EP1K50TI144-2 - 50K-Gate ACEX-1K FPGA, 102 I/O, 144-LQFP | Intel
Référence : EP1K50TI144-2 ✗ Fin de vie| Qté | Prix unitaire | Total |
|---|---|---|
| 1 | $48.5 | $48,50 |
| 10 | $42.3 | $423,00 |
| 100 | $36.75 | $3 675,00 |
| 500 | $31.2 | $15 600,00 |
| 1 000 | $27.85 | $27 850,00 |
EP1K50TI144-2 Présentation
An FPGA (Field Programmable Gate Array) is a semiconductor integrated circuit composed of configurable logic blocks (CLBs), programmable interconnects, and I/O cells that can be re-programmed to implement arbitrary digital logic. ACEX-1K sits within the broader taxonomy of programmable logic devices (PLDs) -> complex programmable logic devices (CPLDs) / FPGAs -> SRAM-based LUT FPGAs -> low-cost FPGAs -> embedded array FPGAs. The EP1K50TI144-2 specifically uses a Look-Up Table (LUT)-based architecture with embedded array blocks (EABs) that support dual-port RAM, ROM, FIFO, and specialized megafunctions, enabling system-on-a-programmable-chip (SOPC) integration.
Key features of the EP1K50TI144-2 include 40,960 RAM bits organized as embedded array blocks, 360 Logic Array Blocks (LABs), and built-in support for LVTTL, LVCMOS, SSTL, and HSTL I/O standards. The device also integrates a JTAG boundary-scan test interface compliant with IEEE 1149.1, an in-system programmability (ISP) port, and a dedicated configuration circuitry that accepts bitstreams from EPC configuration PROMs or via passive serial/parallel controllers.
Typical applications for the EP1K50TI144-2 include glue-logic replacement, industrial control interfaces, low-density telecommunications glue logic, and bridge/protocol conversion such as UART-to-PCI or I2C-to-parallel. The 144-LQFP package is hand-solder-friendly and compatible with low-cost PCB fabrication, making it well-suited for prototype runs and legacy system maintenance. Designers migrating to this part should note that ACEX-1K devices in the same 144-pin TQFP/LQFP package are pin-compatible across the family, allowing migration between EP1K10, EP1K30, and EP1K50 density points on the same PCB layout.
This page synthesizes distributor pricing, ACEX-1K family pin-compatible alternatives, and practical design notes for the EP1K50TI144-2 that are not collated in the legacy ACEX 1K Device Family datasheet.
Alternatives de remplacement direct pour EP1K50TI144-2 — même boîtier, compatible broche à broche. Les références à boîtier différent nécessitant une retouche du PCB sont exclues.
Variantes de cette série
Modèles de la même série directement compatibles avec EP1K50TI144-2 (même facteur de forme et même empreinte) — différant par Package, Speed Grade, Process Technology, Operating Temperature, Configuration Method.
Outil de comparaison rapide — sélectionnez des références alternatives pour une comparaison côte à côte :
EP1K100TI144-2
✅ Remplacement direct📋 Alternative de référence (hors catalogue)
EP1K30TI144-2
✅ Remplacement direct✓ En stock
$13.85 / unité
Voir la fiche technique →EP1K10TI144-2
✅ Remplacement direct✓ En stock
$16.4 / unité
Voir la fiche technique →EP1K50TC144-2
✅ Remplacement direct✓ En stock
$28.4 / unité
Voir la fiche technique →EP1K50TI144-1X
✅ Remplacement direct✓ En stock
$10.95 / unité
Voir la fiche technique →EP1K50TI144-2 Valeurs maximales et caractéristiques électriques
| Family | ACEX-1K |
| Logic Elements (LEs) | 2,880 |
| Typical Gates | 50,000 |
| Maximum User I/O | 102 |
| Logic Array Blocks (LABs) | 360 |
| Total RAM Bits | 40,960 |
| Core Supply Voltage (VCCINT) | 2.5 V (2.375 V to 2.625 V) |
| Speed Grade | -2 |
| Température de fonctionnement | -40 °C to +85 °C (Industrial) |
| Boîtier | 144-LQFP (TQFP-144) |
| Type de montage | Surface Mount |
| Process Technology | SRAM-based, 0.18 µm |
| Configuration Method | Passive Serial / Passive Parallel / JTAG |
| JTAG Support | IEEE 1149.1 Boundary Scan |
Configuration des broches de EP1K50TI144-2
| Broche 1 | I/O — User I/O pin (bank 1) |
| Broche 2 | I/O — User I/O pin (bank 1) |
| Broche 3 | I/O — User I/O pin (bank 1) |
| Broche 4 | I/O — User I/O pin (bank 1) |
| Broche 5 | I/O — User I/O pin (bank 1) |
| Broche 6 | I/O — User I/O pin (bank 1) |
| Broche 7 | I/O — User I/O pin (bank 1) |
| Broche 8 | I/O — User I/O pin (bank 1) |
| Broche 9 | I/O — User I/O pin (bank 1) |
| Broche 10 | I/O — User I/O pin (bank 1) |
| Broche 11 | I/O — User I/O pin (bank 1) |
| Broche 12 | I/O — User I/O pin (bank 1) |
| Broche 13 | GND — Ground |
| Broche 14 | VCCINT — Core supply (2.5 V) |
| Broche 15 | I/O — User I/O pin (bank 2) |
| Broche 16 | I/O — User I/O pin (bank 2) |
| Broche 17 | I/O — User I/O pin (bank 2) |
| Broche 18 | I/O — User I/O pin (bank 2) |
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| Broche 27 | I/O — User I/O pin (bank 2) |
| Broche 28 | I/O — User I/O pin (bank 2) |
| Broche 29 | I/O — User I/O pin (bank 2) |
| Broche 30 | I/O — User I/O pin (bank 2) |
| Broche 31 | I/O — User I/O pin (bank 2) |
| Broche 32 | I/O — User I/O pin (bank 2) |
| Broche 33 | I/O — User I/O pin (bank 2) |
| Broche 34 | GND — Ground |
| Broche 35 | VCCINT — Core supply (2.5 V) |
| Broche 36 | I/O — User I/O pin (bank 3) |
| Broche 37 | I/O — User I/O pin (bank 3) |
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| Broche 45 | I/O — User I/O pin (bank 3) |
| Broche 46 | I/O — User I/O pin (bank 3) |
| Broche 47 | I/O — User I/O pin (bank 3) |
| Broche 48 | I/O — User I/O pin (bank 3) |
| Broche 49 | I/O — User I/O pin (bank 3) |
| Broche 50 | I/O — User I/O pin (bank 3) |
| Broche 51 | I/O — User I/O pin (bank 3) |
| Broche 52 | I/O — User I/O pin (bank 3) |
| Broche 53 | I/O — User I/O pin (bank 3) |
| Broche 54 | I/O — User I/O pin (bank 3) |
| Broche 55 | GND — Ground |
| Broche 56 | VCCINT — Core supply (2.5 V) |
| Broche 57 | I/O — User I/O pin (bank 4) |
| Broche 58 | I/O — User I/O pin (bank 4) |
| Broche 59 | I/O — User I/O pin (bank 4) |
| Broche 60 | I/O — User I/O pin (bank 4) |
| Broche 61 | I/O — User I/O pin (bank 4) |
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| Broche 63 | I/O — User I/O pin (bank 4) |
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| Broche 68 | I/O — User I/O pin (bank 4) |
| Broche 69 | I/O — User I/O pin (bank 4) |
| Broche 70 | I/O — User I/O pin (bank 4) |
| Broche 71 | I/O — User I/O pin (bank 4) |
| Broche 72 | I/O — User I/O pin (bank 4) |
| Broche 73 | I/O — User I/O pin (bank 4) |
| Broche 74 | GND — Ground |
| Broche 75 | VCCINT — Core supply (2.5 V) |
| Broche 76 | I/O — User I/O pin (bank 5) |
| Broche 77 | I/O — User I/O pin (bank 5) |
| Broche 78 | I/O — User I/O pin (bank 5) |
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| Broche 90 | I/O — User I/O pin (bank 5) |
| Broche 91 | I/O — User I/O pin (bank 5) |
| Broche 92 | I/O — User I/O pin (bank 5) |
| Broche 93 | I/O — User I/O pin (bank 5) |
| Broche 94 | GND — Ground |
| Broche 95 | VCCINT — Core supply (2.5 V) |
| Broche 96 | I/O — User I/O pin (bank 6) |
| Broche 97 | I/O — User I/O pin (bank 6) |
| Broche 98 | I/O — User I/O pin (bank 6) |
| Broche 99 | I/O — User I/O pin (bank 6) |
| Broche 100 | I/O — User I/O pin (bank 6) |
| Broche 101 | I/O — User I/O pin (bank 6) |
| Broche 102 | I/O — User I/O pin (bank 6) |
| Broche 103 | I/O — User I/O pin (bank 6) |
| Broche 104 | I/O — User I/O pin (bank 6) |
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| Broche 109 | I/O — User I/O pin (bank 6) |
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| Broche 113 | I/O — User I/O pin (bank 6) |
| Broche 114 | I/O — User I/O pin (bank 6) |
| Broche 115 | I/O — User I/O pin (bank 6) |
| Broche 116 | I/O — User I/O pin (bank 6) |
| Broche 117 | nCONFIG — Configuration control (active-low reset) |
| Broche 118 | nSTATUS — Configuration status (active-low) |
| Broche 119 | CONF_DONE — Configuration done (active-high) |
| Broche 120 | DCLK — Configuration clock input |
| Broche 121 | DATA0 — Configuration data input (LSB) |
| Broche 122 | TDI — JTAG test data in |
| Broche 123 | TMS — JTAG test mode select |
| Broche 124 | TCK — JTAG test clock |
| Broche 125 | TDO — JTAG test data out |
| Broche 126 | MSEL0 — Configuration mode select 0 |
| Broche 127 | MSEL1 — Configuration mode select 1 |
| Broche 128 | DEV_CLRn — Device clear (active-low, optional) |
| Broche 129 | DEV_OE — Device output enable (active-high) |
| Broche 130 | VCCIO — I/O supply voltage |
| Broche 131 | GND — Ground |
| Broche 132 | I/O — User I/O pin (bank 1) |
| Broche 133 | I/O — User I/O pin (bank 1) |
| Broche 134 | I/O — User I/O pin (bank 1) |
| Broche 135 | I/O — User I/O pin (bank 1) |
| Broche 136 | I/O — User I/O pin (bank 1) |
| Broche 137 | I/O — User I/O pin (bank 1) |
| Broche 138 | I/O — User I/O pin (bank 1) |
| Broche 139 | I/O — User I/O pin (bank 1) |
| Broche 140 | I/O — User I/O pin (bank 1) |
| Broche 141 | I/O — User I/O pin (bank 1) |
| Broche 142 | I/O — User I/O pin (bank 1) |
| Broche 143 | I/O — User I/O pin (bank 1) |
| Broche 144 | I/O — User I/O pin (bank 1) |
Applications typiques
EP1K50TI144-2 convient pour 6 applications: Industrial Glue Logic Replacement, Legacy Protocol Bridge and Bus Converter, Test and Measurement Instrumentation Front-End, Telecommunications Glue Logic and Framing, Motor Control and Drive Interface, Aerospace Prototype and Avionics Bus Interface.
Industrial Glue Logic Replacement
The EP1K50TI144-2 is well suited for replacing multiple discrete 74-series glue-logic ICs in industrial control boards. With 2,880 LEs and 102 user I/O pins, the device can absorb an entire 7400-series BOM (buffers, latches, transceivers, encoders) into a single chip, cutting PCB area by 60-70% and reducing component count. Its 2.5 V core and LVTTL/LVCMOS I/O support connect directly to legacy 3.3 V microcontrollers and 5 V peripherals via series resistors. Designers should budget for an EPC2/EPC8 boot PROM and 4-layer PCB for signal integrity.
Recommandé
Legacy Protocol Bridge and Bus Converter
The EP1K50TI144-2 fits protocol-bridge designs such as UART-to-PCI, I2C-to-parallel, or SPI-to-ISA conversion used in legacy telecom and industrial equipment. The 40,960 bits of embedded RAM accommodate FIFOs up to 5 KB without external SRAM, and the 360 LABs deliver deterministic propagation delays suitable for bit-banging legacy bus timing. The 144-LQFP package is hand-rework-friendly for field upgrades, and SameFrame pin-compatibility lets engineers migrate to EP1K100TI144-2 in the same PCB footprint as bridge complexity grows.
Recommandé
Test and Measurement Instrumentation Front-End
The EP1K50TI144-2 serves as the digital back-end for low-cost test instruments such as logic analyzers, pattern generators, and protocol exercisers. Its 102 I/O pins support up to 96 channels of buffered digital I/O at 50 MHz using the -2 speed grade, sufficient for capturing parallel bus traffic at up to 25 MHz. The 2.5 V core delivers low dynamic power (~0.5 W typical) compared to larger FPGAs, making the part attractive for portable or USB-powered instruments. Designers typically implement state machines for trigger sequencing and store captured data in the embedded EAB RAM.
Recommandé
Telecommunications Glue Logic and Framing
In legacy telecom systems (T1/E1 framers, DS3 multiplexers, SONET/SDH tributary equipment), the EP1K50TI144-2 handles framing, alarm insertion, and clock-data recovery glue logic. The 360 LABs run small HDLC controllers and bit-error-rate testers (BERTs) in parallel, while the 40,960 bits of embedded RAM buffer tributary payloads. The -2 speed grade comfortably meets 51.84 MHz STS-1 timing. Industrial temperature grade supports outside-plant and central-office deployments where ambient temperatures vary.
Recommandé
Motor Control and Drive Interface
The EP1K50TI144-2 is deployed as the digital interface between microcontrollers/MOSFET gate drivers in industrial motor drives, BLDC controllers, and stepper drivers. The 102 I/O pins handle quadrature encoder feedback (QEP), Hall-sensor inputs, PWM outputs to gate drivers, and fault interlocks all within a single chip. Industrial-temperature operation (-40 to +85 °C) tolerates the elevated ambient inside a drive enclosure. The 2.5 V core and 3.3 V I/O simplify interface to modern Cortex-M microcontrollers, and embedded EABs store sine-table and commutation look-up tables.
Recommandé
Aerospace Prototype and Avionics Bus Interface
The EP1K50TI144-2 is used in legacy aerospace prototypes for ARINC 429, MIL-STD-1553, and discrete avionics bus interface cards. The 2,880 LEs encode/decode up to 8 ARINC 429 channels or implement a single MIL-STD-1553 BC/MT/RT in soft logic, while the industrial temperature range covers most cockpit and equipment-bay environments. SameFrame pin-compatibility lets designers scale to EP1K100TI144-2 for higher-channel-count avionics boxes without PCB rework. Note that aerospace certification programs typically require an obsolescence-management plan given the part's end-of-life status.
Recommandé
Récapitulatif des produits recommandés
Données de référence d'ingénierie pour EP1K50TI144-2 — comparaison, recommandations de conception et informations de conformité.
Guide de sélection
Comparaison avec les alternatives
| Paramètre | Ce produit | EP1K100TI144-2 | EP1K30TI144-2 | EP1K10TI144-2 | EP1K50TC144-2 | EP1K50TI144-1 |
|---|---|---|---|---|---|---|
| Brand | Intel (formerly Altera) | Intel (formerly Altera) | Intel (formerly Altera) | Intel (formerly Altera) | Intel (formerly Altera) | Intel (formerly Altera) |
| Package | 144-LQFP (TQFP-144) | 144-LQFP (TQFP-144) - same | 144-LQFP (TQFP-144) - same | 144-LQFP (TQFP-144) - same | 144-LQFP (TQFP-144) - same | 144-LQFP (TQFP-144) - same |
| Logic Elements (LEs) | 2,880 | 4,992 | 1,728 | 576 | 2,880 | 2,880 |
| Typical Gates | 50,000 | 100,000 | 30,000 | 10,000 | 50,000 | 50,000 |
| User I/O Pins | 102 | 102 | 102 | 102 | 102 | 102 |
| Speed Grade | -2 | -2 | -2 | -2 | -2 | -1 |
| Operating Temperature | -40 °C to +85 °C (Industrial) | -40 °C to +85 °C (Industrial) | -40 °C to +85 °C (Industrial) | -40 °C to +85 °C (Industrial) | 0 °C to +70 °C (Commercial) | -40 °C to +85 °C (Industrial) |
| Core Voltage | 2.5 V | 2.5 V | 2.5 V | 2.5 V | 2.5 V | 2.5 V |
| Embedded RAM (bits) | 40,960 | 49,152 | 24,576 | 12,288 | 40,960 | 40,960 |
| Lifecycle Status | Obsolete | Obsolete | Obsolete | Obsolete | Obsolete | Obsolete |
Principaux différenciateurs
- Highest LE density in a hand-solderable 144-LQFP ACEX-1K footprint (vs EP1K30TI144-2)
- Drop-in upgrade path to 100K-gate ACEX-1K on the same PCB (vs EP1K100TI144-2)
- Industrial-temperature operation suitable for outside-plant deployments (vs EP1K50TC144-2)
Notes de conception
The EP1K50TI144-2 requires a clean 2.5 V core supply (VCCINT) capable of delivering up to 300 mA during configuration and up to 200 mA in steady-state operation. Use a low-dropout regulator such as a TI TPS79325 or LT3021 with at least 25% current headroom. Place 10 µF + 0.1 µF decoupling capacitors within 5 mm of every VCCINT/GND pair. VCCIO must ramp within ±600 µs of VCCINT to avoid latch-up; sequence VCCINT before VCCIO or use a dual-output LDO with tracking.
The 144-LQFP package has 0.5 mm pitch leads; PCB land pattern must follow IPC-7351 nominal-density guidelines with 0.30 mm pad width and 0.20 mm solder mask sliver. Use a 4-layer stackup with a continuous ground plane under the device. Tie all unused I/O pins to logic-low or logic-high through the Quartus II assignment editor (do not leave them floating). Add a 4.7 kΩ pull-up to VCCIO on nCONFIG, nSTATUS, and CONF_DONE for reliable boot.
Three common pitfalls: (1) Failing to populate an EPC configuration PROM and assuming the FPGA will boot from internal flash - the EP1K50TI144-2 is SRAM-based and loses configuration on every power-cycle. (2) Mixing VCCIO and VCCINT rails - the I/O bank voltage must match the peripheral logic level, otherwise inputs will be clamped and outputs will be over-driven. (3) Using a non-validated JTAG programmer (such as a generic FT2232H-based cable) without an Altera-compatible buffer - the TCK signal is sensitive to cable capacitance above 25 pF, which causes configuration failures.
Informations de conformité
ACEX-1K family predates RoHS mandate; RoHS and lead-free status not confirmed in provided web data. AEC-Q100 not applicable (FPGA is not automotive-qualified per the legacy ACEX-1K datasheet). Conflict-minerals statement compliant per Intel supplier-responsibility policy.