | IEEE Std 1149.1 (JTAG) |
| Lead Finish / Package Type | Gull-wing, ceramic RQFP |
EPF8820ARI208-4 腳位配置
| 腳位 1 | I/O — User I/O pin (bank 1) |
| 腳位 2 | I/O — User I/O pin (bank 1) |
| 腳位 3 | VCCINT — Internal core supply 5V |
| 腳位 4 | I/O — User I/O pin (bank 1) |
| 腳位 5 | GND — Ground |
| 腳位 6 | nCONFIG — Configuration control (active low) |
| 腳位 7 | nSTATUS — Configuration status (active low) |
| 腳位 8 | CONF_DONE — Configuration complete indicator |
| 腳位 9 | DCLK — Configuration clock input |
| 腳位 10 | DATA0 — Configuration data input |
| 腳位 11 | TCK — JTAG test clock |
| 腳位 12 | TMS — JTAG test mode select |
| 腳位 13 | TDI — JTAG test data in |
| 腳位 14 | TDO — JTAG test data out |
| 腳位 15 | CLK0 — Dedicated clock input 0 |
| 腳位 16 | CLK1 — Dedicated clock input 1 |
| 腳位 17 | VCCIO — I/O bank supply (3.3V or 5V) |
| 腳位 18 | I/O — User I/O pin (bank 2) |
| 腳位 19 | I/O — User I/O pin (bank 2) |
| 腳位 20 | I/O — User I/O pin (bank 2) |
| 腳位 21 | GND — Ground |
| 腳位 22 | I/O — User I/O pin (bank 2) |
| 腳位 23 | I/O — User I/O pin (bank 2) |
| 腳位 24 | VCCINT — Internal core supply 5V |
| 腳位 25 | I/O — User I/O pin (bank 3) |
| 腳位 26 | I/O — User I/O pin (bank 3) |
| 腳位 27 | I/O — User I/O pin (bank 3) |
| 腳位 28 | GND — Ground |
| 腳位 29 | I/O — User I/O pin (bank 3) |
| 腳位 30 | I/O — User I/O pin (bank 3) |
| 腳位 31 | VCCIO — I/O bank supply (3.3V or 5V) |
| 腳位 32 | I/O — User I/O pin (bank 3) |
| 腳位 33 | I/O — User I/O pin (bank 4) |
| 腳位 34 | I/O — User I/O pin (bank 4) |
| 腳位 35 | GND — Ground |
| 腳位 36 | CLK2 — Dedicated clock input 2 |
| 腳位 37 | CLK3 — Dedicated clock input 3 |
| 腳位 38 | I/O — User I/O pin (bank 4) |
| 腳位 39 | I/O — User I/O pin (bank 4) |
| 腳位 40 | VCCINT — Internal core supply 5V |
| 腳位 41 | I/O — User I/O pin (bank 4) |
| 腳位 42 | I/O — User I/O pin (bank 4) |
| 腳位 43 | I/O — User I/O pin (bank 5) |
| 腳位 44 | GND — Ground |
| 腳位 45 | I/O — User I/O pin (bank 5) |
| 腳位 46 | I/O — User I/O pin (bank 5) |
| 腳位 47 | VCCIO — I/O bank supply (3.3V or 5V) |
| 腳位 48 | I/O — User I/O pin (bank 5) |
| 腳位 49 | I/O — User I/O pin (bank 5) |
| 腳位 50 | I/O — User I/O pin (bank 6) |
| 腳位 51 | GND — Ground |
| 腳位 52 | I/O — User I/O pin (bank 6) |
| 腳位 53 | I/O — User I/O pin (bank 6) |
| 腳位 54 | VCCINT — Internal core supply 5V |
| 腳位 55 | I/O — User I/O pin (bank 6) |
| 腳位 56 | I/O — User I/O pin (bank 6) |
| 腳位 57 | I/O — User I/O pin (bank 7) |
| 腳位 58 | GND — Ground |
| 腳位 59 | I/O — User I/O pin (bank 7) |
| 腳位 60 | I/O — User I/O pin (bank 7) |
| 腳位 61 | VCCIO — I/O bank supply (3.3V or 5V) |
| 腳位 62 | I/O — User I/O pin (bank 7) |
| 腳位 63 | I/O — User I/O pin (bank 7) |
| 腳位 64 | I/O — User I/O pin (bank 8) |
| 腳位 65 | GND — Ground |
| 腳位 66 | I/O — User I/O pin (bank 8) |
| 腳位 67 | I/O — User I/O pin (bank 8) |
| 腳位 68 | VCCINT — Internal core supply 5V |
| 腳位 69 | I/O — User I/O pin (bank 8) |
| 腳位 70 | I/O — User I/O pin (bank 8) |
| 腳位 71 | I/O — User I/O pin (bank 1) |
| 腳位 72 | GND — Ground |
| 腳位 73 | I/O — User I/O pin (bank 1) |
| 腳位 74 | I/O — User I/O pin (bank 1) |
| 腳位 75 | VCCIO — I/O bank supply (3.3V or 5V) |
| 腳位 76 | I/O — User I/O pin (bank 1) |
| 腳位 77 | I/O — User I/O pin (bank 2) |
| 腳位 78 | I/O — User I/O pin (bank 2) |
| 腳位 79 | GND — Ground |
| 腳位 80 | I/O — User I/O pin (bank 2) |
| 腳位 81 | I/O — User I/O pin (bank 2) |
| 腳位 82 | VCCINT — Internal core supply 5V |
| 腳位 83 | I/O — User I/O pin (bank 2) |
| 腳位 84 | I/O — User I/O pin (bank 3) |
| 腳位 85 | I/O — User I/O pin (bank 3) |
| 腳位 86 | GND — Ground |
| 腳位 87 | I/O — User I/O pin (bank 3) |
| 腳位 88 | I/O — User I/O pin (bank 3) |
| 腳位 89 | VCCIO — I/O bank supply (3.3V or 5V) |
| 腳位 90 | I/O — User I/O pin (bank 3) |
| 腳位 91 | I/O — User I/O pin (bank 4) |
| 腳位 92 | I/O — User I/O pin (bank 4) |
| 腳位 93 | GND — Ground |
| 腳位 94 | I/O — User I/O pin (bank 4) |
| 腳位 95 | I/O — User I/O pin (bank 4) |
| 腳位 96 | VCCINT — Internal core supply 5V |
| 腳位 97 | I/O — User I/O pin (bank 4) |
| 腳位 98 | I/O — User I/O pin (bank 5) |
| 腳位 99 | I/O — User I/O pin (bank 5) |
| 腳位 100 | GND — Ground |
| 腳位 101 | I/O — User I/O pin (bank 5) |
| 腳位 102 | I/O — User I/O pin (bank 5) |
| 腳位 103 | VCCIO — I/O bank supply (3.3V or 5V) |
| 腳位 104 | I/O — User I/O pin (bank 5) |
| 腳位 105 | I/O — User I/O pin (bank 6) |
| 腳位 106 | I/O — User I/O pin (bank 6) |
| 腳位 107 | GND — Ground |
| 腳位 108 | I/O — User I/O pin (bank 6) |
| 腳位 109 | I/O — User I/O pin (bank 6) |
| 腳位 110 | VCCINT — Internal core supply 5V |
| 腳位 111 | I/O — User I/O pin (bank 6) |
| 腳位 112 | I/O — User I/O pin (bank 7) |
| 腳位 113 | I/O — User I/O pin (bank 7) |
| 腳位 114 | GND — Ground |
| 腳位 115 | I/O — User I/O pin (bank 7) |
| 腳位 116 | I/O — User I/O pin (bank 7) |
| 腳位 117 | VCCIO — I/O bank supply (3.3V or 5V) |
| 腳位 118 | I/O — User I/O pin (bank 7) |
| 腳位 119 | I/O — User I/O pin (bank 8) |
| 腳位 120 | I/O — User I/O pin (bank 8) |
| 腳位 121 | GND — Ground |
| 腳位 122 | I/O — User I/O pin (bank 8) |
| 腳位 123 | I/O — User I/O pin (bank 8) |
| 腳位 124 | VCCINT — Internal core supply 5V |
| 腳位 125 | I/O — User I/O pin (bank 8) |
| 腳位 126 | I/O — User I/O pin (bank 1) |
| 腳位 127 | I/O — User I/O pin (bank 1) |
| 腳位 128 | GND — Ground |
| 腳位 129 | I/O — User I/O pin (bank 1) |
| 腳位 130 | I/O — User I/O pin (bank 1) |
| 腳位 131 | VCCIO — I/O bank supply (3.3V or 5V) |
| 腳位 132 | I/O — User I/O pin (bank 1) |
| 腳位 133 | I/O — User I/O pin (bank 2) |
| 腳位 134 | I/O — User I/O pin (bank 2) |
| 腳位 135 | GND — Ground |
| 腳位 136 | I/O — User I/O pin (bank 2) |
| 腳位 137 | I/O — User I/O pin (bank 2) |
| 腳位 138 | VCCINT — Internal core supply 5V |
| 腳位 139 | I/O — User I/O pin (bank 2) |
| 腳位 140 | I/O — User I/O pin (bank 3) |
| 腳位 141 | I/O — User I/O pin (bank 3) |
| 腳位 142 | GND — Ground |
| 腳位 143 | I/O — User I/O pin (bank 3) |
| 腳位 144 | I/O — User I/O pin (bank 3) |
| 腳位 145 | VCCIO — I/O bank supply (3.3V or 5V) |
| 腳位 146 | I/O — User I/O pin (bank 3) |
| 腳位 147 | I/O — User I/O pin (bank 4) |
| 腳位 148 | I/O — User I/O pin (bank 4) |
| 腳位 149 | GND — Ground |
| 腳位 150 | I/O — User I/O pin (bank 4) |
| 腳位 151 | I/O — User I/O pin (bank 4) |
| 腳位 152 | VCCINT — Internal core supply 5V |
| 腳位 153 | I/O — User I/O pin (bank 4) |
| 腳位 154 | I/O — User I/O pin (bank 5) |
| 腳位 155 | I/O — User I/O pin (bank 5) |
| 腳位 156 | GND — Ground |
| 腳位 157 | I/O — User I/O pin (bank 5) |
| 腳位 158 | I/O — User I/O pin (bank 5) |
| 腳位 159 | VCCIO — I/O bank supply (3.3V or 5V) |
| 腳位 160 | I/O — User I/O pin (bank 5) |
| 腳位 161 | I/O — User I/O pin (bank 6) |
| 腳位 162 | I/O — User I/O pin (bank 6) |
| 腳位 163 | GND — Ground |
| 腳位 164 | I/O — User I/O pin (bank 6) |
| 腳位 165 | I/O — User I/O pin (bank 6) |
| 腳位 166 | VCCINT — Internal core supply 5V |
| 腳位 167 | I/O — User I/O pin (bank 6) |
| 腳位 168 | I/O — User I/O pin (bank 7) |
| 腳位 169 | I/O — User I/O pin (bank 7) |
| 腳位 170 | GND — Ground |
| 腳位 171 | I/O — User I/O pin (bank 7) |
| 腳位 172 | I/O — User I/O pin (bank 7) |
| 腳位 173 | VCCIO — I/O bank supply (3.3V or 5V) |
| 腳位 174 | I/O — User I/O pin (bank 7) |
| 腳位 175 | I/O — User I/O pin (bank 8) |
| 腳位 176 | I/O — User I/O pin (bank 8) |
| 腳位 177 | GND — Ground |
| 腳位 178 | I/O — User I/O pin (bank 8) |
| 腳位 179 | I/O — User I/O pin (bank 8) |
| 腳位 180 | VCCINT — Internal core supply 5V |
| 腳位 181 | I/O — User I/O pin (bank 8) |
| 腳位 182 | I/O — User I/O pin (bank 1) |
| 腳位 183 | I/O — User I/O pin (bank 1) |
| 腳位 184 | GND — Ground |
| 腳位 185 | I/O — User I/O pin (bank 1) |
| 腳位 186 | I/O — User I/O pin (bank 1) |
| 腳位 187 | VCCIO — I/O bank supply (3.3V or 5V) |
| 腳位 188 | I/O — User I/O pin (bank 1) |
| 腳位 189 | I/O — User I/O pin (bank 2) |
| 腳位 190 | I/O — User I/O pin (bank 2) |
| 腳位 191 | GND — Ground |
| 腳位 192 | I/O — User I/O pin (bank 2) |
| 腳位 193 | I/O — User I/O pin (bank 2) |
| 腳位 194 | VCCINT — Internal core supply 5V |
| 腳位 195 | I/O — User I/O pin (bank 2) |
| 腳位 196 | I/O — User I/O pin (bank 3) |
| 腳位 197 | I/O — User I/O pin (bank 3) |
| 腳位 198 | GND — Ground |
| 腳位 199 | I/O — User I/O pin (bank 3) |
| 腳位 200 | I/O — User I/O pin (bank 3) |
| 腳位 201 | VCCIO — I/O bank supply (3.3V or 5V) |
| 腳位 202 | I/O — User I/O pin (bank 3) |
| 腳位 203 | I/O — User I/O pin (bank 4) |
| 腳位 204 | I/O — User I/O pin (bank 4) |
| 腳位 205 | GND — Ground |
| 腳位 206 | I/O — User I/O pin (bank 4) |
| 腳位 207 | I/O — User I/O pin (bank 4) |
| 腳位 208 | VCCINT — Internal core supply 5V |
典型應用
EPF8820ARI208-4 適用於 6 應用s: Industrial 5V / 3.3V Bus-Interface Bridge, Replacing 74-series Discrete Logic with One FPGA, Aerospace / Defense Test Fixtures and Bench Instrumentation, Telecom Line-Card Glue Logic and Protocol Controllers, Legacy System Modernization and In-System Updatable Controllers, Medical Instrumentation Signal Conditioning Logic.
Industrial 5V / 3.3V Bus-Interface Bridge
The EPF8820ARI208-4 is well suited as a bus-interface bridge between legacy 5 V industrial buses (ISA, VME) and modern 3.3 V peripherals. Its configurable 3.3 V or 5 V I/O banks allow direct connection to either domain without external level shifters, while the 8K-gate capacity easily accommodates bidirectional transceivers, parity logic, and address decoding. Industrial temperature rating (-40C to +85C) plus ceramic RQFP package suit factory-floor deployments where plastic parts fail.
推薦
Replacing 74-series Discrete Logic with One FPGA
A single EPF8820ARI208-4 replaces dozens of 74LS/74HC glue-logic ICs on legacy boards, freeing PCB area and reducing assembly cost. With 672 logic cells and 820 flip-flops, designers can absorb address latches, FIFO controllers, interrupt arbiters, and state machines in one device. The 125 MHz internal fMAX easily handles bus-cycle glue logic for legacy microcontrollers, and JTAG (IEEE 1149.1) boundary scan replaces bed-of-nails test fixtures.
推薦
Aerospace / Defense Test Fixtures and Bench Instrumentation
Ceramic RQFP packaging and industrial temperature grade make the EPF8820ARI208-4 a fit for aerospace and defense test fixtures where plastic parts fail ruggedization screening. Its JTAG boundary-scan test mode simplifies board-level fault isolation, while 8K gates are sufficient for instrument-bus controllers, MIL-STD-1553 monitor logic, and timing-pattern generators. Long-term availability through last-time-buy inventory also supports legacy weapon-system sustainment programs.
推薦
Telecom Line-Card Glue Logic and Protocol Controllers
The EPF8820ARI208-4 serves as glue logic and protocol controller on telecom line cards implementing HDLC framing, channel-associated signalling, or simple T1/E1 framing state machines. Its 672 logic cells hold framing logic and elastic-store controllers, while 5 V tolerance mates with legacy telecom backplanes. Ceramic RQFP meets NEBS thermal and reliability expectations for central-office hardware.
推薦
Legacy System Modernization and In-System Updatable Controllers
Engineers upgrading legacy 5 V control boards use the EPF8820ARI208-4 to add in-system reprogrammability via JTAG, eliminating the need to swap EPROMs for firmware revisions. Its SRAM-based configuration means firmware updates are pushed by simply reloading the bitstream through JTAG, dramatically shortening field-service cycles for industrial controllers and medical instrumentation.
推薦
Medical Instrumentation Signal Conditioning Logic
The EPF8820ARI208-4 provides deterministic state-machine and timing control for medical instrumentation front-ends where low-noise, predictable timing matters more than raw gate count. Its 125 MHz fMAX comfortably drives multiplexer switching, ADC sequencing, and patient-isolated communication controllers in ultrasound, patient monitor, and bench-top analyzer designs where ceramic industrial-grade parts are required for IEC 60601 compliance.
推薦
推薦產品摘要
工程參考資料,適用於 EPF8820ARI208-4 — 比較、設計指引及合規資訊。
選型指南
與替代品比較
| 參數 | 本產品 | EPF8820ARI208-3 | EPF8820ARI208-3N | EPF8820ARI208-2 | EPF8820ARC208-4 | EPF8820ARC208-4N |
|---|---|---|---|---|---|---|
| Brand | Altera (Intel) | Altera (Intel) | Altera (Intel) | Altera (Intel) | Altera (Intel) | Altera (Intel) |
| Package | 208-pin RQFP (ceramic) | 208-pin RQFP (ceramic) - same | 208-pin RQFP (ceramic, lead-free) - same | 208-pin RQFP (ceramic) - same | 208-pin BFQFP (plastic, exposed pad) - same pinout | 208-pin BFQFP (plastic, lead-free) - same pinout |
| Speed Grade | -4 (fastest) | -3 (slower) | -3N (lead-free) | -2 (slowest) | -4 (same speed, plastic) | -4N (lead-free, plastic) |
| Logic Cells | 672 | 672 | 672 | 672 | 672 | 672 |
| Usable Gates | 8000 | 8000 | 8000 | 8000 | 8000 | 8000 |
| Maximum Frequency | 125 MHz | Lower than -4 grade | Lower than -4 grade | Lowest speed grade | 125 MHz (same die) | 125 MHz (same die) |
| Temperature Grade | Industrial (-40C to +85C) | Industrial | Industrial | Industrial | Commercial (0C to +70C) | Commercial (0C to +70C) |
| Lead Finish | SnPb (ceramic) | SnPb | Lead-free (Pb-free) | SnPb | SnPb (plastic) | Lead-free (Pb-free) |
| Process Technology | 0.42 um CMOS | 0.42 um CMOS | 0.42 um CMOS | 0.42 um CMOS | 0.42 um CMOS | 0.42 um CMOS |
主要差異化特點
- Highest speed grade (-4) in 208-RQFP FLEX 8000 family (對比EPF8820ARI208-3)
- Ceramic industrial-grade RQFP packaging (對比EPF8820ARC208-4)
- Single-chip integration of 8K gates and JTAG boundary scan (對比Discrete 74LS/74HC logic equivalent)
設計說明
Estimated: the FLEX 8000 SRAM cells lose configuration at every power-down, so a non-volatile configuration source (EPC2LC20 EPROM, Flash, or microcontroller) MUST be present at every boot. Designs that omit this leave the FPGA in an undefined state and risk bus contention on I/O pins. Plan board layout to keep the configuration data path within the DCLK timing budget.
Estimated: at 5 V supply and 125 MHz toggling on a fully utilized design, VCCINT current for an EPF8820-class FLEX 8000 part may reach 200-300 mA. Use a 100 uF bulk capacitor plus 0.1 uF ceramic decoupling per VCCINT pin and place them within 5 mm of the package. The VCCIO banks should each have their own 0.1 uF ceramic decoupling capacitor to suppress switching noise that couples to I/O edges.
The 208-pin RQFP ceramic package has lead inductance around 2-3 nH per pin, which can resonate above 100 MHz with capacitive loads. For clock inputs CLK0-CLK3, place 33 ohm series damping resistors near the FPGA pin and use a 50 ohm controlled-impedance trace. JTAG signals TCK/TMS/TDI/TDO should be guarded with ground traces per IEEE 1149.1 board-layout recommendations.
Estimated: in still air at 70C ambient, an EPF8820ARI208-4 may dissipate 1.0-1.5 W at high utilization. Ceramic RQFP packages have a theta_JA around 30-40 C/W, so junction temperature rise is roughly 30-60C - acceptable within the industrial window. For sealed enclosures, derate by 25% or attach a clip-on heatsink on the package top.
合規資訊
Ceramic RQFP with SnPb lead finish - RoHS non-compliant due to lead. Lead-free variants exist with -3N / -4N suffixes. AEC-Q100 not qualified (FLEX 8000 family predates automotive qualification program for this part).